Methods for in situ surface treatment in an ion implantation system
View Patent ↗A system and methods are provided for mitigating or removing workpiece surface contaminants or conditions. Methods of the invention provide treatment of the wafer surface to provide a known surface condition. The surface condition can then be maintained during and following implantation of the workpiece surface with a dopant.
1. A method of treating a workpiece comprising:
establishing a workpiece within an ion implantation system, the ion implantation system comprising a loadlock chamber operably coupled to a plasma source or;
exposing a surface of the workpiece to a plasma generated by the plasma source within the ion implantation system to adjust and maintain the workpiece surface to a known surface condition.
2. The method of claim 1 , the workpiece surface comprising silicon, silicon-germanium, germanium, gallium-arsenide, gallium-aluminum-arsenide, or indium-phosphide.
3. The method of claim 1 , the exposing occurring following implantation of the workpiece surface to form a passivation layer.
4. The method of claim 3 , further comprising depositing a thin film protective coating comprising silicon dioxide, silicon nitride, or silicon oxynitride on the workpiece surface.
5. The method of claim 1 , the known surface condition comprising one or more of oxidation of the workpiece surface to a known thickness or adjustment of the surface chemistry to a known value.
6. The method of claim 5 , the surface chemistry adjustment comprising adjustment of the oxygen, nitrogen, hydrogen and/or carbon content to a known value.
7. The method of claim 1 , further comprising ion implanting the workpiece surface with a dopant while the workpiece surface is maintained at the known surface condition.
8. The method of claim 1 , where the surface of the workpiece comprises an oxide, and wherein exposing the surface of the workpiece to the plasma to adjust and maintain the workpiece surface to the known surface condition comprises adjusting and maintaining a thickness of the oxide to a known thickness.
9. The method of claim 8 , further comprising:
implanting dopant ions into the workpiece surface while the thickness of the oxide is maintained at the known thickness.
10. The method of claim 1 :
wherein the workpiece surface comprises at least one of: an oxygen content, a nitrogen content, a hydrogen content, or a carbon content, and
wherein exposing the workpiece surface to the plasma to adjust and maintain the workpiece surface to the known surface condition comprises adjusting and maintaining at least one of: the oxygen content, the nitrogen content, the hydrogen content, or the carbon content.
11. The method of claim 10 , further comprising implanting dopant ions into the workpiece surface while at least one of: the oxygen content, the nitrogen content, the hydrogen content, or the carbon content is maintained.
12. An ion implantation system for treating a workpiece comprising:
an ion source operable to produce an ion beam;
a plasma surface treatment tool configured to adjust and maintain a workpiece surface to a known surface condition, the plasma surface treatment tool comprising a loadlock chamber operably coupled to a plasma source or; and
a process chamber configured to house the workpiece while the surface treatment tool adjusts and maintains the workpiece surface to the known condition.
13. The system of claim 12 , the plasma chambers and process chamber located within a common vacuum system.
14. The system of claim 12 , the known surface condition comprising one or more of oxidation of the workpiece surface to a known thickness or adjustment of the surface chemistry to a known value or the deposition of a thin low molecular weight substance.