IP Library Granted Patent US 8,618,653
Granted Patent B2
US 8,618,653 · App. 12/022,296 · Granted Dec 31, 2013

Integrated circuit package system with wafer scale heat slug

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Quick Facts
Patent No.
US 8,618,653
App. No.
12/022,296
Granted
Dec 31, 2013
Kind
B2
Abstract

An integrated circuit package system includes: providing a singulated, layered structure equivalent in size to an integrated circuit die and having an adhesive layer, an electrical insulator layer, and a heat slug; attaching the integrated circuit die to a base; attaching bond wires to a top of the base for electrical connection between the integrated circuit die and the base; attaching the singulated, layered structure to the integrated circuit die wherein the bond wires are surrounded by the adhesive layer; and encapsulating the integrated circuit die and a portion of the heat slug with a molding compound.

Claims (43)

1. An integrated circuit package system comprising:

providing a singulated, layered structure equivalent in size to an integrated circuit die and having an electrical insulator layer between and in direct contact with a heat slug and an adhesive layer, the adhesive layer attached directly on the integrated circuit die;

attaching a base to the integrated circuit die;

attaching the singulated, layered structure to the integrated circuit die wherein the bond wires are surrounded by the adhesive layer; and

encapsulating a portion of the heat slug and the integrated circuit die with a molding compound; and

attaching bond wires to a top of the base for an electrical connection between the integrated circuit die and the base, the bond wires in direct contact with and extending through the adhesive layer and the molding compound.

2. The system as claimed in claim 1 wherein attaching the singulated, layered structure includes surrounding the bond wires with the adhesive layer about to an active surface of the integrated circuit die.

3. The system as claimed in claim 1 wherein attaching the singulated, layered structure includes surrounding the bond wires with the adhesive layer about to the base.

4. The system as claimed in claim 1 wherein attaching the base to the integrated circuit die includes attaching the base to the integrated circuit die using a substrate with solder balls or a die paddle with lead fingers.

5. The system as claimed in claim 1 wherein attaching the singulated, layered structure to the integrated circuit die maintains a clearance between the electrical insulator layer and the bond wires.

6. An integrated circuit package system comprising:

providing an integrated circuit die;

forming a layered structure blank wherein the layered structure blank is a stack of an adhesive layer blank, an electrical insulator layer blank, and a heat slug blank;

dicing the layered structure blank into a singulated, layered structure equivalent in size to the integrated circuit die, the singulated, the layered structure having an electrical insulator layer between and in direct contact with a heat slug and an adhesive layer, the adhesive layer attached directly on the integrated circuit die;

attaching a base and the singulated, layered structure to the integrated circuit die;

partially encapsulating a molding compound around the integrated circuit die and the heat slug;

attaching bond wires to a top of the base for an electrical connection between the integrated circuit die and the base, the bond wires in direct contact with and extending through the adhesive layer and the molding compound, and the bond wires protected from the heat slug by the electrical insulator layer; and

attaching solder balls to a bottom of the base.

7. The system as claimed in claim 6 wherein attaching the singulated, layered structure includes surrounding the bond wires with the adhesive layer to be coplanar with a top of the integrated circuit package.

8. The system as claimed in claim 6 wherein attaching the singulated, layered structure includes surrounding the bond wires with the adhesive layer pressed down over the integrated circuit die to the top of the base.

9. The system as claimed in claim 6 wherein attaching the base to the integrated circuit die includes attaching the base to the integrated circuit die using a ball grid array substrate or a die paddle with lead fingers.

10. The system as claimed in claim 6 wherein:

attaching the singulated, layered structure to the integrated circuit die maintains a clearance between the electrical insulator layer and the bond wires; and

attaching the singulated, layered structure to the integrated circuit die maintains a portion of the adhesive layer clear of the bond wires.

11. An integrated circuit package system comprising:

an integrated circuit die;

a base having the integrated circuit die mounted thereon;

a singulated, layered structure, attached to the integrated circuit die, including an electrical insulator layer between and in direct contact with a heat slug and an adhesive layer, the adhesive layer attached directly on the integrated circuit die;

a molding compound partially encapsulating the integrated circuit die and the heat slug; and

bond wires for an electrical connection between the integrated circuit die and a top of the base, the bond wires in direct contact with and extending through the adhesive layer and the molding compound.

12. The system as claimed in claim 11 wherein the singulated, layered structure surrounds the bond wires with the adhesive layer about to a top of the integrated circuit package.

13. The system as claimed in claim 11 wherein the singulated, layered structure partially covers the bond wires with the adhesive layer pressed down over the integrated circuit die to about to the top of the base.

14. The system as claimed in claim 11 wherein the base is a substrate with solder balls or a die paddle with lead fingers.

15. The system as claimed in claim 11 wherein a clearance is maintained between the electrical insulator layer and the bond wires.

16. The system as claimed in claim 11 wherein:

the singulated, layered structure is equivalent in size to the integrated circuit die; and

the base has the solder balls on a bottom thereof.

17. The system as claimed in claim 16 wherein the adhesive layer is coplanar with a back surface of the integrated circuit die.

18. The system as claimed in claim 16 wherein the adhesive layer is to the top of the base.

19. The system as claimed in claim 16 wherein the integrated circuit die is attached to the base wherein the base is a ball grid array substrate or a die paddle with lead fingers.

20. The system as claimed in claim 16 wherein:

the singulated, layered structure maintains a clearance between the electrical insulator layer and the bond wires; and

the singulated, layered structure maintains a portion of the adhesive layer clear of the bond wires.

Assignments (6)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 3, 2025
From: STATS CHIPPAC PTE. LTD.
To: STATS CHIPPAC MANAGEMENT PTE. LTD.
Reel/Frame 072788/0917 →
CORRECTIVE ASSIGNMENT TO CORRECT THE CORRECT THE SPELLING OF ASSIGNEE'S NAME FROM "STATS CHIPPAC PTE. LTE>" TO "STATS CHIPPAC PTE. LTD" PREVIOUSLY RECORDED AT REEL: 038378 FRAME: 0219. ASSIGNOR(S) HEREBY CONFIRMS THE ASSIGNMENT. Recorded Sep 1, 2023
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTD.
Reel/Frame 064803/0300 →
RELEASE OF SECURITY INTEREST Recorded Jun 5, 2020
From: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
To: STATS CHIPPAC, INC.; STATS CHIPPAC PTE. LTD. FORMERLY KNOWN AS STATS CHIPPAC LTD.
Reel/Frame 052850/0237 →
CHANGE OF NAME Recorded Apr 7, 2016
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 038378/0219 →
SECURITY INTEREST Recorded Aug 6, 2015
From: STATS CHIPPAC, INC.; STATS CHIPPAC LTD.
To: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
Reel/Frame 036288/0748 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 12, 2008
From: KO, WONJUN; LIM, TAEG KI; SONG, SUNGMIN
To: STATS CHIPPAC LTD.
Reel/Frame 020500/0166 →