IP Library Granted Patent US 7,922,926
Granted Patent B2
US 7,922,926 · App. 11/970,978 · Granted Apr 12, 2011

Composition and method for polishing nickel-phosphorous-coated aluminum hard disks

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Quick Facts
Patent No.
US 7,922,926
App. No.
11/970,978
Granted
Apr 12, 2011
Kind
B2
Abstract

The invention provides a chemical-mechanical polishing composition consisting essentially of flumed alumina, alpha alumina, silica, a nonionic surfactant, an additive compound selected from the group consisting of glycine, alanine, iminodiacetic acid, and maleic acid, hydrogen peroxide, and water. The invention further provides a method of chemically-mechanically polishing a substrate comprising contacting a substrate with a polishing pad and the chemical-mechanical polishing composition, moving the polishing pad and the polishing composition relative to the substrate, and abrading at least a portion of the substrate to polish the substrate.

Claims (49)

1. A chemical-mechanical polishing composition consisting essentially of:

(a) about 0.2 to about 1 wt. % of fumed alumina,

(b) about 0.1 to about 1 wt. % of alpha alumina,

(c) about 0.1 to about 4 wt. % of silica,

(d) about 10 to about 1000 ppm of a nonionic surfactant,

(e) at least 0.8 wt. % to about 1.5 wt. % of an additive compound selected from the group consisting of glycine, alanine, iminodiacetic acid, and maleic acid,

(f) hydrogen peroxide,

(g) optionally a biocide, and

(h) water.

2. The polishing composition of claim 1 , wherein the fumed alumina has an average particle size of about 75 to about 125 nm, the alpha alumina has an average particle size of about 250 to about 500 nm, and the silica has an average particle size of about 25 to about 100 nm.

3. The polishing composition of claim 1 , wherein the nonionic surfactant is a copolymer surfactant comprising siloxane units, ethylene oxide units, and propylene oxide units.

4. The polishing composition of claim 1 , wherein the polishing composition comprises about 50 to about 150 ppm of the nonionic surfactant.

5. The polishing composition of claim 1 , wherein the polishing composition comprises about 1 to about 3 wt. % of hydrogen peroxide.

6. The polishing composition of claim 1 , wherein the polishing composition has a pH of about 2 to about 5.

7. The polishing composition of claim 6 , wherein the polishing composition has a pH of about 2 to about 4.

8. A method of chemically-mechanically polishing a substrate comprising:

(i) contacting a substrate with a polishing pad and a chemical-mechanical polishing composition consisting essentially of:

(a) about 0.2 to about 1 wt. % of fumed alumina,

(b) about 0.1 to about 1 wt. % of alpha alumina,

(c) about 0.1 to about 4 wt. % of silica,

(d) about 10 to about 1000 ppm of a nonionic surfactant,

(e) at least 0.8 wt. % to about 1.5 wt. % of an additive compound selected from the group consisting of glycine, alanine, iminodiacetic acid, and maleic acid,

(f) hydrogen peroxide,

(g) optionally a biocide, and

(h) water,

(ii) moving the polishing pad and the polishing composition relative to the substrate, and

(iii) abrading at least a portion of the substrate to polish the substrate.

9. The method of claim 8 , wherein the fumed alumina has an average particle size of about 75 to about 125 nm, the alpha alumina has an average particle size of about 250 to about 500 nm, and the silica has an average particle size of about 25 to about 100 nm.

10. The method of claim 8 , wherein the nonionic surfactant is a copolymer surfactant comprising siloxane units, ethylene oxide units, and propylene oxide units.

11. The method of claim 8 , wherein the polishing composition comprises about 50 to about 150 ppm of the nonionic surfactant.

12. The method of claim 8 , wherein the polishing composition comprises about 1 to about 3 wt. % of hydrogen peroxide.

13. The method of claim 8 , wherein the polishing composition has a pH of about 2 to about 5.

14. The method of claim 13 , wherein the polishing composition has a pH of about 2 to about 4.

15. The method of claim 8 , wherein the substrate comprises nickel-phosphorous-coated aluminum, and at least a portion of the nickel-phosphorous is abraded to polish the substrate.

16. A chemical-mechanical polishing composition consisting essentially of:

(a) about 0.2 to about 1 wt. % of fumed alumina,

(b) about 0.1 to about 1 wt. % of alpha alumina,

(c) about 0.1 to about 4 wt. % of silica,

(d) about 10 to about 1000 ppm of a nonionic surfactant,

(e) at least 0.8 wt. % to about 1.5 wt. % of alanine,

(f) hydrogen peroxide,

(g) optionally a biocide, and

(h) water.

17. The polishing composition of claim 16 , wherein the fumed alumina has an average particle size of about 75 to about 125 nm, the alpha alumina has an average particle size of about 250 to about 500 nm, and the silica has an average particle size of about 25 to about 100 nm.

18. The polishing composition of claim 16 , wherein the nonionic surfactant is a copolymer surfactant comprising siloxane units, ethylene oxide units, and propylene oxide units.

19. The polishing composition of claim 16 , wherein the polishing composition comprises about 50 to about 150 ppm of the nonionic surfactant.

20. The polishing composition of claim 16 , wherein the polishing composition comprises about 1 to about 3 wt. % of hydrogen peroxide.

21. The polishing composition of claim 16 , wherein the polishing composition has a pH of about 2 to about 5.

22. The polishing composition of claim 21 , wherein the polishing composition has a pH of about 2 to about 4.

Assignments (8)
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
SECURITY AGREEMENT Recorded Nov 16, 2018
From: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; MPOWER SPECIALTY CHEMICALS LLC
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 047588/0263 →
RELEASE OF SECURITY INTEREST Recorded Nov 16, 2018
From: BANK OF AMERICA, N.A.
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 047587/0119 →
NOTICE OF SECURITY INTEREST IN PATENTS Recorded Feb 16, 2012
From: CABOT MICROELECTRONICS CORPORATION
To: BANK OF AMERICA, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 027727/0275 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 20, 2008
From: PALANISAMY CHINNATHAMBI, SELVARAJ; YEUNG, PING-HA; REISS, BRIAN
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 020533/0592 →