IP Library Granted Patent US 7,204,920
Granted Patent B2
US 7,204,920 · App. 10/973,851 · Granted Apr 17, 2007

Contact ring design for reducing bubble and electrolyte effects during electrochemical plating in manufacturing

Assignee: LSI Logic Corporation
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Quick Facts
Patent No.
US 7,204,920
App. No.
10/973,851
Granted
Apr 17, 2007
Kind
B2
Abstract

A contact ring for use in electroplating of a substrate material is constructed such that fluid (e.g., electrolyte) is allowed to flow radially away from the axis of a toroidal support ring, thus preventing the trapping of fluids between the substrate and the toroidal support ring. The contact ring is constructed with a series of openings arranged about the circumference of the ring and wherein an electrical contact is placed in the path of each opening so any fluid passing through the opening also passes around the associated electrical contact. Further, the electrical contacts are also placed such that a substrate (e.g., a semiconductor wafer) can be placed inside the support ring so as to electrically contact the electrical contacts. The toroidal support ring has an aerodynamically streamlined cross-section at the openings, such that fluid flows through the openings with reduced aerodynamic drag.

Claims (34)

1. A contact ring for use in electroplating of semiconductor substrates, comprising:

a toroidal support ring configured to allow fluid to flow radially away from the axis of the toroidal support ring and to prevent the trapping of fluids between the substrate and the toroidal support ring; and

a plurality of electrodes arranged to support and electrically contact a substrate, which has been placed over the electrodes.

2. The contact ring of claim 1 , wherein the toroidal support ring further comprises a plurality of aerodynamically streamlined flow surfaces.

3. The contact ring of claim 2 , wherein the toroidal support ring further includes a plurality of openings formed in the toroidal support ring adjacent to the electrodes wherein the plurality of openings are configured to facilitate flow of bubbles and fluid away from the substrate and support ring through the openings.

4. The contact ring of claim 2 , wherein each of the plurality of electrodes is located on an aerodynamically streamlined flow surface.

5. The contact ring of claim 2 , wherein each of the plurality of electrodes is placed on an aerodynamically streamlined flow surface such that fluid may flow along the aerodynamically streamlined surface and around each electrode.

6. The contact ring of claim 2 , wherein the cross-section of at least one of the aerodynamically streamlined flow surfaces in each opening is shaped like a wing.

7. The contact ring of claim 2 , wherein the cross-section of at least one of the aerodynamically streamlined flow surfaces is elliptical.

8. The contact ring of claim 1 , wherein the toroidal support ring further includes a plurality of openings formed in the toroidal support ring adjacent to the electrodes wherein the plurality of openings are configured to facilitate flow of bubbles and fluid away from the substrate and support ring through the openings.

9. The contact ring of claim 1 , wherein the cross-section of each of the plurality of electrodes is elliptical.

10. A toroidal contact ring for use in electroplating of semiconductor wafers, comprising:

a contact ring base with sloped sides, configured to facilitate fluid flow over the ring base;

a support ring formed on and attached to the contact ring base;

a plurality of openings arranged along the circumference of the support ring, wherein each opening is configured to permit fluids to flow through the support ring radially from the inner edge of the ring to the outer edge of the ring and wherein each opening is shaped to reduce turbulence in fluids passing through the opening; and

a plurality of electrodes arranged to support and electrically contact a substrate, which has been placed over the top of the support ring, wherein each electrode is placed in a fluid flow path of an opening.

11. The toroidal contact ring of claim 10 wherein the toroidal contact ring is configured to allow fluid flow radially away from the axis of the contact ring.

12. The toroidal contact ring of claim 10 wherein the toroidal contact ring is configured to aid gravity to drain a fluid from the surface of the contact ring.

13. The toroidal contact ring of claim 10 , wherein each of the plurality of openings further comprises at least one aerodynamically streamlined flow surface.

14. The toroidal contact ring of claim 10 , wherein the contact ring base comprises at least one aerodynamically streamlined flow surface.

15. The toroidal contact ring of claim 10 , wherein each electrode is placed on an aerodynamically shaped flow surface such that fluid may flow along the aerodynamically streamlined surface and around each electrode.

16. The toroidal contact ring of claim 10 , wherein the cross-section of each electrode is semi-circular.

17. The toroidal contact ring of claim 10 , wherein each electrode is placed so as to minimize the trapping of fluids between the substrate and the toroidal contact ring.

18. A method of electroplating a substrate, comprising:

affixing a substrate to a toroidal contact ring which is connected to a support arm and a power supply, wherein the substrate is electrically as well as physically connected to the contact ring, and wherein where the contact ring comprises a plurality of openings arranged along the circumference of the support ring, wherein each opening is configured to permit fluids to flow through the support ring radially from the inner edge of the ring to the outer edge of the ring and wherein each opening is shaped to reduce turbulence in fluids passing through the opening to facilitate fluid flow through the ring;

immersing the contact ring into an electrolyte;

supplying a voltage to the substrate so as to allow an electroplating reaction to proceed;

rotating the immersed substrate at between about 10 to 200 RPM during electroplating;

removing the substrate from the electrolyte; and

cleaning the substrate and contact ring by removing excess electrolyte from the rotating the immersed substrate at 100–1000 RPM for no more than 10 seconds.

19. The method of claim 18 , wherein immersing the contact ring into an electrolyte comprises immersing the contact ring at an entry angle relative to the surface of the electrolyte of between about 2–30°.

20. The method of claim 19 , wherein the entry angle is between about 10–20°.

21. The method of claim 18 , wherein the rotation speed during immersion is 20–80 RPM.

22. The method of claim 18 , wherein the rotation speed during cleaning is 400–600 RPM.

Assignments (10)
SECURITY INTEREST Recorded Apr 15, 2022
From: CORTLAND CAPITAL MARKET SERVICES LLC
To: HILCO PATENT ACQUISITION 56, LLC; BELL SEMICONDUCTOR, LLC; BELL NORTHERN RESEARCH, LLC
Reel/Frame 060885/0001 →
SECURITY INTEREST Recorded Feb 1, 2018
From: HILCO PATENT ACQUISITION 56, LLC; BELL SEMICONDUCTOR, LLC; BELL NORTHERN RESEARCH, LLC
To: CORTLAND CAPITAL MARKET SERVICES LLC, AS COLLATERAL AGENT
Reel/Frame 045216/0020 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 17, 2017
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.; BROADCOM CORPORATION
To: BELL SEMICONDUCTOR, LLC
Reel/Frame 044886/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENTS Recorded Feb 3, 2017
From: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 041710/0001 →
PATENT SECURITY AGREEMENT Recorded Feb 11, 2016
From: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
To: BANK OF AMERICA, N.A., AS COLLATERAL AGENT
Reel/Frame 037808/0001 →
TERMINATION AND RELEASE OF SECURITY INTEREST IN PATENT RIGHTS (RELEASES RF 032856-0031) Recorded Feb 2, 2016
From: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
To: LSI CORPORATION; AGERE SYSTEMS LLC
Reel/Frame 037684/0039 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 3, 2015
From: LSI CORPORATION
To: AVAGO TECHNOLOGIES GENERAL IP (SINGAPORE) PTE. LTD.
Reel/Frame 035390/0388 →
CHANGE OF NAME Recorded Jun 6, 2014
From: LSI LOGIC CORPORATION
To: LSI CORPORATION
Reel/Frame 033102/0270 →
PATENT SECURITY AGREEMENT Recorded May 8, 2014
From: LSI CORPORATION; AGERE SYSTEMS LLC
To: DEUTSCHE BANK AG NEW YORK BRANCH, AS COLLATERAL AGENT
Reel/Frame 032856/0031 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 25, 2004
From: KWAK, BYUNG-SUNG LEO; PIATT, GREGORY FRANK; MIZUNO, HIROSHI
To: LSI LOGIC CORPORATION
Reel/Frame 015933/0562 →
Continuity (1)
Related Publication 20060086608A1 · Apr 27, 2006