IP Library Granted Patent US 10,852,329
Granted Patent B2
US 10,852,329 · App. 16/164,973 · Granted Dec 1, 2020

High precision current sensing using sense amplifier with digital AZ offset compensation

Inventors: Marija Fernandez (Lausanne, CH); Philippe Deval (Lutry, CH)
Assignee: MICROCHIP TECHNOLOGY INCORPORATED
G01R19/2506G01R15/146G01R19/0092H03F1/30H03F3/45071H03F3/45475G01R1/203H03F2200/375H03F2200/462H03F2200/481H03F2200/78H03F2203/45588
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Quick Facts
Patent No.
US 10,852,329
App. No.
16/164,973
Granted
Dec 1, 2020
Kind
B2
Abstract

A current sensing circuit includes a current sense amplifier and a correction circuit. The current sense amplifier has an offset voltage. The correction circuit is configured to evaluate the offset voltage of the current sense amplifier. The correction circuit is further configured to issue a correction signal to the current sense amplifier based upon the evaluated offset voltage. The correction signal is to adjust the offset voltage.

Claims (35)

1. A current sensing circuit, comprising:

a current sense amplifier; and

a correction circuit configured to:

evaluate an offset voltage of the current sense amplifier;

issue a correction signal to the current sense amplifier based upon the evaluated offset voltage; and

use a comparator connected to the inputs of the sense amplifier to control a digital integrator configured to generate the correction signal.

2. The current sensing circuit of claim 1 , wherein the correction circuit is further configured to evaluate the offset voltage and issue the correction signal continuously.

3. The current sensing circuit of claim 1 , wherein the correction circuit is further configured to use the comparator and the digital integrator to generate the correction signal as an input of a digital to analog converter (DAC).

4. The current sensing circuit of claim 3 , wherein the correction circuit is further configured to use the DAC to close a feedback loop of digital Auto-Zero compensation of the current sense amplifier.

5. The current sensing circuit of claim 1 , wherein the correction circuit is further configured to convert the offset voltage to the correction signal continuously in order to prevent degradation due to a temperature drift of an offset compensation.

6. The current sensing circuit of claim 1 , wherein the current sensing circuit has a shunt resistor topology.

7. The current sensing circuit of claim 1 , wherein the current sensing circuit has a sensing FET transistor topology.

8. The current sensing circuit of claim 1 , wherein the correction circuit is further configured to issue the correction signal to auxiliary inputs of the current sense amplifier, the auxiliary inputs separate from inverting input, non-inverting input, and power supply inputs of the current sense amplifier.

9. The current sensing circuit of claim 1 , wherein the correction circuit is further configured to determine the correction signal to be issued to the current sense amplifier while the current sensing circuit is configured to measure current across an external load connected to the current sensing circuit.

10. The current sensing circuit of claim 1 , wherein the digital integrator and the sensing amplifier are separate.

11. A system, comprising:

a current sense amplifier; and

a correction circuit configured to:

evaluate an offset voltage of the current sense amplifier;

issue a correction signal to the current sense amplifier based upon the evaluated offset voltage; and

use a comparator connected to the inputs of the sense amplifier to control a digital integrator configured to generate the correction signal.

12. The system of claim 11 , wherein the correction circuit is further configured to evaluate the offset voltage and issue the correction signal continuously.

13. The system of claim 11 , wherein the correction circuit is further configured to use the comparator and the digital integrator to generate the correction signal as an input of a digital to analog converter (DAC).

14. A method of sensing current, comprising:

operating a current sense amplifier; and

with a correction circuit:

evaluate an offset voltage of the current sense amplifier;

issue a correction signal to the current sense amplifier based upon the evaluated offset voltage; and

use a comparator connected to the inputs of the sense amplifier to control a digital integrator configured to generate the correction signal.

15. The method of claim 14 , further comprising, with the correction circuit, evaluating the offset voltage and issue the correction signal continuously.

16. The method of claim 14 , further comprising using the comparator and the digital integrator to generate the correction signal as an input of a digital to analog converter (DAC).

17. The method of claim 16 , further comprising using the DAC to close a feedback loop of digital Auto-Zero compensation of the current sense amplifier.

18. The method of claim 14 , further comprising, with the correction circuit, converting the offset voltage to the correction signal continuously in order to prevent degradation due to a temperature drift of an offset compensation.

19. The method of claim 14 , further comprising, with the correction circuit, sensing current from a shunt resistor topology.

20. The method of claim 14 , further comprising, with the correction circuit, sensing current from a sensing FET transistor topology.

Assignments (16)
RELEASE OF SECURITY INTEREST Recorded Mar 14, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 060894/0437 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0335 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059357/0823 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059264/0384 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059263/0001 →
GRANT OF SECURITY INTEREST IN PATENT RIGHTS Recorded Nov 19, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 058214/0380 →
GRANT OF SECURITY INTEREST IN PATENT RIGHTS Recorded Nov 19, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 058214/0625 →
GRANT OF SECURITY INTEREST IN PATENT RIGHTS Recorded Nov 19, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 058214/0238 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 052856/0909 →
SECURITY INTEREST Recorded Jun 5, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION
Reel/Frame 053468/0705 →
RELEASE OF SECURITY INTEREST Recorded May 30, 2020
From: JPMORGAN CHASE BANK, N.A, AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 053466/0011 →
SECURITY INTEREST Recorded Apr 24, 2020
From: MICROCHIP TECHNOLOGY INC.; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 053311/0305 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Oct 19, 2018
From: FERNANDEZ, MARIJA; DEVAL, PHILIPPE
To: MICROCHIP TECHNOLOGY INCORPORATED
Reel/Frame 047274/0209 →