Method of manufacturing a semiconductor memory with deuterated materials
View Patent ↗A method for manufacturing a MirrorBit® Flash memory includes providing a semiconductor substrate and successively depositing a first insulating layer, a charge-trapping layer, and a second insulating layer. First and second bitlines are implanted and wordlines are formed before completing the memory. Spacers are formed between the wordlines and an inter-layer dielectric layer is formed over the wordlines. One or more of the second insulating layer, wordlines, spacers, and inter-layer dielectric layers are deuterated, replacing hydrogen bonds with deuterium, thus improving data retention and substantially reducing charge loss.
1. A method of manufacturing an integrated circuit comprising:
forming a charge-trapping dielectric layer over a semiconductor substrate;
forming first and second bitlines in the semiconductor substrate;
forming a wordline over the charge-trapping dielectric layer; and
forming an interlayer dielectric layer over the wordline wherein for a structure selected from at least one of the charge-trapping dielectric layer, the wordline, the interlayer dielectric layer, and a combination thereof, the structure contains deuterium diffused from another structure selected from at least one of the charge-trapping dielectric layer, the wordline, the interlayer dielectric layer, and a combination thereof.
2. The method of manufacturing an integrated circuit as claimed in claim 1 wherein the forming includes forming deuterated materials for a structure selected from at least one of the charge-trapping dielectric layer, the wordline, the interlayer dielectric layer, and a combination thereof.
3. The method of manufacturing an integrated circuit as claimed in claim 1 including deuterating a structure selected from at least one of the charge-trapping dielectric layer, the wordline, the interlayer dielectric layer, and a combination thereof.
4. The method of manufacturing an integrated circuit as claimed in claim 1 wherein the forming the charge-trapping layer, the wordline, and the interlayer dielectric layer deposits materials selected from at least one of a deuterated silicon oxide, a deuterated silicon nitride, a deuterated silicon oxynitride, a polysilicon, a glass, and a combination thereof.
5. The method of manufacturing an integrated circuit as claimed in claim 1 wherein the forming the charge-trapping layer, the wordline, and the interlayer dielectric layer uses a process selected from at least one of high-density plasma deposition, rapid thermal chemical vapor deposition, low pressure chemical vapor deposition, rapid thermal oxidation, annealing in deuterium gas, and a combination thereof.
6. A method of manufacturing an integrated circuit comprising;
forming a first dielectric layer on a semiconductor substrate;
forming a charge-trapping layer over the first dielectric layer;
forming a second dielectric layer over the charge-strapping layer;
forming first and second bitlines in the semiconductor substrate;
forming a wordline over the second dielectric layer;
forming a spacer around the wordline and on the second dielectric layer; and
forming an interlayer dielectric layer over the wordline wherein for a structure selected from at least one of the first dielectric layer, the second dielectric layer, the wordline, the spacer, the interlayer dielectric layer, and a combination thereof is deuterated, the structure contains deuterium diffused from another structure selected from at least one of the first dielectric layers, the charge-trapping layer, the second dielectric layer, the wordline, the spacer, the interlayer dielectric layer, and the combination thereof.
7. The method of manufacturing an integrated circuit as claimed in claim 6 wherein the forming includes forming deuterated materials for a structure selected from at least one of the first dielectric layer, the charge-trapping layer, the second dielectric layer, the wordline, the spacer, the interlayer dielectric layer, and a combination thereof.
8. The method of manufacturing an integrated circuit as claimed in claim 6 including deuterating a structure selected from at least one of the first dielectric layer, the charge-trapping layer, the second dielectric layer, the wordline, the spacer, the interlayer dielectric layer, and a combination thereof.
9. The method of manufacturing an integrated circuit as claim in claim 6 wherein the forming the first dielectric layer, the charge-trapping layer, the second dielectric layer, the wordline, the spacer, and the interlayer dielectric layer deposits materials selected from at least one of deuterated silicon oxide, a deuterated silicon nitride, a deuterated silicon oxynitride, a polysilicon, a glass, and a combination thereof.
10. The method of manufacturing an integrated circuit as claimed in claim 6 wherein the forming the first dielectric layer, the charge-trapping layer, the second dielectric layer, the wordline, the spacer, and the interlayer dielectric layer uses a process selected from at least one of high-density plasma deposition, rapid thermal chemical vapor deposition, low pressure chemical vapor deposition, rapid thermal oxidation, annealing in deuterium gas, and a combination thereof.