Semiconductor device and method of forming dummy pillars between semiconductor die and substrate for maintaining standoff distance
A semiconductor device has a semiconductor die with an insulation layer formed over an active surface of the semiconductor die. A conductive layer is formed over the first insulating layer electrically connected to the active surface. A plurality of conductive pillars is formed over the conductive layer. A plurality of dummy pillars is formed over the first insulating layer electrically isolated from the conductive layer and conductive pillars. The semiconductor die is mounted to a substrate. A height of the dummy pillars is greater than a height of the conductive pillars to maintain the standoff distance between the semiconductor die and substrate. The dummy pillars can be formed over the substrate. The dummy pillars are disposed at corners of the semiconductor die and a central region of the semiconductor die. A mold underfill material is deposited between the semiconductor die and substrate.
1. A method of making a semiconductor device, comprising:
providing a semiconductor die;
forming a conductive layer over the semiconductor die;
forming an insulating layer over the conductive layer;
depositing a conductive material within openings of the insulating layer to form a plurality of conductive pillars over the conductive layer and a plurality of rigid dummy pillars over the semiconductor die electrically isolated from the conductive layer and conductive pillars, wherein a height of the rigid dummy pillars is greater than a height of the conductive pillars;
disposing a bump material over the conductive pillars;
providing a substrate;
disposing the semiconductor die over the substrate after forming the conductive pillars and rigid dummy pillars with the rigid dummy pillars maintaining a fixed standoff distance between the semiconductor die and substrate; and
reflowing the bump material, wherein surface tension retains the bump material within a footprint of the conductive pillars and the fixed standoff distance reduces pressure on the bump material.
2. The method of claim 1 , further including removing a remaining portion of the insulating layer leaving the conductive pillars disposed over the conductive layer.
3. The method of claim 1 , further including depositing a mold underfill material between the semiconductor die and substrate.
4. The method of claim 1 , wherein the height of the rigid dummy pillars is greater than the height of the conductive pillars to maintain the fixed standoff distance between the semiconductor die and substrate.