Homoepitaxial gallium nitride based photodetector and method of producing
View Patent ↗A photodetector ( 100, 200, 300 ) comprising a gallium nitride substrate, at least one active layer ( 104, 302 ) disposed on the substrate ( 102, 202, 306 ), and a conductive contact structure ( 106, 210, 308 ) affixed to the active layer ( 104, 302 ) and, in some embodiments, the substrate ( 102, 202, 306 ). The invention includes photodetectors ( 100, 200, 300 ) having metal-semiconductor-metal structures, P-i-N structures, and Schottky-barrier structures. The active layers ( 104, 302 ) may comprise Ga 1-x-y Al x In y N 1-z-w P z As w , or, preferably, Ga 1-x Al x N. The gallium nitride substrate comprises a single crystal gallium nitride wafer and has a dislocation density of less than about 10 5 cm −2 . A method of making the photodetector ( 100, 200, 300 ) is also disclosed.
1. A gallium nitride substrate for a photodectector, said gallium nitride substrate comprising a homoepitaxially grown single crystal gallium nitride wafer and having a dislocation density of less than about 10 5 cm 2 , wherein said gallium nitride substrate has a dislocation density of less than about 10 3 cm −2 .
2. The gallium nitride substrate of claim 1 , wherein said gallium nitride substrate has a resistivity of at least about 10 5 Ω-cm.
3. The gallium nitride substrate of claim 1 , wherein said gallium nitride substrate has a resistivity of less than about 10 Ω-cm.
4. The gallium nitride substrate of claim 1 , wherein said gallium nitride wafer has a diameter of between about 3 mm and about 150 mm.
5. The gallium nitride substrate of claim 4 , wherein said gallium nitride wafer has a diameter of between about 12 mm and about 150 mm.
6. The gallium nitride substrate of claim 5 , wherein said gallium nitride wafer has a diameter of between about 20 mm and about 150 mm.
7. The gallium nitride substrate of claim 1 , wherein said gallium nitride wafer has a (0001) crystallographic orientation.
8. A gallium nitride substrate for a photodetector, said gallium nitride substrate comprising a homoepitaxially grown single crystal gallium nitride water and having a dislocation density of less than about 10 5 cm 2 , wherein said gallium nitride wafer is a gallium nitride wafer cut from a boule that was grown using a supercritical solvent at a temperature greater than about 550° C. and a pressure greater than about 5 kbar.
9. A gallium nitride substrate for a photodetector, said gallium nitride substrate comprising a homoepitaxially grown single crystal gallium nitride wafer having a dislocation density of less than about 10 3 cm −2 cut from a portion of a boule grown by precipitating gallium nitride onto at least one of a gallium nitride crystal, a gallium nitride boule, and a gallium nitride crystal seed using a supercritical solvent at a temperature greater than about 550° C. and a pressure greater than about 5 kbar.
10. A gallium nitride substrate for a photodetector, said gallium nitride substrate comprising a homoepitaxially grown single crystal gallium nitride wafer having a dislocation density of less than about 10 5 cm −2 cut from a portion of a boule grown by precipitating gallium nitride onto at least one of a gallium nitride crystal, a gallium nitride boule, and a gallium nitride crystal seed using a supercritical solvent at a temperature greater than about 550° C. and a pressure greater than about 5 kbar.
11. A photodetector, comprising: the gallium nitride substrate as defined in claim 2 , wherein
at least one active layer is disposed on the gallium nitride substrate, and the at least one active layer comprising Ga 1-x-y Al x In y N 1-z-w P 2 As w ; wherein 0 less than or equal to x, y, z, w less than or equal to 1, 0 less than or equal to x+y less than or equal to 1; and 0 less than or equal to z+w less than or equal to 1; and
at least one conductive contact structure is secured to the gallium nitride substrate and to the at least one active layer.
12. The photodetector as defined in claim 11 , wherein the gallium nitride substrate Is a wafer and has a (0001) crystallographic orientation.
13. The photodetector as defined in claim 11 , wherein the gallium nitride substrate is a wafer and has a diameter in a range of from about 3 mm to about 150 mm.
14. The photodetector as defined in claim 11 , wherein the photodetector defines a P-I-N structure.
15. The photodetector as defined in claim 14 , wherein the photodetector comprises an n-doped substrate, and further comprising an insulating layer disposed on a surface of the n-doped substrate.
16. The photodetector as defined in claim 15 , further comprising a p-doped substrate disposed on a surface of the insulating layer opposite the n-doped layer.
17. The photodetector as defined in claim 16 , wherein the insulating layer or the p-doped layer each have a nominal thickness in a range of from about 1 nanometer to about 10 micrometers.