IP Library › Assignment 012659/0895
Patent Assignment
Reel/Frame 012659/0895

Assignment of Assignor's Interest

Recorded: 2002-02-26 Pages: 3
Assignors
USHIKI, TAKEO
Executed: 2002-02-13
YAMADA, KEIZO
Executed: 2002-02-13
ITAGAKI, YOHSUKE
Executed: 2002-02-13
TSUJIDE, TOHRU
Executed: 2002-02-13
Assignee
NEC CORPORATION
7-1, SHIBA 5-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property (1)
Surface Contamination Analyzer for Semiconductor Wafers, Method Used Therein and Process for Fabricating Semiconductor Device
Patent: 6,753,194 →
Application: 10/083,440 →
Publication: US 2002/0123161
Related Assignments (2)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Jan 2, 2003
From: NEC CORPORATION
To: FAB SOLUTIONS, INC.
Reel/Frame 013628/0427 →
Assignment of Assignor's Interest Jun 1, 2007
From: FAB SOLUTIONS, INC.
To: TOPCON CORPORATION
Reel/Frame 019365/0348 →