Sense amplifier for low voltage high speed sensing
View Patent ↗A memory system includes a sense amplifier for detecting content of data memory cells by comparison with a voltage stored in a reference cell. The sense amplifier may comprise a comparator, first and second load circuits, and a low impedance circuit. A first input of the comparator is coupled to the low impedance circuit and a reference voltage node. A second input of the comparator is coupled to a data voltage node. The first load circuit loads a reference cell coupled to the reference voltage node. The second load circuit loads a data cell coupled to the data voltage node.
1. A sense amplifier comprising:
a comparator including a first input coupled to a floating voltage node, and including a second input directly connected to a node having a current output, the current output equal to the difference between a reference current and a data current;
a fixed bias circuit for setting a fixed bias to the first input; and
an impedance circuit coupled to the comparator, wherein the impedance circuit is configured to selectively apply a voltage to an input of the comparator;
wherein the impedance circuit includes resistors and an NMOS transistor, and wherein the impedance circuit is configured as a resistor divider and is buffered by the NMOS transistor.
2. The sense amplifier of claim 1 wherein the fixed bias is selectively applied by the fixed bias circuit.
3. The sense amplifier of claim 2 wherein the fixed bias circuit includes a resistor divider.
4. The sense amplifier of claim 1 , further comprising a capacitor coupled to the comparator to hold a reference voltage level of the comparator during sensing.
5. The sense amplifier of claim 4 , wherein the capacitor is a floating capacitor coupled to an input of the comparator.
6. The sense amplifier of claim 1 , further comprising one or more filter components configured to generate a filtered bias voltage for use by the sense amplifier.
7. The sense amplifier of claim 1 , wherein the NMOS transistor includes a gate filtered by a filter network comprising a resistor and a capacitor.
8. The sense amplifier of claim 1 , wherein the resistor divider is configured to be trimmable to compensate for one or both of channel length modulation offset or margin checking.
9. The sense amplifier of claim 1 , further comprising a diode connected PMOS transistor configured to provide a variable load to adjust a comparator voltage level.
10. The sense amplifier of claim 1 , further comprising an operational amplifier configured for providing feedback loop control of the sense amplifier.
11. The sense amplifier of claim 10 , further comprising a divider circuit including a resistor, wherein one terminal of the operational amplifier is coupled to the divider circuit.
12. The sense amplifier of claim 1 , further comprising a PMOS transistor associated with the current output node.
13. The sense amplifier of claim 12 , further comprising an operational amplifier configured for providing feedback loop control to provide bias for the PMOS transistor.
14. The sense amplifier of claim 13 , further comprising a divider circuit including a resistor, wherein one terminal of the operational amplifier is coupled to the divider circuit.
15. The sense amplifier of claim 1 , further comprising a limiting circuit including a weak diode, wherein the limiting circuit is configured to provide a small load to the current output node to clamp swing of the node.
16. The sense amplifier of claim 1 , wherein the resistor divider circuit includes components configured to transition from a high impedance state to a low impedance state for a period of sensing.
17. The sense amplifier of claim 1 wherein the fixed bias circuit includes a resistor divider.
18. A sense amplifier comprising:
a comparator including a first input coupled to a floating voltage node, and including a second input directly connected to a node having a current output, the current output equal to the difference between a reference current and a data current; and
a fixed bias circuit for setting a fixed bias to the first input;
wherein the fixed bias circuit includes an NMOS transistor, and wherein the fixed bias circuit is coupled to and buffers the floating voltage node.
19. The sense amplifier of claim 18 , wherein the fixed bias circuit further includes a diode-connected PMOS transistor, wherein the NMOS transistor is an NZMOS transistor, and wherein a gate of the NZMOS transistor is connected to an output of the diode connected PMOS transistor so as to pull up comparator output to increase response time.
20. The sense amplifier of claim 18 wherein the fixed bias circuit includes a resistor divider.
21. The sense amplifier of claim 18 wherein the fixed bias is selectively applied by the fixed bias circuit.
22. The sense amplifier of claim 21 wherein the fixed bias circuit includes a resistor divider.
23. The sense amplifier of claim 18 , further comprising a capacitor coupled to the comparator to hold a reference voltage level of the comparator during sensing.
24. The sense amplifier of claim 23 , wherein the capacitor is a floating capacitor coupled to an input of the comparator.
25. The sense amplifier of claim 18 , further comprising an impedance circuit coupled to the comparator, wherein the impedance circuit is configured to selectively apply a voltage to an input of the comparator.
26. The sense amplifier of claim of claim 18 , wherein the impedance circuit includes resistors and an NMOS transistor, and wherein the impedance circuit is configured as a resistor divider and is buffered by the NMOS transistor.
27. The sense amplifier of claim 26 , wherein the resistor divider is configured to be trimmable to compensate for one or both of channel length modulation offset or margin checking.
28. The sense amplifier of claim 18 , further comprising an impedance circuit including a first divider circuit, wherein the first divider circuit includes components configured to transition from a high impedance state to a low impedance state for a period of sensing.
29. A sense amplifier comprising:
a comparator including a first input coupled to a floating voltage node, and including a second input directly connected to a node having a current output, the current output equal to the difference between a reference current and a data current; and
a fixed bias circuit for setting a fixed bias to the first input;
wherein the fixed bias circuit is attached to the floating voltage node via a switch.
30. The sense amplifier of claim 29 , wherein the floating voltage node is configured to hold a bias on a parasitic capacitance when the switch is in an open position.
31. The sense amplifier of claim 29 , further comprising a capacitor coupled to the floating voltage node.
32. The sense amplifier of claim 31 , wherein the capacitor is a variable capacitor.
33. The sense amplifier of claim 31 , wherein the switch, when closed, electrically couples the fixed bias circuit to the capacitor, and wherein the switch, when open, electrically isolates the capacitor and the first input from the fixed bias circuit.
34. The sense amplifier of claim 29 , wherein the switch, when closed, electrically couples the fixed bias circuit to the floating voltage node, and wherein the switch, when open, electrically isolates the floating voltage node from the fixed bias circuit to hold the first input at the fixed bias.
35. The sense amplifier of claim 29 wherein the fixed bias is selectively applied by the fixed bias circuit.
36. The sense amplifier of claim 35 wherein the fixed bias circuit includes a resistor divider.
37. The sense amplifier of claim 29 , further comprising a capacitor coupled to the comparator to hold a reference voltage level of the comparator during sensing.
38. The sense amplifier of claim 37 , wherein the capacitor is a floating capacitor coupled to an input of the comparator.
39. The sense amplifier of claim 29 , further comprising an impedance circuit coupled to the comparator, wherein the impedance circuit is configured to selectively apply a voltage to an input of the comparator.
40. The sense amplifier of claim 29 , wherein the impedance circuit includes resistors and an NMOS transistor, and wherein the impedance circuit is configured as a resistor divider and is buffered by the NMOS transistor.
41. The sense amplifier of claim 29 , further comprising a resistor divider configured to be trimmable to compensate for one or both of channel length modulation offset or margin checking.
42. The sense amplifier of claim 29 , further comprising a diode connected PMOS transistor configured to provide a variable load to adjust a comparator voltage level.
43. The sense amplifier of claim 29 , further comprising an operational amplifier configured for providing feedback loop control of the sense amplifier.
44. The sense amplifier of claim 29 , further comprising a divider circuit, wherein one terminal of the operational amplifier is coupled to the divider circuit.
45. The sense amplifier of claim 29 , further comprising a PMOS transistor associated with the current output node.
46. The sense amplifier of claim 45 , further comprising an operational amplifier configured for providing feedback loop control to provide bias for the PMOS transistor.
47. The sense amplifier of claim 46 , further comprising a divider circuit, wherein one terminal of the operational amplifier is coupled to the divider circuit.
48. The sense amplifier of claim 29 , further comprising a limiting circuit including a weak diode, wherein the limiting circuit is configured to provide a small load to the current output node to clamp swing of the node.
49. The sense amplifier of claim 29 , wherein the fixed bias circuit includes an NMOS transistor, and wherein the fixed bias circuit is coupled to and buffers the floating voltage node.
50. The sense amplifier of claim 29 , further comprising an impedance circuit including a first divider circuit, wherein the first divider circuit includes components configured to transition from a high impedance state to a low impedance state for a period of sensing.