IP Library Granted Patent US 9,269,691
Granted Patent B2
US 9,269,691 · App. 13/918,103 · Granted Feb 23, 2016

Semiconductor device and method of making an embedded wafer level ball grid array (EWLB) package on package (POP) device with a slotted metal carrier interposer

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Quick Facts
Patent No.
US 9,269,691
App. No.
13/918,103
Granted
Feb 23, 2016
Kind
B2
Abstract

A semiconductor device has a semiconductor die. The semiconductor die is disposed over a conductive substrate. An encapsulant is deposited over the semiconductor die. A first interconnect structure is formed over the encapsulant. An opening is formed through the substrate to isolate a portion of the substrate electrically connected to the first interconnect structure. A bump is formed over the first interconnect structure. Conductive vias are formed through the encapsulant and electrically connected to the portion of the substrate. A plurality of bumps is formed over the semiconductor die. A first conductive layer is formed over the encapsulant. A first insulating layer is formed over the first conductive layer. A second conductive layer is formed over the first insulating layer and first conductive layer. A second insulating layer is formed over the first insulating layer and second conductive layer. Protrusions extend above the substrate.

Claims (45)

1. A method of making a semiconductor device, comprising:

providing a conductive substrate;

disposing a semiconductor die over the conductive substrate;

depositing an encapsulant over the semiconductor die;

forming an interconnect structure over the encapsulant; and

forming an opening through the conductive substrate and a portion of the encapsulant to isolate a portion of the conductive substrate electrically connected to the interconnect structure.

2. The method of claim 1 , further including forming a plurality of conductive vias through the encapsulant.

3. The method of claim 1 , wherein forming the opening creates a plurality of contact pads electrically connected to the interconnect structure.

4. The method of claim 1 , further including depositing the encapsulant coplanar with a surface of the semiconductor die.

5. The method of claim 1 , further including:

providing the conductive substrate to include a protrusion extending above a surface of the conductive substrate; and

forming a conductive via extending through the encapsulant to the protrusion.

6. A method of making a semiconductor device, comprising:

providing a conductive substrate;

disposing a semiconductor die over the conductive substrate;

depositing an encapsulant over the semiconductor die; and

forming a trench through the conductive substrate after depositing the encapsulant.

7. The method of claim 6 , further including forming a conductive via through the encapsulant.

8. The method of claim 6 , further including forming the trench extending over the semiconductor die.

9. The method of claim 6 , further including forming the trench outside a footprint of the semiconductor die.

10. The method of claim 6 , further including forming the conductive substrate to include a protrusion extending from a surface of the conductive substrate.

11. The method of claim 6 , further including forming a plurality of trenches through the conductive substrate to create a plurality of contact pads.

12. A method of making a semiconductor device, comprising:

providing a substrate;

disposing a semiconductor die over the substrate;

forming an interconnect structure over the semiconductor die; and

forming a trench through the substrate after disposing the semiconductor die over the substrate.

13. The method of claim 12 , further including:

depositing an encapsulant over the semiconductor die; and

forming a conductive via through the encapsulant.

14. The method of claim 12 , further including forming a plurality of trenches through the substrate to form a plurality of contact pads.

15. The method of claim 12 , further including forming the trench extending over the semiconductor die.

16. The method of claim 12 , further including providing the substrate to include a leadframe.

17. The method of claim 12 , further including providing the substrate to include a protrusion extending from a surface of the substrate.

18. The method of claim 12 , further including forming the trench outside a footprint of the semiconductor die.

19. A semiconductor device, comprising:

a substrate;

a semiconductor die disposed over the substrate;

an encapsulant deposited over the substrate and semiconductor die; and

an opening formed in the substrate and extending into the encapsulant.

20. The semiconductor device of claim 19 , wherein a continuous portion of the substrate is disposed over the semiconductor die.

21. The semiconductor device of claim 19 , wherein the substrate includes a protrusion extending into the encapsulant.

22. The semiconductor device of claim 19 , further including a conductive via formed through the encapsulant over the substrate.

23. The semiconductor device of claim 19 , further including an interconnect structure formed over the semiconductor die and electrically connected to the substrate.

24. The semiconductor device of claim 19 , wherein the opening extends over the semiconductor die.

Assignments (6)
THIS SUBMISSION IS TO CORRECT A TYPOGRAPHICAL ERROR IN THE COVER SHEET PREVIOUSLY RECORDED ON REEL: 038378 FRAME: 0382 TO CORRECT THE SPELLING OF ASSIGNEE'S NAME FROM "STATS CHIPPAC PTE. LTE." TO "STATS CHIPPAC PTE. LTD." Recorded Sep 6, 2023
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTD.
Reel/Frame 064869/0363 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 18, 2019
From: STATS CHIPPAC PTE. LTD.
To: JCET SEMICONDUCTOR (SHAOXING) CO., LTD.
Reel/Frame 051365/0680 →
RELEASE OF SECURITY INTEREST Recorded Dec 13, 2019
From: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
To: STATS CHIPPAC, INC.; STATS CHIPPAC PTE. LTD. FORMERLY KNOWN AS STATS CHIPPAC LTD.
Reel/Frame 051285/0318 →
CHANGE OF NAME Recorded Apr 7, 2016
From: STATS CHIPPAC LTD.
To: STATS CHIPPAC PTE. LTE.
Reel/Frame 038378/0382 →
SECURITY INTEREST Recorded Aug 6, 2015
From: STATS CHIPPAC, INC.; STATS CHIPPAC LTD.
To: CITICORP INTERNATIONAL LIMITED, AS COMMON SECURITY AGENT
Reel/Frame 036288/0748 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 14, 2013
From: CHI, HEEJO; SHIN, HANGIL; CHO, NAMJU
To: STATS CHIPPAC, LTD.
Reel/Frame 030615/0826 →