Semiconductor device and method of forming trench and disposing semiconductor die over substrate to control outward flow of underfill material
View Patent ↗A semiconductor device has a substrate including an opening. A trench is formed over the substrate around the opening. An interconnect structure is formed in the trench. An underfill material is disposed over the interconnect structure. A first semiconductor die is disposed over the underfill material prior to curing the underfill material. An active region of the first semiconductor die is disposed over the opening in the substrate. The trench contains the outward flow of underfill material. Underfill material is blocked from flowing over unintended areas on the surface of substrate, into the opening in the substrate, and over sensors of the first semiconductor die. A second semiconductor die is disposed over the substrate. The trench is formed by a first and second dam or a first insulating layer. A second insulating layer is formed over the first insulating layer. A dam is formed over the second insulating layer.
1. A method of making a semiconductor device, comprising:
providing a substrate including an opening devoid of material and extending from a first surface of the substrate to a second surface of the substrate;
forming a first insulating layer over the first surface of the substrate;
removing a portion of the first insulating layer to form a trench over the first surface of the substrate and around the opening;
forming an interconnect structure in the trench;
disposing an underfill material in the trench around the opening and interconnect structure; and
disposing a first semiconductor die over the substrate and interconnect structure after depositing the underfill material in the trench, wherein a sensor of the first semiconductor die is disposed over the opening in the substrate and the trench contains the underfill material to prevent the underfill material from reaching the opening.
2. The method of claim 1 , further including forming a second insulating layer over the first insulating layer.
3. The method of claim 2 , further including forming a dam over the second insulating layer.
4. The method of claim 1 , further including disposing a second semiconductor die over the substrate outside the trench.
5. A method of making a semiconductor device, comprising:
providing a substrate including an opening devoid of material;
forming a first insulating layer over the first surface of the substrate;
forming a trench in the first insulating layer around the opening;
forming an interconnect structure in the trench over the substrate;
disposing an underfill material in the trench around the opening and interconnect structure; and
disposing a first semiconductor die over the interconnect structure after depositing the underfill material in the trench, wherein a sensor of the first semiconductor die is disposed over the opening in the substrate and the trench contains the underfill material to prevent the underfill material from reaching the opening.
6. The method of claim 5 , further including forming a second insulating layer over the first insulating layer.
7. The method of claim 5 , further including curing the underfill material after disposing the semiconductor die over the underfill material.
8. A method of making a semiconductor device, comprising:
providing a substrate including an opening;
forming a trench over the substrate and around the opening;
forming an interconnect structure in the trench over the substrate;
disposing an underfill material in the trench; and
disposing a first semiconductor die over the substrate with a first sidewall of the trench blocking flow of the underfill material into the opening in the substrate and a second sidewall of the trench blocking flow of the underfill material away from the opening in the substrate.
9. The method of claim 8 , further including disposing a second semiconductor die over the substrate outside the trench.
10. The method of claim 8 , further including disposing a sensor of the first semiconductor die over the opening in the substrate.
11. The method of claim 8 , wherein forming the trench includes:
forming a first insulating layer over the substrate; and
forming the trench in the first insulating layer around the opening in the substrate.
12. A method of making a semiconductor device, comprising:
providing a substrate;
disposing a first insulating layer over the substrate;
forming a trench in the first insulating layer around an opening in the substrate;
disposing an underfill material in the trench over the substrate; and
disposing a first semiconductor die over the opening in the substrate, wherein the trench contains the underfill material to prevent the underfill material from reaching the opening.
13. The method of claim 12 , further including disposing a second semiconductor die over the substrate.
14. The method of claim 12 , further including forming an interconnect structure in the trench over the substrate.
15. The method of claim 12 , wherein the first semiconductor die includes a microelectromechanical device.
16. The method of claim 8 , wherein the first semiconductor die includes a microelectromechanical device.
17. The method of claim 8 , further including disposing the first semiconductor die over the substrate after depositing the underfill material in the trench.
18. The method of claim 11 , further including forming a second insulating layer over the first insulating layer.
19. The method of claim 18 , further including forming a dam over the second insulating layer.
20. The method of claim 1 , wherein the sensor of the first semiconductor die includes a microelectromechanical device.
21. The method of claim 4 , wherein the trench contains the underfill material to prevent the underfill material from reaching the second semiconductor die.
22. The method of claim 5 , further including disposing a second semiconductor die over the substrate outside the trench.
23. The method of claim 22 , wherein the trench contains the underfill material to prevent the underfill material from reaching the second semiconductor die.
24. The method of claim 5 , wherein the sensor of the first semiconductor die includes a microelectromechanical device.
25. The method of claim 6 , further including forming a dam over the second insulating layer.
26. The method of claim 12 , further including disposing the first semiconductor die over the substrate after depositing the underfill material in the trench.
27. The method of claim 12 , further including forming a second insulating layer over the first insulating layer.
28. The method of claim 27 , further including forming a dam over the second insulating layer.
29. The method of claim 13 , wherein the trench contains the underfill material to prevent the underfill material from reaching the second semiconductor die.