IP Library › Assignment 024221/0009
Patent Assignment
Reel/Frame 024221/0009

Assignment of Assignor's Interest

Recorded: 2010-04-12 Pages: 2
Assignors
LAN, YUAN KU
Executed: 2010-04-12
LEE, CHUNG-YUAN
Executed: 2010-04-12
Assignee
INOTERA MEMORIES, INC.
NO. 667, FUSING 3RD RD., GUEISHAN TOWNSHIP, TAOYUAN COUNTY 333, R.O.C., TAIWAN
Covered Property (1)
Method for Detecting Errors of Exposed Positions of a Pre-Layer and a Current Layer by an Integrated Alignment and Overlay Mark
Patent: 8,193,648 →
Application: 12/758,289 →
Publication: US 2011/0156285
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Supplement No. 3 to Patent Security Agreement Feb 10, 2017
From: MICRON TECHNOLOGY, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 041675/0105 →
Assignment of Assignor's Interest Feb 27, 2017
From: INOTERA MEMORIES, INC.
To: MICRON TECHNOLOGY, INC.
Reel/Frame 041820/0815 →
Release of Security Interest Oct 9, 2019
From: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.
Reel/Frame 050695/0825 →
Release of Security Interest Nov 12, 2019
From: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
To: MICRON TECHNOLOGY, INC.; MICRON SEMICONDUCTOR PRODUCTS, INC.
Reel/Frame 051028/0001 →