IP Library Granted Patent US 7,044,836
Granted Patent B2
US 7,044,836 · App. 10/419,580 · Granted May 16, 2006

Coated metal oxide particles for CMP

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Quick Facts
Patent No.
US 7,044,836
App. No.
10/419,580
Granted
May 16, 2006
Kind
B2
Abstract

The invention provides a method of polishing a substrate, which method comprises the steps of (i) providing a polishing composition, (ii) providing a substrate comprising at least one metal layer, and (iii) abrading at least a portion of the metal layer with the polishing composition to polish the substrate. The polishing composition comprises an abrasive and a liquid carrier, wherein the abrasive comprises metal oxide particles having a surface with a silane compound adhered to a portion thereof and a polymer adhered to the silane compound and wherein the polymer is selected from the group consisting of water-soluble polymers and water-emulsifiable polymers. The invention also provides a polishing composition as described above, wherein the total amount of abrasive particles present in the polishing composition is no greater than about 20% by weight of the polishing composition, and the metal oxide particles do not comprise zirconia.

Claims (53)

1. A method of polishing a substrate, which method comprises the steps of:

(i) providing a polishing composition comprising:

(a) an abrasive and

(b) a liquid carrier,

wherein the abrasive comprises metal oxide particles having a surface with a silane compound adhered to a portion thereof and a polymer adhered to the silane compound and wherein the polymer is selected from the group consisting of water-soluble polymers and water-emulsifiable polymers,

(ii) providing a substrate comprising at least one metal layer, and

(iii) abrading at least a portion of the metal layer with the polishing composition to polish the substrate.

2. The method of claim 1 , wherein the silane compound is selected from the group consisting of functionalized silanes, disilanes, trisilanes, oligomeric silanes, polymeric silanes, and combinations thereof.

3. The method of claim 2 , wherein the silane compound comprises at least one functional group selected from the group consisting of amine groups, carboxylic acid groups, anhydride groups, phosphonic acid groups, pyridinyl groups, hydroxyl groups, epoxy groups, and salts thereof.

4. The method of claim 3 , wherein the silane compound comprises at least one amine group.

5. The method of claim 1 , wherein the polymer is an anionic polymer or copolymer.

6. The method of claim 5 , wherein the anionic polymer or copolymer comprises repeating units containing carboxylic acid, sulfonic acid, or phosphonic acid functional groups, or combinations thereof.

7. The method of claim 6 , wherein the silane compound comprises at least one amine group.

8. The method of claim 6 , wherein the anionic polymer or copolymer comprises repeating units selected from the group consisting of acrylic acid, methacrylic acid, itaconic acid, maleic acid, maleic anhydride, vinyl sulfonic acid, 2-methacryloyloxyethanesulfonate, styrenesulfonic acid, 2-acrylamido-2-methylpropane sulfonic acid (AMPS), vinylphosphonic acid, 2-(methacryloyloxy)ethylphosphate, salts thereof, and combinations thereof.

9. The method of claim 1 , wherein the polymer is a cationic polymer or copolymer.

10. The method of claim 9 , wherein the cationic polymer or copolymer comprises repeating units containing amine functional groups.

11. The method of claim 10 , wherein the cationic polymer or copolymer comprises repeating units selected from the group consisting of allylamine, vinylamine, ethyleneimine, vinyl pyridine, diethylaminoethyl methacrylate, diallyldimethylammonium chloride, methacryloyloxyethyltrimethylammonium sulfate, and combinations thereof.

12. The method of claim 1 , wherein the silane compound comprises at least one functional group selected from the group consisting of hydroxyl groups, epoxy groups, and salts thereof, and the polymer comprises at least one functional group selected from the group consisting of amine groups, carboxylic acid groups, and salts thereof.

13. The method of claim 1 , wherein the metal oxide particles comprise a metal oxide selected from the group consisting of alumina, silica, titania, ceria, zirconia, germania, magnesia, tantalum oxide (TaO x ), and combinations thereof.

14. The method of claim 13 , wherein the metal oxide particles comprise silica.

15. The method of claim 1 , wherein the polishing composition further comprises an acid.

16. The method of claim 15 , wherein the acid is an inorganic acid.

17. The method of claim 16 , wherein the acid is an inorganic acid selected from the group consisting of nitric acid, phosphoric acid, sulfuric acid, salts thereof, and combinations thereof.

18. The method of claim 15 , wherein the acid is an organic acid.

19. The method of claim 18 , wherein the acid is an organic acid selected from the group consisting of oxalic acid, malonic acid, tartaric acid, acetic acid, lactic acid, propionic acid, phthalic acid, benzoic acid, citric acid, succinic acid, salts thereof, and combinations thereof.

20. The method of claim 1 , wherein the polishing composition has a pH of about 3 to about 7.

21. The method of claim 1 , wherein the polishing composition further comprises a surfactant.

22. The method of claim 1 , wherein the polishing composition further comprises a chemical oxidizing agent.

23. A polishing composition comprising:

(i) an abrasive and

(ii) a liquid medium,

wherein the abrasive comprises metal oxide particles having a surface with a silane compound adhered to a portion thereof and a polymer adhered to the silane compound, the polymer is selected from the group consisting of water-soluble polymers and water-emulsifiable polymers, the total amount of metal oxide particles present in the polishing composition is no greater than about 20% by weight of the polishing composition, and the metal oxide particles do not comprise zirconia.

24. The polishing composition of claim 23 , wherein the silane compound is selected from the group consisting of functionalized silanes, disilanes, trisilanes, oligomeric silanes, polymeric silanes, and combinations thereof.

25. The polishing composition of claim 24 , wherein the silane compound comprises at least one functional group selected from the group consisting of amine groups, carboxylic acid groups, anhydride groups, phosphonic acid groups, pyridinyl groups, hydroxyl groups, epoxy groups, and salts thereof.

26. The polishing composition of claim 25 , wherein the silane compound comprises at least one amine group.

27. The polishing composition of claim 23 , wherein the polymer is an anionic polymer or copolymer.

28. The polishing composition of claim 27 , wherein the anionic polymer or copolymer comprises repeating units containing carboxylic acid, sulfonic acid, or phosphonic acid functional groups, or combinations thereof.

29. The polishing composition of claim 28 , wherein the silane compound comprises at least one amine group.

30. The polishing composition of claim 28 , wherein the anionic polymer or copolymer comprises repeating units selected from the group consisting of acrylic acid, methacrylic acid, itaconic acid, maleic acid, maleic anhydride, vinyl sulfonic acid, 2-methacryloyloxyethanesulfonate, styrenesulfonic acid, 2-acrylamido-2-methylpropane sulfonic acid (AMPS), vinylphosphonic acid, 2-(methacryloyloxy)ethylphosphate, salts thereof, and combinations thereof.

31. The polishing composition of claim 23 , wherein the polymer comprises a cationic polymer or copolymer.

32. The polishing composition of claim 31 , wherein the cationic polymer or copolymer comprises repeating units containing amine functional groups.

33. The polishing composition of claim 32 , wherein the cationic polymer or copolymer comprises repeating units selected from the group consisting of allylamine, vinylamine, ethyleneimine, vinyl pyridine, diethylaminoethyl methacrylate, diallyldimethylammonium chloride, methacryloyloxyethyltrimethylammonium sulfate, and combinations thereof.

34. The polishing composition of claim 23 , wherein the silane compound comprises at least one functional group selected from the group consisting of hydroxyl groups, epoxy groups, and salts thereof, and the polymer comprises at least one functional group selected from the group consisting of amine groups, carboxylic acid groups, and salts thereof.

35. The polishing composition of claim 23 , wherein the abrasive is selected from the group consisting of alumina, silica, titania, ceria, germania, magnesia, tantalum oxide (TaO x ), and combinations thereof.

36. The polishing composition of claim 35 , wherein the abrasive is silica.

37. The polishing composition of claim 23 , wherein the polishing composition further comprises an acid.

38. The polishing composition of claim 37 , wherein the acid is an inorganic acid.

39. The polishing composition of claim 38 , wherein the inorganic acid is selected from the group consisting of nitric acid, phosphoric acid, sulfuric acid, salts thereof, and combinations thereof.

40. The polishing composition of claim 37 , wherein the acid is an organic acid.

41. The polishing composition of claim 40 , wherein the organic acid is selected from the group consisting of oxalic acid, malonic acid, tartaric acid, acetic acid, lactic acid, propionic acid, phthalic acid, benzoic acid, citric acid, succinic acid, salts thereof, and combinations thereof.

42. The polishing composition of claim 23 , wherein the polishing composition has a pH of about 3 to about 7.

43. The polishing composition of claim 23 , wherein the polishing composition further comprises a surfactant.

44. The polishing composition of claim 23 , wherein the polishing composition further comprises a chemical oxidizing agent.

Assignments (8)
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
RELEASE OF SECURITY INTEREST Recorded Nov 16, 2018
From: BANK OF AMERICA, N.A.
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 047587/0119 →
NOTICE OF SECURITY INTEREST IN PATENTS Recorded Feb 16, 2012
From: CABOT MICROELECTRONICS CORPORATION
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 027727/0275 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 7, 2003
From: SUN, FRED F.; LU, BIN; LIGHTLE, ETHAN K.; WANG, SHUMIN
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 013778/0787 →