IP Library Granted Patent US 7,748,344
Granted Patent B2
US 7,748,344 · App. 10/702,368 · Granted Jul 6, 2010

Segmented resonant antenna for radio frequency inductively coupled plasmas

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Quick Facts
Patent No.
US 7,748,344
App. No.
10/702,368
Granted
Jul 6, 2010
Kind
B2
Abstract

An ion shower system is disclosed and comprises a plasma source operable to generate source gas ions within a chamber. The plasma source further comprises a plurality of conductor segments and a plurality of capacitors, wherein the conductor segments are serially connected through the plurality of capacitors. The plasma source further comprises an antenna drive circuit coupled to the plurality of conductor segments that provides power to the conductor segments and capacitors at a predetermined frequency. The ion shower system also comprises a source gas inlet that provides a source gas to the chamber. The conductor segments, capacitors and antenna drive circuit cooperatively provide energy to charged particles in the chamber, thereby energizing the charged particles and generating a plasma comprising source gas ions and electrons within the chamber due to ionizing collisions between the energized charged particles and the source gas.

Claims (19)

1. An ion shower system, comprising:

a plasma source operable to generate source gas ions within a chamber, wherein the plasma source further comprises:

a plurality of conductor segments;

a plurality of capacitors, wherein the conductor segments are serially connected through the plurality of capacitors, wherein the series arrangement of conductor segments and capacitors reside within the chamber;

an antenna drive circuit coupled to the plurality of conductor segments, and operable to provide power to the conductor segments and capacitors at a predetermined frequency; and

a source gas inlet,

wherein the source gas inlet is operable to provide a source gas to the chamber, and wherein the conductor segments, capacitors and antenna drive circuit cooperatively provide energy to charged particles in the chamber, thereby energizing the charged particles and generating a plasma comprising source gas ions and electrons within the chamber due to ionizing collisions between the energized charged particles and the source gas;

an extraction assembly associated with the chamber, and operable to extract source gas ions therefrom.

2. The ion shower system of claim 1 , further comprising a workpiece support structure associated with the chamber, and operable to secure the workpiece for implantation thereof of source gas ions from the extraction assembly.

3. The ion shower system of claim 1 , wherein first and last conductor segments of the plurality of conductor segments form an input, and Wherein the antenna drive circuit is coupled to the input.

4. The ion showers system of claim 1 , wherein the conductor segments have an inductive reactance associated therewith, and wherein the capacitors have a capacitive reactance associated therewith, and wherein one of the conductors and one of the capacitors form an antenna segment, wherein the inductive reactance and capacitive reactance of the antenna segment are equal at the predetermined frequency.

5. The ion shower stem of claim 1 , wherein the plurality of conductor segments and plurality of capacitors form a resonant circuit at the predetermined frequency.

6. The ion shower system of claim 1 , wherein the antenna, drive circuit comprises an oscillator circuit.

7. The ion shower system of claim 1 , wherein the plurality of conductor segments and capacitors are arranged within the chamber in an azimuthally symmetric fashion, wherein a non-uniform capacitive electrostatic field component along each conductor segment is repeated in an azimuthally symmetric fashion.

8. The ion shower system of claim 1 , wherein the extraction assembly is associated with a top portion of the chamber; and is operable to extract ions vertically from the top portion thereof.

9. The ion shower system of claim 8 , further comprising a workpiece support structure associated with the top portion of the chamber, and operable to secure the workpiece having an implantation surface orientated facing downward toward the extraction assembly for implantation thereof.

10. The ion shower system of claim 1 , wherein the chamber further comprises a bottom portion and side portions, and wherein the side portions comprise a plurality of multi-cusp magnet devices operable to produce multi-cusp magnetic fields thereat to facilitate an azimuthal uniformity of plasma within the chamber.

11. The ion shower system of claim 10 , wherein the multi-cusp magnet devices comprise electromagnets operable to provide a variation in multi-cusp magnetic field strength at differing positions along the side portions.

12. The ion shower system of claim 11 , wherein the electromagnets are independently controllable, thereby facilitating a tuning of the multi-cusp magnetic fields.

Assignments (6)
RELEASE OF SECURITY INTEREST Recorded Apr 7, 2023
From: SILICON VALLEY BANK A DIVISION OF FIRST-CITIZENS BANK & TRUST COMPANY
To: AXCELIS TECHNOLOGIES, INC.
Reel/Frame 063270/0277 →
SECURITY INTEREST Recorded Jul 31, 2020
From: AXCELIS TECHNOLOGIES, INC.
To: SILICON VALLEY BANK, AS ADMINISTRATIVE AGENT
Reel/Frame 053375/0055 →
FIRST AMENDMENT TO SECURITY AGREEMENT Recorded May 10, 2011
From: AXCELIS TECHNOLOGIES, INC.
To: SILICON VALLEY BANK
Reel/Frame 026250/0524 →
CONSENT AND LICENSE AGREEMENT Recorded Apr 17, 2009
From: AXCELIS TECHNOLOGIES, INC.
To: SEN CORPORATION
Reel/Frame 022562/0758 →
SECURITY AGREEMENT Recorded May 9, 2008
From: AXCELIS TECHNOLOGIES, INC.
To: SILICON VALLEY BANK
Reel/Frame 020986/0143 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 6, 2003
From: DIVERGILIO, WILLIAM F.; BENVENISTE, VICTOR M.; KELLERMAN, PETER L.
To: AXCELIS TECHNOLOGIES, INC.
Reel/Frame 014679/0357 →