Granted Patent B2

US 9,268,899 · App. 13/830,267 · Granted Feb 23, 2016

Abstract

Claims (28)

1. A sensing circuit for use in a memory device, comprising:

a first circuit block coupled to a selected memory cell, wherein the first circuit block comprises a P-LDE1 transistor and one or more N-LDE2 transistors;

a second circuit block coupled to a reference memory cell, wherein the second circuit block comprises a P-LDE1 transistor and one or more N-LDE2 transistors;

a third circuit block coupled to the first circuit block and second circuit block to generate an output indicating the data stored in the selected memory cell, wherein the third circuit block comprises a plurality of P-LDE2 transistors and a plurality of N-LDE2 transistors.

2. The sensing circuit of claim 1 , wherein the first circuit block further comprises a current source.

3. The sensing circuit of claim 2 , wherein the second circuit block further comprises a current source.

4. The sensing circuit of claim 1 , wherein each P-LDE1 transistor was manufactured with a well spacing of 1-2 μm to its drain.

5. The sensing circuit of claim 4 , wherein each P-LDE1 transistor was manufactured with a well spacing of 1-2 μm to its source.

6. The sensing circuit of claim 1 , wherein each P-LDE1 transistor comprises a gate whose edge is 0.6-1.0 μm away from the edge of the nearest shall trench isolation (STI) area.

7. The sensing circuit of claim 6 , wherein each P-LDE1 transistor comprises an STI area of width 1.9-2.0 μm.

8. The sensing circuit of claim 1 , wherein each N-LDE2 transistor was manufactured with a well spacing of be 0.5-0.6 μm to its drain.

9. The sensing circuit of claim 8 , wherein each N-LDE-2 transistor was manufactured with a well spacing of 1-2 μm to its source.

10. The sensing circuit of claim 1 , wherein each N-LDE2 transistor comprises a gate whose edge is 2-4 μm away from the edge of the nearest shall trench isolation (STI) area.

11. The sensing circuit of claim 10 , wherein each N-LDE2 transistor comprises an STI area of width 0.2-0.3 μm.

12. A sensing circuit for use in a memory device, comprising:

a first circuit block coupled to a selected memory cell, wherein the first circuit block comprises a P-LDE2 transistor;

a second circuit block coupled to a reference memory cell and to the first circuit block, wherein the second circuit block comprises a P-LDE2 transistor;

a third circuit block coupled to the first circuit block to generate an output indicating the data stored in the selected memory cell, wherein the third circuit block comprises a P-LDE1 transistor and an N-LDE2 transistor.

13. The sensing circuit of claim 12 , wherein each P-LDE2 transistor was manufactured with a well spacing of be 0.5-0.6 μm to its drain.

14. The sensing circuit of claim 13 , wherein each P-LDE-2 transistor was manufactured with a well spacing of 1-2 μm to its source.

15. The sensing circuit of claim 12 , wherein each P-LDE2 transistor comprises a gate whose edge is 0.6-1.0 μm away from the edge of the nearest shall trench isolation (STI) area.

16. The sensing circuit of claim 15 , wherein each P-LDE2 transistor comprises an STI area of width 1.9-2.0 μm.

17. A sensing circuit for use in a memory device, comprising:

a first circuit block coupled to a selected memory cell, wherein the first circuit block comprises a cascoding N-LDE1 transistor and a load P-LDE1 transistor;

a second circuit block coupled to a reference memory cell, wherein the second circuit block comprises cascoding N-LDE1 transistor and a load P-LDE1 transistor;

a third circuit block coupled to the first circuit block and second circuit block to generate an output indicating the data stored in the selected memory cell, wherein the third circuit block comprises an N-LDE2 transistor and an P-LDE2 transistor.

18. The sensing circuit of claim 17 , wherein the first circuit block further comprises a current source.

19. The sensing circuit of claim 17 , wherein the second circuit block further comprises a current source.

Assignments (15)