Patent Assignment
Reel/Frame 026740/0215
Assignment of Assignor's Interest
Recorded: 2011-08-12
Pages: 2
Assignors
TANIGUCHI, ATSUSHI
Executed: 2011-06-30
UENO, TAKETO
Executed: 2011-06-30
SHIBATA, YUKIHIRO
Executed: 2011-07-11
MAEDA, SHUNJI
Executed: 2011-07-07
MATSUI, TETSUYA
Executed: 2011-07-25
Assignee
HITACHI HIGH-TECHNOLOGIES CORPORATION
24-14, NISHISHINBASHI 1-CHOME, MINATO-KU, TOKYO, JAPAN
Covered Property
(1)
Dark-Field Defect Inspecting Method, Dark-Field Defect Inspecting Apparatus, Aberration Analyzing Method, and Aberration Analyzing Apparatus
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Feb 21, 2014
From: RASBAND, PAUL B; BAUER, DONALD G; CAMPERO, RICHARD J
To: VUE TECHNOLOGY, INC.
Reel/Frame 032268/0424 →
Merger
Feb 21, 2014
From: VUE TECHNOLOGIES, INC
To: SENSORMATIC ELECTRONICS CORPORATION
Reel/Frame 032268/0542 →
Merger
Feb 21, 2014
From: SENSORMATIC ELECTRONICS CORPORATION
To: SENSORMATIC ELECTRONICS, LLC
Reel/Frame 032268/0632 →
Change of Name and Address
Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →