SYSTEM TO OPTIMIZE A SEMICONDUCTOR PROBE CARD
A novel information system for optimizing a phase in the lifespan of a probe card for semiconductor wafer testing, by receiving, storing, and disseminating probe card data over a network between the probe card customer and supplier. The system optimizes the ordering of a probe card by a customer, the manufacture of the probe card by a supplier, and the performance and repair of the probe card during its lifespan. The information system includes at least one server that is coupled to a network, where the server receives, stores, and disseminates historical information gathered during the order, manufacture, performance, and repair phases of many probe cards. An application on the server receives current information from a probe card customer or supplier, calculates a variety of metrics based on this information, compares the metric to historical data already stored in the system, and communicates the results of the comparison and the historical data to a system user. Other advantageous features include probe cards equipped with attached data storage devices, such as radio frequency identification (RFID) tags, allowing the customer and supplier to store and easily access current order, manufacture, performance, and repair information on a particular probe card. The system may also automatically receive current information, calculate metrics, compare the metrics to historical data, and communicate the results of the comparison and the historical data to the customer or supplier using the system.
1 . An information system for optimizing a phase in the lifespan of a probe card comprising:
at least one server coupled to a network wherein the server receives, stores and
disseminates historical data relating to said phase from a plurality of probe cards;
an application operable with said server to provide functions comprising:
(a) receiving over said network from a probe card customer and supplier current information relating to said phase in the life of a probe card;
(b) calculating a metric based on the information provided by the customer and supplier;
(c) comparing the metric against the historical data; and
(d) communicating the results of the comparison in step (c) and the historical data to a user.
2 . The system of claim 1 wherein the optimized phase is the phase during which a probe card is ordered by a customer from a supplier.
3 . The system of claim 2 wherein the current information is selected from a group consisting of: quantity, delivery schedule, price, client order backlog, parts supplier data, probe card sophistication and combinations thereof.
4 . The system of claim 2 wherein the historical data is selected from a group consisting of: quantity, phased and non-phased delivery schedule, price, probe card sophistication, initial defects, usage defects, expected touchdowns, repair time, under and over purchasing, client change order frequency, client credit worthiness, client relationship and combinations thereof.
5 . The system of claim 2 wherein the metric is selected from a group consisting of: time between probe card orders, predicted probe card lifespan, predicted initial defect rate, predicted usage defect rate, average schedule delay, predicted phased delivery success rate, schedule change frequency and combinations thereof.
6 . The system of claim 1 wherein the optimized phase is the phase during which a probe card is manufactured by a supplier.
7 . The system of claim 6 wherein the current information is selected from a group consisting of: design documentation, manufacturing status reports, tolerances specified by the customer, testing results, redesign results, repair reports and combinations thereof.
8 . The system of claim 6 wherein the historical data is selected from a group consisting of: effectiveness of probe card layouts, effectiveness of probe card structures, acceptable probe card tolerances and combinations thereof.
9 . The system of claim 6 wherein the metric is selected from a group consisting of: predicted manufacturing time, predicted testing time, design defect failure rate for this probe card structure, design defect failure rate for this probe layout and combinations thereof.
10 . The system of claim 1 wherein the optimized phase is the phase during which a probe card performs tests on a customer's semiconductor wafers.
11 . The system of claim 10 wherein the current information is selected from a group consisting of: operational, inspection, and repair data, including planarity, alignment, contact resistance, leakage, probe tip diameter, number of touchdowns per probe card, failures per probe card, excess overdrive, scrub length, broken probe rate and combinations thereof.
12 . The system of claim 10 wherein the historical data is selected from a group consisting of: operational, inspection, and repair data, including planarity, alignment, contact resistance, leakage, probe tip diameter, number of touchdowns per probe card, failures per probe card, excess overdrive, scrub length, broken probe rate and combinations thereof.
13 . The system of claim 10 wherein the metric is selected from a group consisting of: time between probe card failures, predicted probe card failure per wafer, failures per touchdown per probe card, monthly touchdowns, predicted probe card alignment error, radial error per number of probes per number of touchdowns and combinations thereof.
14 . The system of claim 1 wherein the optimized phase is the phase during which a probe card is repaired by a supplier.
15 . The system of claim 14 wherein the current information is selected from a group consisting of: inspection, repair, and replacement probe card manufacture data, including engineer conducting repair, time to repair, time to manufacture replacement probe card, estimated delivery date and combinations thereof.
16 . The system of claim 14 wherein the historical data is selected from a group consisting of: client order backlog, parts supplier data, probe card sophistication, operating efficiency of customer remaining probe cards and combinations thereof.
17 . The system of claim 14 wherein the metric is selected from a group consisting of: average repair time per probe card, predicted time to repair probe card of this type, probability replacement is required if probe card is damaged and combinations thereof.
18 . The system of claim 1 wherein the probe card customer and supplier store the current information on a storage device that is affixed to the probe card.
19 . The probe card of claim 18 wherein the storage device comprises an RFID tag.
20 . The system of claim 1 wherein the receiving, calculating, comparing, and communicating functions of said application are automated.