IP Library Granted Patent US 8,988,118
Granted Patent B1
US 8,988,118 · App. 14/148,448 · Granted Mar 24, 2015

Apparatus and method for driving a transistor

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Quick Facts
Patent No.
US 8,988,118
App. No.
14/148,448
Granted
Mar 24, 2015
Kind
B1
Abstract

Disclosed is a high-swing voltage-mode transmitter or line driver. The transmitter can operate over a wide range of supply voltages. Increasing the available output swing merely involves increasing the supply voltage; the circuit adapts to maintain the desired output impedance. This allows for a tradeoff between output amplitude and power consumption. Another advantage of the proposed architecture is that it compensates for process, voltage, and temperature (PVT) and mismatch variations so as to keep rise and fall times matched. This feature reduces common-mode noise and hence EMI in systems in which the transmitter is used.

Claims (33)

1. An apparatus comprising:

a first switching circuit configured to receive a differential data signal and a first bias voltage, wherein the first switching circuit is configured to convert the differential data signal to a first PMOS drive signal and a second PMOS drive signal for a first PMOS driver transistor and a second PMOS driver transistor, respectively, wherein the first switching circuit is configured to change a state of the first and second PMOS drive signals in response to a change in state of the data signal, wherein a first state of the first or second PMOS drive signal turns on the corresponding PMOS driver transistor and has a voltage level of the first bias voltage, wherein a second state of the first or second PMOS drive signal turns off the corresponding PMOS driver transistor, wherein the first switching circuit comprises a first capacitor, a second capacitor, a first NMOS transistor, a second NMOS transistor, and a first enable switch, wherein sources of the first NMOS transistor and the second NMOS transistor are each electrically connected to a first node, wherein the first enable switch is configured to receive the first bias voltage and to selectively provide the first bias voltage to the first node, wherein a drain of the first NMOS transistor is electrically connected to a gate of the second NMOS transistor, wherein a drain of the second NMOS transistor is electrically connected to a gate of the first NMOS transistor, wherein the first switching circuit is configured to generate the first state of the PMOS drive signal via capacitive coupling and to generate the second state of the PMOS drive signal via a combination of capacitive coupling and turning on of at least one of the first NMOS transistor or the second NMOS transistor;

a second switching circuit configured to receive the differential data signal and a second bias voltage, wherein the second switching circuit is configured to convert the differential data signal to a first NMOS drive signal and a second NMOS drive signal for a first NMOS driver transistor and a second NMOS driver transistor, wherein the second switching circuit is configured to change a state of the NMOS drive signal in response to a change in state of the data signal, wherein a first state of the first or second NMOS drive signal turns on the corresponding NMOS driver transistor and has a voltage level of the second bias voltage, and wherein a second state of the first or second NMOS drive signal turns off the corresponding NMOS driver transistor, wherein the second switching circuit comprises a third capacitor, a fourth capacitor, a first PMOS transistor, a second PMOS transistor, and a second enable switch, wherein sources of the first PMOS transistor and the second PMOS transistor are each electrically connected to a second node, wherein the second enable switch is configured to receive the second bias voltage and to selectively provide the second bias voltage to the second node, wherein a drain of the first PMOS transistor is electrically coupled to a gate of the second PMOS transistor, wherein a drain of the second PMOS transistor is electrically coupled to a gate of the first PMOS transistor, wherein the second switching circuit is configured to generate the first state of the NMOS drive signal via capacitive coupling and to generate the second state of the NMOS drive signal via a combination of capacitive coupling and turning on of at least one of the first PMOS transistor or the second PMOS transistor;

a third PMOS transistor having a source, a gate, and a drain, wherein the source is coupled to a first power supply rail, wherein the drain is coupled to a node of the first PMOS drive signal; and

a fourth PMOS transistor having a source, a gate, and a drain, wherein the source is coupled to a first power supply rail, wherein the drain is coupled to a node of the second PMOS drive signal;

wherein the third PMOS transistor and the fourth PMOS transistor are configured to pull up the first PMOS drive signal and the second PMOS drive signal, respectively, for disabling of output drivers driven by the first PMOS drive signal and the second PMOS drive signal.

2. The apparatus of claim 1 , wherein the first state of the PMOS drive signal and the first state of the NMOS drive signal turn on the PMOS driver transistor and the NMOS driver transistor, respectively, to a triode region of operation via the first bias voltage and the second bias voltage.

3. The apparatus of claim 1 , wherein the received data signal is provided from circuits powered by a first power supply voltage rail, and wherein the PMOS driver transistor and the NMOS driver transistor are referenced to a second power supply voltage rail higher than the first power supply voltage rail.

4. The apparatus of claim 1 , further comprising a first multiplexer configured to select at least between a first signal input and a second signal input different from the first signal input by phase and/or delay to generate the differential data signal for the first switching circuit and the second switching circuit.

5. The apparatus of claim 1 , wherein the first PMOS drive signal is available at the drain of the first NMOS transistor, wherein the second PMOS drive signal is available at the drain of the second NMOS transistor, wherein the first NMOS drive signal is available at the drain of the first PMOS transistor, wherein the second NMOS drive signal is available at the drain of the second PMOS transistor.

6. An apparatus comprising:

a first switching circuit configured to receive a differential data signal and a first bias voltage, wherein the first switching circuit is configured to convert the differential data signal to a first PMOS drive signal and a second PMOS drive signal for a first PMOS driver transistor and a second PMOS driver transistor, respectively, wherein the first switching circuit is configured to change a state of the first and second PMOS drive signals in response to a change in state of the data signal, wherein a first state of the first or second PMOS drive signal turns on the corresponding PMOS driver transistor and has a voltage level of the first bias voltage, wherein a second state of the first or second PMOS drive signal turns off the corresponding PMOS driver transistor, wherein the first switching circuit comprises a first capacitor, a second capacitor, a first NMOS transistor, a second NMOS transistor, and a first enable switch, wherein sources of the first NMOS transistor and the second NMOS transistor are each electrically connected to a first node, wherein the first enable switch is configured to receive the first bias voltage and to selectively provide the first bias voltage to the first node, wherein a drain of the first NMOS transistor is electrically connected to a gate of the second NMOS transistor, wherein a drain of the second NMOS transistor is electrically connected to a gate of the first NMOS transistor, wherein the first switching circuit is configured to generate the first state of the PMOS drive signal via capacitive coupling and to generate the second state of the PMOS drive signal via a combination of capacitive coupling and turning on of at least one of the first NMOS transistor or the second NMOS transistor;

a second switching circuit configured to receive the differential data signal and a second bias voltage, wherein the second switching circuit is configured to convert the differential data signal to a first NMOS drive signal and a second NMOS drive signal for a first NMOS driver transistor and a second NMOS driver transistor, wherein the second switching circuit is configured to change a state of the NMOS drive signal in response to a change in state of the data signal, wherein a first state of the first or second NMOS drive signal turns on the corresponding NMOS driver transistor and has a voltage level of the second bias voltage, and wherein a second state of the first or second NMOS drive signal turns off the corresponding NMOS driver transistor, wherein the second switching circuit comprises a third capacitor, a fourth capacitor, a first PMOS transistor, a second PMOS transistor, and a second enable switch, wherein sources of the first PMOS transistor and the second PMOS transistor are each electrically connected to a second node, wherein the second enable switch is configured to receive the second bias voltage and to selectively provide the second bias voltage to the second node, wherein a drain of the first PMOS transistor is electrically coupled to a gate of the second PMOS transistor, wherein a drain of the second PMOS transistor is electrically coupled to a gate of the first PMOS transistor, wherein the second switching circuit is configured to generate the first state of the NMOS drive signal via capacitive coupling and to generate the second state of the NMOS drive signal via a combination of capacitive coupling and turning on of at least one of the first PMOS transistor or the second PMOS transistor;

a third PMOS transistor having a source, a gate, and a drain, wherein the source is coupled to a first power supply rail, wherein the drain is coupled to a node of the first PMOS drive signal;

a fourth PMOS transistor having a source, a gate, and a drain, wherein the source is coupled to a first power supply rail, wherein the drain is coupled to a node of the second PMOS drive signal;

a third NMOS transistor having a source, a gate, and a drain, wherein the source is coupled to a second power supply rail, wherein the drain is coupled to a node of the first NMOS drive signal; and

a fourth NMOS transistor having a source, a gate, and a drain, wherein the source is coupled to a second power supply rail, wherein the drain is coupled to a node of the second NMOS drive signal;

wherein the third PMOS transistor and the fourth PMOS transistor are configured to pull up the first PMOS drive signal and the second PMOS drive signal, respectively, for disabling of output drivers driven by the first PMOS drive signal and the second PMOS drive signal;

wherein the third NMOS transistor and the fourth NMOS transistor are configured to pull down the first NMOS drive signal and the second NMOS drive signal, respectively, for disabling of output drivers driven by the first NMOS drive signal and the second NMOS drive signal.

7. The apparatus of claim 6 , wherein the first state of the PMOS drive signal and the first state of the NMOS drive signal turn on the PMOS driver transistor and the NMOS driver transistor, respectively, to a triode region of operation via the first bias voltage and the second bias voltage.

8. The apparatus of claim 6 , wherein the received data signal is provided from circuits powered by a first power supply voltage rail, and wherein the PMOS driver transistor and the NMOS driver transistor are referenced to a second power supply voltage rail higher than the first power supply voltage rail.

9. The apparatus of claim 6 , further comprising a first multiplexer configured to select at least between a first signal input and a second signal input different from the first signal input by phase and/or delay to generate the differential data signal for the first switching circuit and the second switching circuit.

10. The apparatus of claim 6 , wherein the first PMOS drive signal is available at the drain of the first NMOS transistor, wherein the second PMOS drive signal is available at the drain of the second NMOS transistor, wherein the first NMOS drive signal is available at the drain of the first PMOS transistor, wherein the second NMOS drive signal is available at the drain of the second PMOS transistor.

11. An apparatus comprising:

a first switching circuit configured to receive a differential data signal and a first bias voltage, wherein the first switching circuit is configured to convert the differential data signal to a first PMOS drive signal and a second PMOS drive signal for a first PMOS driver transistor and a second PMOS driver transistor, respectively, wherein the first switching circuit is configured to change a state of the first and second PMOS drive signals in response to a change in state of the data signal, wherein a first state of the first or second PMOS drive signal turns on the corresponding PMOS driver transistor and has a voltage level of the first bias voltage, wherein a second state of the first or second PMOS drive signal turns off the corresponding PMOS driver transistor, wherein the first switching circuit comprises a first capacitor, a second capacitor, a first NMOS transistor, a second NMOS transistor, and a first enable switch, wherein sources of the first NMOS transistor and the second NMOS transistor are each electrically connected to a first node, wherein the first enable switch is configured to receive the first bias voltage and to selectively provide the first bias voltage to the first node, wherein a drain of the first NMOS transistor is electrically connected to a gate of the second NMOS transistor, wherein a drain of the second NMOS transistor is electrically connected to a gate of the first NMOS transistor, wherein the first switching circuit is configured to generate the first state of the PMOS drive signal via capacitive coupling and to generate the second state of the PMOS drive signal via a combination of capacitive coupling and turning on of at least one of the first NMOS transistor or the second NMOS transistor;

a second switching circuit configured to receive the differential data signal and a second bias voltage, wherein the second switching circuit is configured to convert the differential data signal to a first NMOS drive signal and a second NMOS drive signal for a first NMOS driver transistor and a second NMOS driver transistor, wherein the second switching circuit is configured to change a state of the NMOS drive signal in response to a change in state of the data signal, wherein a first state of the first or second NMOS drive signal turns on the corresponding NMOS driver transistor and has a voltage level of the second bias voltage, and wherein a second state of the first or second NMOS drive signal turns off the corresponding NMOS driver transistor, wherein the second switching circuit comprises a third capacitor, a fourth capacitor, a first PMOS transistor, a second PMOS transistor, and a second enable switch, wherein sources of the first PMOS transistor and the second PMOS transistor are each electrically connected to a second node, wherein the second enable switch is configured to receive the second bias voltage and to selectively provide the second bias voltage to the second node, wherein a drain of the first PMOS transistor is electrically coupled to a gate of the second PMOS transistor, wherein a drain of the second PMOS transistor is electrically coupled to a gate of the first PMOS transistor, wherein the second switching circuit is configured to generate the first state of the NMOS drive signal via capacitive coupling and to generate the second state of the NMOS drive signal via a combination of capacitive coupling and turning on of at least one of the first PMOS transistor or the second PMOS transistor;

a third NMOS transistor having a source, a gate, and a drain, wherein the source is coupled to a second power supply rail, wherein the drain is coupled to a node of the first NMOS drive signal; and

a fourth NMOS transistor having a source, a gate, and a drain, wherein the source is coupled to a second power supply rail, wherein the drain is coupled to a node of the second NMOS drive signal;

wherein the third NMOS transistor and the fourth NMOS transistor are configured to pull down the first NMOS drive signal and the second NMOS drive signal, respectively, for disabling of output drivers driven by the first NMOS drive signal and the second NMOS drive signal.

12. The apparatus of claim 11 , wherein the first state of the PMOS drive signal and the first state of the NMOS drive signal turn on the PMOS driver transistor and the NMOS driver transistor, respectively, to a triode region of operation via the first bias voltage and the second bias voltage.

13. The apparatus of claim 11 , wherein the received data signal is provided from circuits powered by a first power supply voltage rail, and wherein the PMOS driver transistor and the NMOS driver transistor are referenced to a second power supply voltage rail higher than the first power supply voltage rail.

14. The apparatus of claim 11 , further comprising a first multiplexer configured to select at least between a first signal input and a second signal input different from the first signal input by phase and/or delay to generate the differential data signal for the first switching circuit and the second switching circuit.

15. The apparatus of claim 11 , wherein the first PMOS drive signal is available at the drain of the first NMOS transistor, wherein the second PMOS drive signal is available at the drain of the second NMOS transistor, wherein the first NMOS drive signal is available at the drain of the first PMOS transistor, wherein the second NMOS drive signal is available at the drain of the second PMOS transistor.

Assignments (15)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0001 →
RELEASE OF SECURITY INTEREST Recorded Feb 25, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059333/0222 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
SECURITY INTEREST Recorded Sep 18, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 047103/0206 →
SECURITY INTEREST Recorded Jun 25, 2018
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 046426/0001 →
RELEASE OF SECURITY INTEREST Recorded May 29, 2018
From: MORGAN STANLEY SENIOR FUNDING, INC.
To: MICROSEMI STORAGE SOLUTIONS, INC.; MICROSEMI STORAGE SOLUTIONS (U.S.), INC.
Reel/Frame 046251/0271 →
CHANGE OF NAME Recorded Apr 7, 2016
From: PMC-SIERRA, INC.
To: MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 038381/0753 →
PATENT SECURITY AGREEMENT Recorded Feb 3, 2016
From: MICROSEMI STORAGE SOLUTIONS, INC. (F/K/A PMC-SIERRA, INC.); MICROSEMI STORAGE SOLUTIONS (U.S.), INC. (F/K/A PMC-SIERRA US, INC.)
To: MORGAN STANLEY SENIOR FUNDING, INC.
Reel/Frame 037689/0719 →