Patent Assignment
Reel/Frame 014965/0170
Assignment of Assignor's Interest
Recorded: 2004-02-11
Pages: 3
Assignor
MULLER, GEORG
Executed: 2004-01-12
Assignee
INFINEON TECHNOLOGIES AG
ST.-MARTIN-STR. 53, 81669 MUNCHEN, GERMANY
Covered Property
(1)
Semiconductor Device Testing Apparatus, Semiconductor Device Testing System, and Semiconductor Device Testing Method for Measuring and Trimming the Output Impedance of Driver Devices
Related Assignments
(5)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Jan 15, 2010
From: INFINEON TECHNOLOGIES AG
To: QIMONDA AG
Reel/Frame 023796/0001 →
Assignment of Assignor's Interest
May 8, 2015
From: QIMONDA AG
To: INFINEON TECHNOLOGIES AG
Reel/Frame 035623/0001 →
Assignment of Assignor's Interest
Oct 9, 2015
From: INFINEON TECHNOLOGIES AG
To: POLARIS INNOVATIONS LIMITED
Reel/Frame 036827/0885 →
Corrective Assignment to Correct the Patent 7105729 Previously Recorded at Reel: 036827 Frame: 0885. Assignor(S) Hereby Confirms the Assignment.
Jul 26, 2017
From: INFINEON TECHNOLOGIES AG
To: POLARIS INNOVATIONS LIMITED
Reel/Frame 043336/0694 →
Assignment of Assignor's Interest
Feb 12, 2020
From: POLARIS INNOVATIONS LIMITED
To: CHANGXIN MEMORY TECHNOLOGIES, INC
Reel/Frame 051917/0581 →