IP Library › Assignment 032268/0542
Patent Assignment
Reel/Frame 032268/0542

Merger

Recorded: 2014-02-21 Pages: 7
Assignor
VUE TECHNOLOGIES, INC
Executed: 2008-12-22
Assignee
SENSORMATIC ELECTRONICS CORPORATION
6600 CONGRESS AVENUE, BOCA RATON, FLORIDA, 33487
Covered Property (1)
Dark-Field Defect Inspecting Method, Dark-Field Defect Inspecting Apparatus, Aberration Analyzing Method, and Aberration Analyzing Apparatus
Patent: 8,681,328 →
Application: 13/142,328 →
Publication: US 2011/0286001
Related Assignments (4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest Aug 12, 2011
From: TANIGUCHI, ATSUSHI; UENO, TAKETO; SHIBATA, YUKIHIRO; MAEDA, SHUNJI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 026740/0215 →
Assignment of Assignor's Interest Feb 21, 2014
From: RASBAND, PAUL B; BAUER, DONALD G; CAMPERO, RICHARD J
To: VUE TECHNOLOGY, INC.
Reel/Frame 032268/0424 →
Merger Feb 21, 2014
From: SENSORMATIC ELECTRONICS CORPORATION
To: SENSORMATIC ELECTRONICS, LLC
Reel/Frame 032268/0632 →
Change of Name and Address Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →