CMP compositions for low-k dielectric materials
View Patent ↗The invention provides a method of polishing a substrate containing a low-k dielectric layer comprising (i) contacting the substrate with a chemical-mechanical polishing system comprising (a) an abrasive, a polishing pad, or a combination thereof, (b) an amphiphilic nonionic surfactant, and (c) a liquid carrier, and (ii) abrading at least a portion of the substrate to polish the substrate.
1. A method of polishing a substrate comprising:
(i) contacting a substrate comprising (A) a metal layer selected from the group consisting of copper, tantalum, titanium, tungsten, nickel, platinum, ruthenium, iridium, and rhodium, and (B) a dielectric layer with a chemical-mechanical polishing system comprising:
(a) (1) an abrasive selected from the group consisting of alumina, silica, co-formed products thereof, coated metal oxide particles, polymer particles, and combinations thereof, (2) a polishing pad, or (3) a combination of items (1) and (2),
(b) an amphiphilic nonionic surfactant,
(c) an oxidizing agent, and
(d) a liquid carrier, and
(ii) abrading at least a portion of the substrate to polish the substrate,
wherein the dielectric layer has a dielectric constant of about 3.5 or lower, and wherein the amphiphilic nonionic surfactant is (A) a 2,4,7,9-tetramethyl-5-decvne-4,7-diol ethoxylate, (B) selected from the group consisting of polyoxyethylene alkyl ethers and polyoxyethylene alkyl acid esters, wherein the alkyl is a C 6-30 alkyl, which can be saturated or partially unsaturated, and is optionally branched, (C) a polyoxyethylenesorbitan alkyl acid ester, wherein the alkyl is a C 6-30 alkyl, can be saturated or partially unsaturated, and can be optionally branched, (D) a block copolymer comprising polyoxyethylene and polyoxypropylene, or polyoxyethylene and polyethylene, or (E) selected from the group consisting of polyoxyethylene alkyl amines, polyoxyethylene alkyl alkanolamides, and combinations thereof.
2. The method of claim 1 , wherein the amphiphilic nonionic surfactant has an HLB of about 7 or greater.
3. The method of claim 1 , wherein the amphiphilic nonionic surfactant is a 2,4,7,9-tetramethyl-5-decyne-4,7-diol ethoxylate.
4. The method of claim 1 , wherein the amphiphilic nonionic surfactant is selected from the group consisting of polyoxyethylene alkyl ethers and polyoxyethylene alkyl acid esters, wherein the alkyl is a C 6-30 alkyl, which can be saturated or partially unsaturated, and is optionally branched.
5. The method of claim 4 , wherein the amphiphilic nonionic surfactant is a polyoxyethylene lauryl ether, polyoxyethylene cetyl ether, polyoxyethylene stearyl ether, polyoxyethylene oleyl ether, polyoxyethylene monolaurate, polyoxyethylene monostearate, polyoxyethylene distearate, polyoxyethylene monooleate, or a combination thereof.
6. The method of claim 4 , wherein the amphiphilic nonionic surfactant is a polyoxyethylene alkylphenyl ether or a polyoxyethylene alkylcyclohexyl ether, wherein the alkyl is a C 6-30 alkyl, can be saturated or partially unsaturated, and can be optionally branched.
7. The method of claim 1 , wherein the amphiphilic nonionic surfactant is a polyoxyethylenesorbitan alkyl acid ester, wherein the alkyl is a C 6-30 alkyl, can be saturated or partially unsaturated, and can be optionally branched.
8. The method of claim 1 , wherein the amphiphilic nonionic surfactant is a block copolymer comprising polyoxyethylene and polyoxypropylene, or polyoxyethylene and polyethylene.
9. The method of claim 1 , wherein the amphiphilic nonionic surfactant is selected from the group consisting of polyoxyethylene alkyl amines, polyoxyethylene alkyl alkanolamides, and combinations thereof.
10. The method of claim 1 , wherein the system has a pH of about 6 or greater.
11. The method of claim 1 , wherein the system comprises an abrasive.
12. The method of claim 11 , wherein the abrasive is suspended in the liquid carrier.
13. The method of claim 12 , wherein the system further comprises a polishing pad.
14. The method of claim 1 , wherein the liquid carrier comprises water.
15. The method of claim 1 , wherein the polishing system comprises about 0.005 wt. % or more amphiphilic nonionic surfactant, based on the weight of the liquid carrier and any compounds dissolved or suspended therein.
16. The method of claim 11 , wherein the polishing system comprises about 0.005 wt. % to about 0.05 wt. % amphiphilic nonionic surfactant, based on the weight of the liquid carrier and any compounds dissolved or suspended therein.
17. The method of claim 1 , wherein the dielectric layer is an organically modified silicon glass.
18. The method of claim 12 , wherein the dielectric layer is carbon-doped silicon dioxide.
19. The method of claim 1 , wherein the metal layer comprises copper or tantalum.
20. The method of claim 1 , wherein the oxidizing agent is selected from the group consisting of hydrogen peroxide, potassium monopersulfate, ammonium persulfate, and mixtures thereof.
21. The method of claim 20 , wherein the oxidizing agent is hydrogen peroxide.
22. A method of polishing a substrate comprising:
(i) contacting a substrate comprising (A) a metal layer selected from the group consisting of copper, tantalum, titanium, tungsten, nickel, platinum, ruthenium, iridium, and rhodium, and (B) a dielectric layer, with a chemical-mechanical polishing system comprising:
(a) (1) an abrasive selected from the group consisting of alumina, silica, co-formed products thereof, coated metal oxide particles, polymer particles, and combinations thereof, (2) a polishing pad, or (3) a combination of items (1) and (2),
(b) an amphiphilic nonionic surfactant, and
(c) a liquid carrier, and
(ii) abrading at least a portion of the substrate to polish the substrate,
wherein the dielectric layer has a dielectric constant of about 3.5 or lower, and wherein the amphiphilic nonionic surfactant is (A) a 2,4,7,9-tetraethyl-5-decyne-4,7-diol ethoxylate, (B) a block copolymer comprising polyoxyethylene and polyoxypropylene, or polyoxyethylene and polyethylene, (C) selected from the group consisting of polyoxyethylene alkyl amines, polyoxyethylene alkyl alkanolamides, and combinations thereof, or (D) a polyoxyethylenesorbitan alkyl acid ester, wherein the alkyl is a C 6-30 alkyl, can be saturated or partially unsaturated, and can be optionally branched.
23. The method of claim 22 , wherein the amphiphilic nonionic surfactant has an HLB of about 7 or greater.
24. The method of claim 22 wherein the system has a pH of about 6 or greater.
25. The method of claim 22 , wherein the system comprises an abrasive.
26. The method of claim 25 , wherein the abrasive is suspended in the liquid carrier.
27. The method of claim 26 , wherein the system further comprises a polishing pad.
28. The method of claim 22 , wherein the polishing system comprises about 0.005 wt. % or more amphiphilic nonionic surfactant, based on the weight of the liquid carrier and any compounds dissolved or suspended therein.
29. The method of claim 25 , wherein the polishing system comprises about 0.005 wt. % to about 0.05 wt. % amphiphilic nonionic surfactant, based on the weight of the liquid carrier and any compounds dissolved or suspended therein.
30. The method of claim 22 , wherein the dielectric layer is an organically modified silicon glass.
31. The method of claim 26 , wherein the dielectric layer is carbon-doped silicon dioxide.
32. The method of claim 22 , herein the metal layer comprises copper or tantalum.