IP Library Granted Patent US 11,845,157
Granted Patent B2
US 11,845,157 · App. 16/868,965 · Granted Dec 19, 2023

Chemical mechanical planarization pads via vat-based production

Inventors: Eric S. Moyer (Aurora, IL); Lin Fu (Rancho Palos Verdes, CA); William Michael Spitzig (Lake Oswego, OR); Chen-Chih Tsai (Naperville, IL); Ping Huang (Beaverton, OR); Justin Stewart (Aurora, IL); Carlos Barros (West Chicago, IL)
Assignee: CMC MATERIALS, INC.
B24B37/26B24B37/22B24B37/24B33Y10/00B33Y30/00B33Y80/00C08L75/04
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Quick Facts
Patent No.
US 11,845,157
App. No.
16/868,965
Granted
Dec 19, 2023
Kind
B2
Abstract

A chemical mechanical polishing (CMP) pad includes a polishing portion formed using a vat-based additive manufacturing process. The polishing portion includes a polymer material with a first elastic modulus. In some embodiments the polishing portion is disposed on the backing portion. The backing portion may have a second elastic modulus. The second elastic modulus may be less than the first elastic modulus.

Claims (16)

1. A method of making a chemical mechanical polishing pad, the method comprising:

providing a precursor to a first vat of a first additive manufacturing apparatus; and

preparing at least a portion of the chemical mechanical polishing pad via a layer-by-layer process by exposing the precursor to patterned light, the prepared portion comprising a polymer material with a first elastic modulus, wherein:

the prepared portion is a backing portion of the chemical mechanical polishing pad; and

the method further comprises:

removing the backing portion from the first vat;

affixing the backing portion to a surface within a second vat of a second additive manufacturing apparatus;

providing a second precursor to the second vat of the second additive manufacturing apparatus; and

preparing a polishing portion of the chemical mechanical polishing pad by exposing the second precursor to patterned light, the prepared polishing portion comprising a polymer material with a second elastic modulus, wherein the first elastic modulus is less than the second elastic modulus.

2. The method of claim 1 , wherein the precursor comprises a resin and one or both of a porogen and a crosslinking agent.

3. The method of claim 2 , wherein the resin is one component of a multiple component dual cure resin.

4. The method of claim 2 , wherein a concentration of the porogen is in a range from one to thirty percent by weight.

5. The method of claim 2 , wherein the crosslinking agent is an isocyanate compound.

6. The method of claim 1 , wherein the backing portion comprises at least one of a nonporous layer, a porous layer, or a lattice structure.

7. The method of claim 1 , wherein the polishing portion comprises a polishing surface, the polishing surface comprising at least one of grooves, pores, or a microstructure.

8. The method of claim 1 , wherein a density of the polishing portion is in a range from 0.3 to 0.9 grams per centimeter cubed.

Assignments (7)
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
SECURITY AGREEMENT Recorded Jul 2, 2021
From: CMC MATERIALS, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 056752/0645 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 18, 2020
From: MOYER, ERIC S.; FU, LIN; SPITZIG, WILLIAM MICHAEL; TSAI, CHEN-CHIH; HUANG, PING; STEWART, JUSTIN; BARROS, CARLOS
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 054408/0673 →