IP Library › Granted Patent US 8,791,844
Granted Patent B2
US 8,791,844 · App. 13/489,865 · Granted Jul 29, 2014

Modified dynamic element matching for reduced latency in a pipeline analog to digital converter

Inventors: Daniel Meacham (Del Mar, CA); Andrea Panigada (San Diego, CA); Jorge Grilo (San Diego, CA)
Assignee: Microchip Technology Incorporated
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Quick Facts
Patent No.
US 8,791,844
App. No.
13/489,865
Granted
Jul 29, 2014
Kind
B2
Abstract

A circuit in an analog-to-digital converter (ADC) includes an amplifier configured to receive an output of a backend DAC; a harmonic distortion correction circuit (HDC) coupled to the amplifier and configured to correct distortion components due to the residue amplifier present in a digital signal from the backend ADC, the HDC circuit providing an output to an adder, the adder receiving a coarse digital output from a coarse ADC; and a DAC noise cancellation circuit (DNC) configured to provide an output to the adder, wherein the DNC circuit is configured to correct distortion components due to the DAC present in the digital signal from the backend ADC; wherein the output of the adder is an ADC digital output and wherein the ADC digital output forms an input to the HDC and the DNC.

Claims (38)

1. A circuit in an analog-to-digital converter (ADC), comprising:

an amplifier configured to receive an output of a backend ADC;

a harmonic distortion correction circuit (HDC) coupled to the amplifier and configured to correct distortion components due to the residue amplifier present in a digital signal from the backend ADC, the HDC circuit providing an output to an adder, the adder receiving a coarse digital output from a coarse ADC; and

a DAC noise cancellation circuit (DNC) configured to provide an output to the adder, wherein the DNC circuit is configured to correct distortion components due to the DAC present in the digital signal from the backend ADC;

wherein the output of the adder is an ADC digital output and wherein the ADC digital output forms an input to the HDC and the DNC.

2. A circuit in accordance with claim 1 , the coarse ADC and the DAC both comprising n bit devices, where n is an integer.

3. A circuit in accordance with claim 1 , the HDC circuit configured to receive one or more randomized sequences for estimating amplifier errors.

4. A circuit in accordance with claim 1 , the HDC circuit configured to provide one or more control outputs to a circuit for modifying a reference signal to the coarse ADC.

5. A circuit in a pipeline analog-to-digital converter (ADC), comprising:

a harmonic distortion correction (HDC) circuit configured to provide an output to an adder, the adder receiving as an input an output of a coarse ADC; and

a feedback loop including a DAC noise cancellation (DNC) circuit configured to provide an output to the adder;

wherein an output of the adder is an ADC digital output and is an input to the DNC circuit.

6. The circuit of claim 5 , wherein the HDC circuit is configured to receive one or more random sequences for estimating nonlinearities.

7. The circuit of claim 5 , wherein the HDC circuit is configured to provide an output to a circuit for modifying a reference signal to the coarse ADC.

8. A method in a pipeline analog-to-digital converter (ADC) for converting an input signal, comprising:

performing a harmonic distortion correction (HDC) as an output to an adder, the adder receiving as another input an output of the coarse ADC; and

implementing a feedback loop including a DAC noise cancellation (DNC) circuit providing an output to the adder;

wherein an output of the adder is an ADC digital output and is an input to the DNC circuit.

9. A method in accordance with claim 8 , further including modifying a reference signal to the coarse ADC.

10. A method in accordance with claim 8 , wherein an HDC circuit receives one or more random sequences for estimating nonlinearities.

11. A method in accordance with claim 8 , wherein the HDC circuit provides an output to the circuit for modifying the reference signal to the coarse ADC.

12. A circuit in an analog-to-digital converter (ADC), comprising:

a coarse ADC receiving an input signal coupled with a digital to analog converter generating an output signal that is subtracted from the input signal and fed to a residue amplifier, wherein the coarse ADC and the DAC have the same conversion bit width n, where n is an integer;

an amplifier configured to receive an output of a backend ADC coupled with the residue amplifier;

a harmonic distortion correction circuit coupled to the amplifier and configured to correct distortion components due to the residue amplifier present in a digital signal from the backend ADC, wherein an HDC output is coupled to a first input of an adder, a second input of the adder being coupled to an output of the coarse ADC, wherein the HDC circuit is configured to receive one or more randomized voltage sequences for estimating amplifier errors; and

a DAC noise cancellation circuit having an output coupled to a third input of the adder, wherein the DNC circuit is configured to correct distortion components due to the DAC present in the digital signal from the backend ADC;

wherein the output of the adder is an ADC digital output and wherein the ADC digital output forms an input to the HDC and the DNC,

wherein the coarse ADC is a flash ADC, comprises a dynamic element matching unit for providing threshold voltages and a sequence adder unit receiving said threshold voltages and said one or more randomized voltage sequences for varying the threshold voltages of the coarse ADC.

13. A circuit in accordance with claim 12 , wherein the coarse ADC generates a thermometer output code generated by a plurality of comparators and wherein the dynamic element matching unit operable to permute the threshold voltages such that each threshold voltage may be fed to any one of the comparators.

14. A circuit in accordance with claim 13 , wherein the coarse ADC further comprises a plurality of sequence adders receiving said plurality of threshold voltages from said DEM unit and said one or more randomized sequences.

15. A circuit in accordance with claim 12 , wherein the HDC circuit configured to provide one or more control outputs to said DEM unit.

16. A circuit in accordance with claim 15 , wherein the coarse ADC comprises for each comparator a first capacitor and a second capacitor and a switching network for coupling said capacitors with the associated comparator.

17. A circuit in accordance with claim 16 , wherein the coarse ADC comprises for each comparator a first set of controlled switches controlled by the DEM unit for coupling one of said threshold voltages with one terminal of the second capacitor and a second set of controlled switches controlled by the HDC circuit for generating said randomized voltage sequence and feeding it to the other terminal of the second capacitor.

18. A circuit in accordance with claim 12 , wherein the randomized voltage sequence includes a plurality of symmetric predefined voltages.

19. A circuit in accordance with 13 , wherein each comparator operates according to the equation

Output — i =1 if (input− THRx+VHDCy )>0,

0 otherwise;

wherein input is the input signal, THRx defines a selected threshold voltage and VHDCy a selected voltage of the randomized voltage sequence.

Assignments (15)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED
Reel/Frame 059666/0545 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
SECURITY INTEREST Recorded Feb 10, 2017
From: MICROCHIP TECHNOLOGY INCORPORATED
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 041675/0617 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Feb 12, 2014
From: MEACHAM, DANIEL; PANIGADA, ANDREA; GRILO, JORGE
To: MICROCHIP TECHNOLOGY INCORPORATED
Reel/Frame 032206/0823 →
Continuity (2)
Provisional Application 61495369 · Jun 9, 2011
Related Publication 20130027231A1 · Jan 31, 2013