Write-once nonvolatile phase change memory array
View Patent ↗The invention provides for a write-once nonvolatile memory array, the memory cells comprising a phase change material, such as a chalcogenide. Phase change is achieved in chalcogenide memories by thermal means. The initial, unprogrammed state of each memory cell is a crystalline, low-resistance state, while the programmed state is an amorphous, high-resistance state. Optimizing the circuitry for a write-only memory array, the wordlines or bitlines can be long, with at least 256 cells on a wordline or bitline, and in some embodiments, having thousands of cells on a wordline or bitline. In a preferred embodiment, such an array can be a monolithic three dimensional memory array comprising stacked memory levels.
1. A phase change memory device, comprising:
one or more phase change memory cells, the individual phase change memory cells comprising a chalcogenide material; and
a programming circuit coupled to said one or more phase change memory cells, wherein during normal operation, said programming circuit allows execution of only crystalline-to-amorphous conversions to occur in said one or more phase change memory cells.
2. The phase change memory device of claim 1 , wherein said one or more phase change memory cells further comprise a plurality of phase change memory cells.
3. The phase change memory device of claim 2 , wherein the individual phase change memory cells further comprise a diode in series with said chalcogenide material.
4. The phase change memory device of claim 3 , wherein said chalcogenide material is a GST material.
5. The phase change memory device of claim 4 , wherein the GST material is Ge 2 Sb 2 Te 5 .
6. The phase change memory device of claim 3 , wherein the individual phase change memory cells are disposed between a first conductor and a second conductor.
7. The phase change memory device of claim 6 , wherein said first conductor is formed above a substrate and said second conductor is formed above said first conductor.
8. The phase change memory device of claim 7 , wherein said first conductor extends in a first direction and said second conductor extends in a second direction, the second direction substantially perpendicular to the first direction.
9. The phase change memory device of claim 8 , wherein said diode is a p-i-n diode.
10. The phase change memory device of claim 9 , wherein said diode resides in a vertically oriented pillar.
11. The phase change memory device of claim 8 , wherein said first conductor comprises a refractory metal or a refractory metal compound.
12. The phase change memory device of claim 11 , wherein the refractory metal or refractory metal compound is tungsten or titanium tungsten.
13. A monolithic integrated circuit, comprising:
a first layer and a second layer of phase change memory cells, the individual phase change memory cells comprising a chalcogenide material in series with a diode, said second layer disposed above said first layer; and
an operational circuit located on the monolithic integrated circuit coupled to said first layer, wherein during the operational lifetime of the monolithic integrated circuit said operational circuit allows only crystalline-to-amorphous conversion of said first layer phase change memory cells.
14. The monolithic integrated circuit of claim 13 , wherein said first layer of phase change memory cells is factory-set into the crystalline state.
15. The monolithic integrated circuit of claim 13 , wherein said chalcogenide material is a GST material.
16. The monolithic integrated circuit of claim 15 , wherein the GST material is Ge 2 Sb 2 Te 5 .
17. The monolithic integrated circuit of claim 16 , wherein said diode is a p-i-n diode.
18. The monolithic integrated circuit of claim 17 , wherein said diode resides in a vertically oriented pillar.
19. The monolithic integrated circuit of claim 13 , further comprising a third layer and a fourth layer of phase change memory cells, said third layer disposed above said second layer, said fourth layer disposed above said third layer.
20. The monolithic integrated circuit of claim 19 , wherein the first layer, second layer, and third layer of phase change memory cells individually comprise a plurality of top conductors and a plurality of bottom conductors, said plurality of top conductors disposed above said plurality of bottom conductors.
21. The monolithic integrated circuit of claim 20 , wherein said plurality of top conductors of said first layer also form said plurality of bottom conductors of said second layer, and said plurality of top conductors of said second layer also form said plurality of bottom conductors of said third layer.
22. The monolithic integrated circuit of claim 21 , wherein a programmed state of the individual phase change memory cells is a high resistance state, the chalcogenide material in a programmed state is in an amorphous state, and the chalcogenide material in an unprogrammed state is in a crystalline state.
23. The monolithic integrated circuit of claim 20 , wherein said plurality of top conductors of said first layer are separate from said plurality of bottom conductors of said second layer.
24. The monolithic integrated circuit of claim 23 , wherein a programmed state of the individual phase change memory cells is a high resistance state, the chalcogenide material in a programmed state is in an amorphous state, and the chalcogenide material in an unprogrammed state is in a crystalline state.
25. The monolithic integrated circuit of claim 20 , wherein said plurality of top conductors of said first layer also form said plurality of bottom conductors of said second layer, and said plurality of top conductors of said second layer are separate from said plurality of bottom conductors of said third layer.
26. The monolithic integrated circuit of claim 25 , wherein a programmed state of the individual phase change memory cells is a high resistance state, the chalcogenide material in a programmed state is in an amorphous state, and the chalcogenide material in an unprogrammed state is in a crystalline state.