Patent Assignment
Reel/Frame 024035/0333
Assignment of Assignor's Interest
Recorded: 2010-03-02
Pages: 3
Assignor
FUJITSU LIMITED
Executed: 2010-02-18
Assignee
FUJITSU MICROELECTRONICS LIMITED
2-10-23 SHIN-YOKOHAMA, KOHOKU-KU, YOKOHAMA-SHI, 222-0033, JAPAN
Covered Properties
(34)
Method of Dry Etching Aluminum
Patent:
4,798,650 →
Application:
07/174,348 →
Semiconductor Device Having a Superconductive Wiring
Patent:
5,001,108 →
Application:
07/207,628 →
Semiconductor Memory Device and Method for Producing the Same
Patent:
5,006,910 →
Application:
07/222,305 →
Semiconductor Memory Device Having a Charge Barrier Layer for Preventing Soft Error
Patent:
4,961,165 →
Application:
07/269,689 →
Layer Structure of a Memory Cell for a Dynamic Random Access Memory Device and Method for Producing the Same
Patent:
4,910,566 →
Application:
07/269,690 →
Method of Producing Layer Structure of a Memory Cell for a Dynamic Random Access Memory Device
Patent:
4,977,102 →
Application:
07/377,002 →
Complementary Semiconductor Memory Device Including Cell Access Transistor and Word Lines Driving Transistor Having Channels of Different Conductivity Type
Patent:
5,051,959 →
Application:
07/430,968 →
Process for Manufacturing Semiconductor Device Involving Dry Etching an Organic Resist Layer
Patent:
5,034,090 →
Application:
07/462,293 →
Charged-Particle Beam Exposure Method and Apparatus
Patent:
5,130,547 →
Application:
07/616,870 →
Electron Beam Exposure System Having an Improved Data Transfer Efficiency
Patent:
5,124,560 →
Application:
07/669,592 →
Method for Fabricating an Exposure Mask Including a Step for Adhering Mask Body Substrate to a Supporting Block
Patent:
5,185,054 →
Application:
07/757,284 →
Mark Position Detecting Method and Device for Aligner and Aligner Having the Device
Patent:
5,400,145 →
Application:
08/032,237 →
X-Ray Mask, Method of Manufacturing the X-Ray Mask and Exposure Method Using the X-Ray Mask
Patent:
5,541,023 →
Application:
08/067,623 →
Pattern Inspection Apparatus and Electron Beam Apparatus
Patent:
5,430,292 →
Application:
08/134,860 →
Pattern Inspection Apparatus and Electron Beam Apparatus
Patent:
5,384,463 →
Application:
08/238,349 →
Pattern Inspection Apparatus and Electron Beam Apparatus
Patent:
5,557,105 →
Application:
08/320,377 →
Computer-Aided Timing Adjusting Method and Apparatus
Patent:
6,606,736 →
Application:
09/289,966 →
Determining transmitting stations in an OFDMA network
Application:
11/643,810 →
Publication:
US 2008/0107078
Determining transmitting stations in an OFDMA network
Application:
11/643,811 →
Publication:
US 2008/0107072
Scheduler Having Queue for Scheduling Transmission of Items from a Station in a Wireless Network
Switchable Transceiver for Relay Station
Application:
11/691,785 →
Publication:
US 2008/0108312
Amble Modulation Series
Application:
11/744,290 →
Publication:
US 2008/0212463
Centralized-Scheduler Relay Station for Mmr Extended 802.16E System
Application:
11/744,305 →
Publication:
US 2008/0108355
Treatment of Secondary Management Data as User Data in an Ieee 802.16 System Scheduler
Application:
11/751,200 →
Publication:
US 2008/0112343
Stale Data Removal Using Latency Count in a Wimax Scheduler
Reuse Pattern Network Scheduling Using Interference Levels
Reuse Pattern Network Scheduling Using Load Levels
Application:
11/777,494 →
Publication:
US 2008/0171551
Interference Measuring and Mapping Method and Apparatus for Wireless Networks Using Relay Stations
Frame Structure for a Relay Station Operating in Mobile Networks
Bandwidth Reuse in a Multi-Hop Mobile Relay System
Application:
11/930,360 →
Publication:
US 2008/0107063
Method and Apparatus for Controlling a Relay Station in a Multi-Hop Relay Network
Method and Apparatus for Estimating Core Size in Designing Semiconductor Integrated Circuit
Method and Apparatus for Automatic Gain Control in a Mobile Orthogonal Frequency Division Multiple Access (Ofdma) Network
Application:
12/338,411 →
Publication:
US 2009/0268678
Interference Measuring and Mapping Method and Apparatus for Wireless Networks Using Relay Stations
Related Assignments
(25)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignors Interest.
Mar 28, 1988
From: NAKAMURA, MORITAKA; KURIMOTO, TAKASHI
To: FUJITSU LIMITED
Reel/Frame 004865/0726 →
Assignment of Assignors Interest.
Jun 16, 1988
From: TAGUCHI, MASAO
To: FUJITSU LIMITED, 1015, KAMIKODANAKA, NAKAHARA-KU, KAWASAKI-SHI, KANAGAWA, 211, JAPAN, A CORP OF JAPAN
Reel/Frame 004923/0947 →
Assignment of Assignors Interest.
Nov 10, 1988
From: EMA, TAIJI
To: FUJITSU LIMITED, A CORP. OF JAPAN
Reel/Frame 004973/0405 →
Assignment of Assignors Interest.
Nov 10, 1988
From: EMA, TAIJI
To: FUJITSU LIMITED
Reel/Frame 004968/0599 →
Assignment of Assignors Interest.
Aug 22, 1989
From: EMA, TAIJI
To: FUJITSU LIMITED
Reel/Frame 005118/0284 →
Assignment of Assignors Interest.
Nov 21, 1990
From: SAKAMOTO, KIICHI; OAE, YOSHIHISA; FUEKI, SHUNSUKE; YAMADA, AKIO
To: FUJITSU LIMITED,
Reel/Frame 005516/0592 →
Assignment of Assignors Interest.
Mar 14, 1991
From: FUEKI, SHUNSUKE
To: FUJITSU LIMITED
Reel/Frame 005641/0971 →
Assignment of Assignors Interest.
Sep 10, 1991
From: KONDO, KAZUAKI
To: FUJITSU LIMITED
Reel/Frame 005839/0037 →
Assignment of Assignors Interest.
Mar 17, 1993
From: SUITA, MAKIO; KITAJIMA, HIRONOBU; YAMABE, MASAKI
To: FUJITSU LIMITED
Reel/Frame 006468/0722 →
Assignment of Assignor's Interest
Aug 5, 1993
From: KONDO, KAZUAKI; SUGISHIMA, KENJI
To: FUJITSU LIMITED
Reel/Frame 006635/0777 →
Assignment of Assignor's Interest
Apr 13, 1999
From: KOBAYASHI, TATSUYA; YASUE, YOSHIHIRO
To: FUJITSU LIMITED
Reel/Frame 009908/0305 →
Assignment of Assignor's Interest
Feb 26, 2007
From: VIOREL, DORIN; CAMERON, FRASER
To: FUJITSU LIMITED
Reel/Frame 018977/0803 →
Assignment of Assignor's Interest
Feb 26, 2007
From: VIOREL, DORIN; CAMERON, FRASER
To: FUJITSU LIMITED
Reel/Frame 018977/0805 →
Assignment of Assignor's Interest
Mar 21, 2007
From: OLESZCZUK, ANTONI
To: FUJITSU LIMITED
Reel/Frame 019083/0477 →
Assignment of Assignor's Interest
Mar 27, 2007
From: VIOREL, DORIN; GILBERTSON, CHAD; SUKIASYAN, ARAM
To: FUJITSU LIMITED
Reel/Frame 019117/0744 →
Assignment of Assignor's Interest
May 4, 2007
From: OLESZCZUK, ANTONI
To: FUJITSU LIMITED
Reel/Frame 019281/0706 →
Assignment of Assignor's Interest
May 4, 2007
From: HUO, CHANGQIN
To: FUJITSU LIMITED
Reel/Frame 019279/0046 →
Assignment of Assignor's Interest
May 21, 2007
From: OLESZCZUK, ANTONI
To: FUJITSU LIMITED
Reel/Frame 019358/0442 →
Assignment of Assignor's Interest
May 30, 2007
From: OLESZCZUK, ANTONI
To: FUJITSU LIMITED
Reel/Frame 019393/0484 →
Assignment of Assignor's Interest
Nov 9, 2007
From: HUO, CHANGQIN
To: FUJITSU LIMITED
Reel/Frame 020122/0932 →
Assignment of Assignor's Interest
Nov 16, 2007
From: OLESZCZUK, ANTONI, MR.
To: FUJITSU LIMITED
Reel/Frame 020124/0744 →
Assignment of Assignor's Interest
Nov 26, 2007
From: OLESZCZUK, ANTONI
To: FUJITSU LIMITED
Reel/Frame 020181/0190 →
Assignment of Assignor's Interest
Nov 26, 2007
From: OLESZCZUK, ANTONI
To: FUJITSU LIMITED
Reel/Frame 020181/0460 →
Assignment of Assignor's Interest
Nov 26, 2007
From: OLESZCZUK, ANTONI
To: FUJITSU LIMITED
Reel/Frame 020177/0437 →
Assignment of Assignor's Interest
Dec 18, 2007
From: VIOREL, DORIN, MR.; GILBERTSON, CHAD, MR.; SUKIASYAN, ARAM, MR.
To: FUJITSU LIMITED
Reel/Frame 020262/0442 →