IP Library Granted Patent US 8,709,934
Granted Patent B2
US 8,709,934 · App. 11/758,635 · Granted Apr 29, 2014

Electronic system with vertical intermetallic compound

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Quick Facts
Patent No.
US 8,709,934
App. No.
11/758,635
Granted
Apr 29, 2014
Kind
B2
Abstract

An electronic system is provided including forming a substrate having a contact, forming a conductive structure over the contact, mounting an electrical device having an external interconnect over the conductive structure, and forming a conductive protrusion from the conductive structure in the external interconnect.

Claims (27)

1. A method of manufacture of an electronic system comprising:

forming a substrate having a contact;

forming a conductive structure over and directly in contact with the contact;

mounting an electrical device having an external interconnect over the conductive structure; and

forming a conductive protrusion from the conductive structure in the external interconnect, wherein forming the conductive protrusion includes:

forming a conductive core over the contact, and

forming a transition cover of an intermetallic compound around the conductive core, the transition cover having a sidewall portion around the conductive core and contacting the contact, the sidewall portion extending vertically along the sides of the conductive core, wherein the transition cover includes a cap portion integral with the sidewall portion, and wherein the cap portion includes a convex top surface and a planar bottom surface.

2. The method as claimed in claim 1 wherein forming the conductive structure includes:

forming a column portion over the contact;

forming a convex portion connected to the column portion; and

forming a cap over the convex portion.

3. The method as claimed in claim 1 wherein:

forming the conductive core over the contact includes forming copper, nickel, platinum, palladium, or a combination thereof over the contact; and

mounting the electrical device having the external interconnect over the conductive structure includes mounting the electrical device having solder over the conductive structure.

4. The method as claimed in claim 1 wherein forming the conductive protrusion includes reflowing the external interconnect and the conductive structure.

5. A method of manufacture of an electronic system comprising:

forming a substrate having a contact;

forming a conductive structure including copper or nickel over and directly in contact with the contact;

mounting an electrical device having an external interconnect including solder over the conductive structure; and

forming a conductive protrusion from the conductive structure in the external interconnect, wherein forming the conductive protrusion includes:

forming a conductive core over the contact, and

forming a transition cover of an intermetallic compound around the conductive core, the transition cover having a sidewall portion around the conductive core and contacting the contact, the sidewall portion extending vertically along the sides of the conductive core, wherein the transition cover includes a cap portion integral with the sidewall portion, and wherein the cap portion includes a convex top surface and a planar bottom surface.

6. The method as claimed in claim 5 wherein forming the conductive structure includes forming a cap including solder.

7. The method as claimed in claim 5 wherein:

forming the conductive core over the contact includes forming copper or nickel over the contact.

8. The method as claimed in claim 5 wherein forming the conductive protrusion from the conductive structure in the external interconnect includes attaching the electrical device and the substrate.

9. The method as claimed in claim 5 wherein mounting the electrical device includes mounting an integrated circuit device.

Assignments (6)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 3, 2025
From: STATS CHIPPAC PTE. LTD.
To: STATS CHIPPAC MANAGEMENT PTE. LTD.
Reel/Frame 072788/0917 →
CORRECTIVE ASSIGNMENT TO CORRECT THE CORRECT THE SPELLING OF ASSIGNEE'S NAME FROM "STATS CHIPPAC PTE. LTE." TO "STATS CHIPPAC PTE. LTD." PREVIOUSLY RECORDED AT REEL: 038378 FRAME: 0227. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Sep 1, 2023
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTD.
Reel/Frame 064803/0368 →
RELEASE OF SECURITY INTEREST Recorded Jun 4, 2020
From: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
To: STATS CHIPPAC, INC.; STATS CHIPPAC PTE. LTD. FORMERLY KNOWN AS STATS CHIPPAC LTD.
Reel/Frame 052844/0491 →
CHANGE OF NAME Recorded Apr 7, 2016
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 038378/0227 →
SECURITY INTEREST Recorded Aug 6, 2015
From: STATS CHIPPAC, INC.; STATS CHIPPAC LTD.
To: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
Reel/Frame 036288/0748 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 7, 2007
From: KIM, BAEYONG; CHOI, BONGSUK; KIM, OH HAN
To: STATS CHIPPAC LTD.
Reel/Frame 019392/0553 →