Patent Assignment
Reel/Frame 009484/0495
Assignment of Assignor's Interest
Recorded: 1998-09-25
Pages: 4
Assignor
ANDBERG, JOHN W.
Executed: 1998-09-25
Assignee
AEHR TEST SYSTEMSS
1667 PLYMOUTH STREET, MOUNTAIN VIEW, CALIFORNIA, 94043
Covered Property
(1)
Wafer Level Burn-in and Test Thermal Chuck and Method
Patent:
6,140,616 →
Application:
09/161,323 →
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Security Agreement
Sep 6, 2013
From: AEHR TEST SYSTEMS
To: SILICON VALLEY BANK
Reel/Frame 031171/0001 →
Release of Security Interest
Apr 13, 2015
From: SILICON VALLEY BANK
To: AEHR TEST SYSTEMS
Reel/Frame 035420/0390 →
Security Interest
Apr 14, 2015
From: AEHR TEST SYSTEMS
To: QVT FUND LP; QUINTESSENCE FUND L.P.
Reel/Frame 035424/0783 →
Release of Security Interest
Nov 5, 2019
From: QVT FUND LP; QUINTESSENCE FUND L.P.
To: AEHR TEST SYSTEMS
Reel/Frame 050928/0695 →