Patent Assignment
Reel/Frame 014740/0177
Assignment of Assignor's Interest
Recorded: 2003-11-21
Pages: 3
Assignors
RICHMOND, II, DONALD PAUL
Executed: 1999-10-22
HOANG, JOHN DINH
Executed: 1999-10-22
LOBACZ, JERZY
Executed: 1999-10-22
Assignee
AEHR TEST SYSTEMS
400 KATO TERRACE, FREMONT, CALIFORNIA, 94539
Covered Property
(1)
Wafer Level Burn-in and Electrical Test System and Method
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Security Agreement
Sep 6, 2013
From: AEHR TEST SYSTEMS
To: SILICON VALLEY BANK
Reel/Frame 031171/0001 →
Release of Security Interest
Apr 13, 2015
From: SILICON VALLEY BANK
To: AEHR TEST SYSTEMS
Reel/Frame 035420/0390 →
Security Interest
Apr 14, 2015
From: AEHR TEST SYSTEMS
To: QVT FUND LP; QUINTESSENCE FUND L.P.
Reel/Frame 035424/0783 →
Release of Security Interest
Nov 5, 2019
From: QVT FUND LP; QUINTESSENCE FUND L.P.
To: AEHR TEST SYSTEMS
Reel/Frame 050928/0695 →