IP Library Granted Patent US 9,299,681
Granted Patent B2
US 9,299,681 · App. 14/569,423 · Granted Mar 29, 2016

Semiconductor device and method of manufacturing

Inventors: Eiji Hayashi (Tokyo, JP); Kyo Go (Tokyo, JP); Kozo Harada (Tokyo, JP); Shinji Baba (Tokyo, JP)
Assignee: RENESAS ELECTRONICS CORPORATION
H01L24/81H01L21/4853H01L21/563H01L21/6835H01L23/36H01L23/49811H01L23/49822H01L23/49894H01L23/562H01L24/11H01L24/16H01L24/29H01L24/32H01L24/743H05K3/4602H01L2224/11003H01L2224/131H01L2224/13099H01L2224/16225H01L2224/16227H01L2224/2919H01L2224/29111H01L2224/32225H01L2224/73203H01L2224/73204H01L2224/73253H01L2224/81193H01L2224/81205H01L2224/81801H01L2224/81909H01L2224/83102H01L2224/92125H01L2924/014H01L2924/0105H01L2924/01005H01L2924/01006H01L2924/01013H01L2924/01018H01L2924/01019H01L2924/01022H01L2924/01029H01L2924/01033H01L2924/0133H01L2924/01074H01L2924/01078H01L2924/01082H01L2924/12042H01L2924/12044H01L2924/1306H01L2924/13091H01L2924/1579H01L2924/15174H01L2924/15184H01L2924/15311H01L2924/15312H01L2924/15724H01L2924/15747H01L2924/351H05K1/0366H05K2201/029
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Quick Facts
Patent No.
US 9,299,681
App. No.
14/569,423
Granted
Mar 29, 2016
Kind
B2
Abstract

Even when a stiffener is omitted, the semiconductor device which can prevent the generation of twist and distortion of a wiring substrate is obtained. As for a semiconductor device which has a wiring substrate, a semiconductor chip by which the flip chip bond was made to the wiring substrate, and a heat spreader adhered to the back surface of the semiconductor chip, and which omitted the stiffener for reinforcing a wiring substrate and maintaining the surface smoothness of a heat spreader, a wiring substrate has a plurality of insulating substrates in which a through hole whose diameter differs, respectively was formed, and each insulating substrate contains a glass cloth.

Claims (10)

1. A method of manufacturing a semiconductor device, comprising:

(a) providing a semiconductor chip having a main surface over which a plurality of pad electrodes are formed,

wherein a plurality of metal bumps are formed on the plurality of pad electrodes, respectively;

(b) positioning the semiconductor over a first main surface of a wiring substrate such that the main surface of the semiconductor chip faces the first main surface of the wiring substrate, and contacting the plurality of metal bumps of the semiconductor chip to a plurality of solders of the wiring substrate without using a flux, respectively and scrubbing the plurality of metal bumps of the semiconductor chip and the plurality of solders of the wiring substrate with each other;

(c) after the step (b), supplying O2 plasma to the semiconductor chip and the wiring substrate; and

(d) after the step (c), injecting under-filling resin between the main surface of the semiconductor chip and the first main surface of the wiring substrate.

2. The method of manufacturing a semiconductor device according to claim 1 ,

wherein an organic resin film is formed over the main surface of the semiconductor chip and first main surface of the wiring substrate.

3. The method of manufacturing a semiconductor device according to claim 1 ,

wherein, in the step (b), the semiconductor chip is heated with a first temperature which is higher than a solder melting point, before scrubbing the plurality of metal bumps of the semiconductor chip and the plurality of solders of the wiring substrate with each other.

Assignments (1)
CHANGE OF ADDRESS Recorded Nov 29, 2017
From: RENESAS ELECTRONICS CORPORATION
To: RENESAS ELECTRONICS CORPORATION
Reel/Frame 044928/0001 →
Priority Claims (2)
JP 2005-121063 · Apr 19, 2005 · national
JP 2006-096999 · Mar 31, 2006 · national
Continuity (10)
Continuation 14338175 · Jul 22, 2014
Continuation 14044497 · Oct 2, 2013
Division 13863241 · Apr 15, 2013
Continuation 13648876 · Oct 10, 2012
Continuation 13367029 · Feb 6, 2012
Continuation 13183196 · Jul 14, 2011
Division 12753521 · Apr 2, 2010
Division 12401193 · Mar 10, 2009
Division 11406337 · Apr 19, 2006
Related Publication 20150099331A1 · Apr 9, 2015