IP Library › Granted Patent US 6,682,945
Granted Patent Utility
US 6,682,945 · Confirmation No. 6303

WAFER LEVEL BURN-IN AND ELECTRICAL TEST SYSTEM AND METHOD

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2019-11-05 OATH Oath or Declaration filed 8 View
2003-11-25 IFEE Issue Fee Payment (PTO-85B) 2 View
2003-11-21 IFEE Issue Fee Payment (PTO-85B) 2 View
2001-06-28 DRW Drawings-only black and white line drawings 16 View
2001-05-25 TRNA Transmittal of New Application 2 View
2001-05-25 A.PE Preliminary Amendment 3 View
2001-05-25 SPEC Specification 12 View
2001-05-25 CLM Claims 6 View
2001-05-25 ABST Abstract 1 View
2001-05-25 DRW Drawings-only black and white line drawings 16 View
2001-05-25 OATH Oath or Declaration filed 5 View
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Quick Facts
Patent No.
US 6,682,945
App. No.
09/865,957
Filed
2001-05-25
Granted
2004-01-27
Pub. No.
US20020048826A1
Art Unit
2812
PTA
-105 days