IP Library › Assignment 037391/0741
Patent Assignment
Reel/Frame 037391/0741

Merger

Recorded: 2015-12-31 Pages: 11
Assignor
Assignee
NYTELL SOFTWARE LLC
2711 CENTERVILLE RD, SUITE 400, WILMINGTON, DELAWARE, 19808
Covered Properties (16)
Semiconductor Device Having Variable Parameter Selection Based on Temperature and Test Method
Patent: 7,383,149 →
Application: 11/637,280 →
Semiconductor Device Having Variable Parameter Selection Based on Temperature and Test Method
Patent: 8,049,145 →
Application: 11/708,174 →
Semiconductor Device Having Variable Parameter Selection Based on Temperature and Test Method
Patent: 7,603,249 →
Application: 11/708,184 →
Semiconductor Device Having Variable Parameter Selection Based on Temperature and Test Method
Patent: 7,535,786 →
Application: 11/708,185 →
Semiconductor Device Having Variable Parameter Selection Based on Temperature and Test Method
Patent: 7,480,588 →
Application: 11/708,408 →
Semiconductor Device Having Variable Parameter Selection Based on Temperature and Test Method
Patent: 7,760,570 →
Application: 11/708,733 →
Semiconductor Device Having Variable Parameter Selection Based on Temperature and Test Method
Patent: 7,720,627 →
Application: 12/150,091 →
Semiconductor Device Having Variable Parameter Selection Based on Temperature and Test Method
Patent: 7,654,736 →
Application: 12/315,521 →
Semiconductor Device Having Variable Parameter Selection Based on Temperature and Test Method
Patent: 7,639,548 →
Application: 12/391,764 →
Temperature Sensing Circuit with Hysteresis and Time Delay
Patent: 8,005,641 →
Application: 12/540,446 →
Publication: US 2011/0037138
Semiconductor Device Having Variable Parameter Selection Based on Temperature and Test Method
Patent: 8,040,742 →
Application: 12/635,533 →
Publication: US 2011/0044118
Semiconductor Device Having Variable Parameter Selection Based on Temperature and Test Method
Patent: 8,308,359 →
Application: 12/688,662 →
Publication: US 2011/0044372
Semiconductor Device Having Variable Parameter Selection Based on Temperature and Test Method
Patent: 7,953,573 →
Application: 12/753,411 →
Publication: US 2011/0044119
Semiconductor Device Having Variable Parameter Selection Based on Temperature and Test Method
Patent: 8,081,532 →
Application: 12/793,845 →
Publication: US 2011/0046912
Semiconductor Device Having Variable Parameter Selection Based on Temperature
Patent: 8,497,453 →
Application: 13/235,754 →
Publication: US 2012/0008447
Semiconductor Device Having Variable Parameter Selection Based on Temperature and Test Method
Patent: 9,766,135 →
Application: 13/490,890 →
Publication: US 2012/0243574
Related Assignments (4)
Other recorded transfers of the patents in this record — the chain of ownership.
Assignment of Assignor's Interest Mar 22, 2019
From: WALKER, DARRYL G.
To: AGERSONN RALL GROUP, L.L.C.
Reel/Frame 048678/0131 →
Change of Name Mar 22, 2019
From: AGERSONN RALL GROUP, L.L.C.
To: INTELLECTUAL VENTURES HOLDING 83 LLC
Reel/Frame 048679/0176 →
Assignment of Assignor's Interest May 14, 2019
From: NYTELL SOFTWARE LLC
To: INTELLECTUAL VENTURES ASSETS 124 LLC
Reel/Frame 049167/0319 →
Assignment of Assignor's Interest May 23, 2019
From: INTELLECTUAL VENTURES ASSETS
To: SAMSUNG ELECTRONCS CO., LTD.
Reel/Frame 049266/0532 →