Patent Assignment
Reel/Frame 032268/0424
Assignment of Assignor's Interest
Recorded: 2014-02-21
Pages: 8
Assignors
RASBAND, PAUL B
Executed: 2008-07-02
BAUER, DONALD G
Executed: 2008-07-10
CAMPERO, RICHARD J
Executed: 2008-07-02
Assignee
VUE TECHNOLOGY, INC.
103 NORTH POINTE DRIVE, LAKE FOREST, CALIFORNIA, 92630
Covered Property
(1)
Dark-Field Defect Inspecting Method, Dark-Field Defect Inspecting Apparatus, Aberration Analyzing Method, and Aberration Analyzing Apparatus
Related Assignments
(4)
Other recorded transfers of the patent in this record — the chain of ownership.
Assignment of Assignor's Interest
Aug 12, 2011
From: TANIGUCHI, ATSUSHI; UENO, TAKETO; SHIBATA, YUKIHIRO; MAEDA, SHUNJI
To: HITACHI HIGH-TECHNOLOGIES CORPORATION
Reel/Frame 026740/0215 →
Merger
Feb 21, 2014
From: VUE TECHNOLOGIES, INC
To: SENSORMATIC ELECTRONICS CORPORATION
Reel/Frame 032268/0542 →
Merger
Feb 21, 2014
From: SENSORMATIC ELECTRONICS CORPORATION
To: SENSORMATIC ELECTRONICS, LLC
Reel/Frame 032268/0632 →
Change of Name and Address
Mar 30, 2020
From: HITACHI HIGH-TECHNOLOGIES CORPORATION
To: HITACHI HIGH-TECH CORPORATION
Reel/Frame 052259/0227 →