IP Library Granted Patent US 7,135,760
Granted Patent B2
US 7,135,760 · App. 10/446,275 · Granted Nov 14, 2006

Moisture resistant integrated circuit leadframe package

Assignee: ST Assembly Test Services Ltd.
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Quick Facts
Patent No.
US 7,135,760
App. No.
10/446,275
Granted
Nov 14, 2006
Kind
B2
Abstract

A leadframe for a semiconductor die includes signal leads, ground leads, and a die support holder for supporting the semiconductor die. The die support holder has opposite surfaces and side edges therebetween. The opposite die support holder surfaces are smaller in transverse extent than the semiconductor die for supporting the die on one of the opposite die support holder surfaces such that the die extends beyond the side edges of the die support holder.

Claims (39)

1. A leadframe for a semiconductor die, comprising:

signal leads;

ground leads;

a die support holder for supporting the semiconductor die, the die support holder having opposite surfaces and side edges therebetween, the opposite die support holder surfaces being smaller in transverse extent than the semiconductor die for supporting the die on one of the opposite die supporting holder surfaces such that the die extends beyond the side edges of the die support holder; and

a ground plane bonding structure supported at a predetermined position relative to the die support holder.

2. The leadframe of claim 1 further comprising a force release and stress relief structure formed in the ground plane bonding structure to free the ground plane bonding structure substantially from distortion and warpage resulting from residual mechanical stresses therein.

3. The leadframe of claim 2 wherein the force release and stress relief structure further comprises at least one corner D-ring opening formed in the ground plane bonding structure.

4. The leadframe of claim 2 wherein the force release and stress relief structure further comprises at least one bonding ring hole formed in the ground plane bonding structure.

5. A leadframe for a semiconductor die, comprising:

signal and ground leads;

a ground plane connected to a plurality of the ground leads;

a frame paddle for supporting the semiconductor die, the frame paddle having opposite surfaces and side edges therebetween, the opposite frame paddle surfaces being smaller in transverse extent than the semiconductor die for supporting the die on one of the opposite frame paddle surfaces such that the die extends beyond the side edges of the frame paddle; and

supports connecting the signal and ground leads, ground plane, and frame paddle in at least three different layers.

6. The leadframe of claim 5 wherein the ground plane further comprises a ground plane bonding ring.

7. The leadframe of claim 6 further comprising force release and stress relief structures incorporated into the ground plane bonding ring to free the ground plane bonding ring substantially from distortion and warpage resulting from residual mechanical stresses therein.

8. The leadframe of claim 7 wherein the force release and stress relief structures further comprise corner D-ring openings formed in the ground plane bonding ring.

9. The leadframe of claim 7 wherein the force release and stress relief structures further comprise bonding ring holes formed in the ground plane bonding ring.

10. A semiconductor package, comprising:

a semiconductor die;

a leadframe having a die support holder having opposite surfaces and side edges therebetween, the opposite die support holder surfaces being smaller in transverse extent than the semiconductor die, and the die being supported on one of the opposite die support holder surfaces and extending beyond the side edges of the die support holder;

an encapsulating body formed substantially around at least the semiconductor die and the die support holder surface on which the die is located, the encapsulating body being formed to leave the opposite die support holder surface unencapsulated; and signal leads, ground leads, and a ground plane bonding structure supported at predetermined positions relative to the die support holder.

11. The package of claim 10 further comprising a force release and stress relief structure formed in the ground plane bonding structure to free the ground plane bonding structure substantially from distortion and warpage resulting from residual mechanical stresses therein.

12. The package of claim 11 wherein the force release and stress relief structure further comprises at least one corner D-ring opening formed in the ground plane bonding structure.

13. The package of claim 11 wherein the force release and stress relief structure further comprises at least one bonding ring hole formed in the ground plane bonding structure.

14. A semiconductor package, comprising:

a semiconductor die;

a leadframe having:

signal and ground leads;

a ground plane connected to a plurality of the ground leads;

a frame paddle having opposite surfaces and side edges therebetween, the opposite frame paddle surfaces being smaller in transverse extent than the semiconductor die, and the die being supported on one of the opposite frame paddle surfaces and extending beyond the side edges or the frame paddle; and

supports connecting the signal and ground leads, ground plane, and frame paddle in at least three different layers;

an adhesive securing the semiconductor die to the frame paddle;

at least one ground wire connected between the semiconductor die and the ground plane;

at least one signal wire connected between the semiconductor die and at least one of the signal leads; and

an encapsulating body formed substantially around the leadframe, wires, semiconductor die, and the frame paddle surface on which the die is located, the encapsulating body being formed to leave the opposite frame paddle surface unencapsulated.

15. The package of claim 14 wherein the ground plane further comprises a ground paddle bonding ring.

16. The package of claim 15 further comprising force release and stress relief structures incorporated into the ground plane bonding ring to free the ground plane bonding ring substantially from distortion and warpage resulting from residual mechanical stresses therein.

17. The package at claim 16 wherein the force release and stress relief structures further comprise D-ring openings formed in the ground plane bonding ring.

18. The package of claim 16 wherein the force release and stress relief structures further comprising bonding ring holes formed in the ground plane bonding ring.

Assignments (7)
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S NAME PREVIOUSLY RECORDED AT REEL: 038378 FRAME: 0400. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Sep 5, 2023
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTD.
Reel/Frame 064806/0593 →
RELEASE OF SECURITY INTEREST Recorded Jun 16, 2020
From: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
To: STATS CHIPPAC, INC.; STATS CHIPPAC PTE. LTD. FORMERLY KNOWN AS STATS CHIPPAC LTD.
Reel/Frame 052950/0497 →
CHANGE OF NAME Recorded Apr 7, 2016
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 038378/0400 →
CHANGE OF NAME Recorded Aug 6, 2015
From: ST ASSEMBLY TEST SERVICES LTD.
To: STATS CHIPPAC LTD.
Reel/Frame 036286/0590 →
SECURITY INTEREST Recorded Aug 6, 2015
From: STATS CHIPPAC, INC.; STATS CHIPPAC LTD.
To: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
Reel/Frame 036288/0748 →
CORRECTIVE ASSIGNMENT TO CORRECT THE ASSIGNEE'S ADDRESS. DOCUMENT PREVIOUSLY RECORDED ON REEL 014126 FRAME 0003, ASSIGNOR HEREBY CONFIRMS THE ASSIGNMENT. Recorded Nov 25, 2003
From: HAN, BYUNG JOON; AHN, BYUNG HOON
To: ST ASSEMBLY TEST SERVICES LTD.
Reel/Frame 014728/0660 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded May 23, 2003
From: HAN, BYUNG JOON; AHN, BYUNG HOON
To: ST ASSEMBLY TEST SERVICES LTD.
Reel/Frame 014126/0003 →
Continuity (2)
Provisional Application 6041522700 · Sep 30, 2002
Related Publication 20040061205A1 · Apr 1, 2004