Patent Assignment
Reel/Frame 013628/0427
Assignment of Assignor's Interest
Recorded: 2003-01-02
Pages: 2
Assignor
NEC CORPORATION
Executed: 2002-10-01
Assignee
FAB SOLUTIONS, INC.
NISSEI SHINMIZONOKUCHI BLDG. 5F, 3-5-7 HISAMOTO, TAKATSU-KU, KAWASAKI, KANAGAWA 213-0011, JAPAN
Covered Property
(1)
Surface Contamination Analyzer for Semiconductor Wafers, Method Used Therein and Process for Fabricating Semiconductor Device
Related Assignments
(2)
Other recorded transfers of the patent in this record — the chain of ownership.