Substrate alignment system
View Patent ↗A system for aligning an end effector with a substrate in a substrate transport apparatus. The system comprises a first sensor connected to the end effector and a controller for moving the substrate transport apparatus. The sensor has a sensing path pointed in an outward direction. The sensing path does not intersect the substrate when the substrate is located on the end effector. The controller for moving the substrate transport apparatus moves the substrate transport apparatus, based at least partially upon input from the sensor, to position the end effector at a predetermined position relative to the substrate to pick up the substrate onto the end effector.
1. A method of aligning substrates in stack of substrates, the method comprising:
scanning positions of first reference points on respective first edges of at least two of the substrates by measuring a first distance between the first reference point on each of the substrates and a scanner;
scanning positions of second reference points on the respective first edges by measuring a second distance between the second reference point on each of the substrates and the scanner so that for each substrate there is more than one measured distance, wherein the first and second reference points of a respective substrate are located on a common side of the respective substrate and scanning the positions of more than one of the first reference points is completed before commencing scanning of any of the positions of the second reference points;
subsequently moving the at least two substrates with an end effector; and
aligning the substrates as the substrates are moved;
wherein the steps of scanning the positions of the first and second reference points occurs from on the common side of the respective substrate prior to end effector entry into the stack of substrates and before the at least two substrates are subsequently moved.
2. The method of claim 1 , comprising using an adjustment calculated from the measured distances to correct for misalignment of the substrates as the substrates are moved.
3. The method of claim 1 , wherein a step of scanning the positions of the first and second reference points of a last of the at least two substrates occurs before a first of the at least two substrates are subsequently moved.
4. The method of claim 1 , wherein the steps of scanning the positions of the first and second reference points moves the scanner vertically in front of the first edges of the at least two substrates and the distances are horizontal distances.
5. The method of claim 1 , wherein the steps of scanning the positions of the first and second reference points measures the distances between the scanner and two locations on each substrate.
6. The method of claim 1 , wherein the steps of scanning the positions of the first and second reference points measures distances to a first location on the first edge and at least one other location on the respective substrates.
7. The method of claim 1 , further comprising scanning positions of respective second edges of at least two of the substrates where the respective second edges are located on a side of the respective substrate that is different than the common side.