IP Library Granted Patent US 11,270,980
Granted Patent B2
US 11,270,980 · App. 16/916,979 · Granted Mar 8, 2022

Memory device

Inventors: Masayoshi Tagami (Kuwana, JP); Ryota Katsumata (Yokkaichi, JP); Jun Iijima (Yokkaichi, JP); Tetsuya Shimizu (Yokkaichi, JP); Takamasa Usui (Yokkaichi, JP); Genki Fujita (Yokkaichi, JP)
Assignee: KIOXIA CORPORATION
H01L25/0657H01L24/08H01L25/50H01L27/1157H01L27/11519H01L27/11556H01L27/11565H01L27/11573H01L27/11575H01L27/11582H01L24/05H01L2224/0401H01L2224/05025H01L2224/05147H01L2224/05571H01L2224/08146H01L2225/06544H01L2225/06565
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Quick Facts
Patent No.
US 11,270,980
App. No.
16/916,979
Granted
Mar 8, 2022
Kind
B2
Abstract

A memory device includes a first memory cell array, a second memory cell array disposed in a first direction with respect to the first memory cell array, a first contact plug extending in the first direction through the first memory cell array, and a second contact plug extending in the first direction through the second memory cell array. The first memory cell array includes first electrode layers stacked in a first direction, and a first semiconductor pillar extending through the first electrode layers in the first direction. The second memory cell array including second electrode layers stacked in the first direction, and a second semiconductor pillar extending in the first direction through the second electrode layers. The first contact plug is electrically connected to the first semiconductor pillar, and the second contact plug is electrically connected to the second semiconductor pillar and the first contact plug.

Claims (45)

1. A memory device comprising:

a first memory cell array including a plurality of first electrode layers, a first conductive layer, and a first semiconductor pillar,

the first electrode layers being stacked in a first direction,

the first conductive layer being provided above the first electrode layers in the first direction,

the first semiconductor pillar extending through the first electrode layers in the first direction, the first semiconductor pillar being connected to the first conductive layer;

a first contact plug extending in the first direction through the first electrode layers, the first contact plug being connected to the first conductive layer;

a second memory cell array provided above the first memory cell array in the first direction, the second memory cell array including a plurality of second electrode layers, a second conductive layer, and a second semiconductor pillar,

the second electrode layers being stacked in the first direction,

the second conductive layer being provided above the second electrode layers in the first direction,

the second semiconductor pillar extending in the first direction through the second electrode layers, the second semiconductor pillar being connected to the second conductive layer;

a second contact plug extending in the first direction through the second electrode layers, the second contact plug being connected to the second conductive layer; and

a connection metal provided between the first and second memory cell arrays, the connection metal electrically connecting the first contact plug and the second conductive layer.

2. The device according to claim 1 , wherein

the first memory cell array includes first memory cells provided respectively between each of the first electrode layers and the first semiconductor pillar, and

the second memory cell array includes second memory cells provided respectively between each of the second electrode layers and the second semiconductor pillar.

3. The device according to claim 1 , wherein

the first memory cell array further includes a first interconnection electrically connected to the first semiconductor pillar, the first semiconductor pillar having a first end and a second end opposite to the first end, the first end being connected to the first conductive layer, the second end being electrically connected to the first interconnection, and

the second memory cell array further includes a second interconnection electrically connected to the second semiconductor pillar, the second semiconductor pillar having a third end and a fourth end opposite to the third end, the third end being connected to the second conductive layer, the fourth end being electrically connected to the second interconnection.

4. The device according to claim 1 , wherein

the first contact plug is electrically insulated from the first electrode layers by a first insulating film, and

the second contact plug is electrically insulated from the second electrode layers by a second insulating film.

5. The device according to claim 1 , wherein

the first memory cell array includes a first memory film provided between the first semiconductor pillar and the first electrode layers, and

the second memory cell array includes a second memory film provided between the second semiconductor pillar and the first electrode layers.

6. The device according to claim 1 , wherein

the first and second conductive layers each include a metal layer and a semiconductor layer stacked in the first direction, and

the first and second semiconductor pillars each are connected to the semiconductor layer.

7. The device according to claim 1 , wherein

the connection metal electrically connects the first contact plug and the second contact plug.

8. The device according to claim 1 , wherein

the connection metal is provided between the first contact plug and the second contact plug.

9. The device according to claim 1 , wherein

the first memory cell array further includes a plurality of other first electrode layers stacked in the first direction, the first electrode layers and the other first electrode layers being arranged in a second direction crossing the first direction, and

the first contact plug is provided between the first electrode layers and the other first electrode layers.

10. The device according to claim 9 , wherein

the second memory cell array further includes a plurality of other second electrode layers stacked in the first direction, the second electrode layers and the other second electrode layers being arranged in the second direction, and

the second contact plug is provided between the second electrode layers and the other second electrode layers.

11. The device according to claim 1 , further comprising:

a circuit driving the first memory cell array and the second memory cell array, wherein the first memory cell array is provided between the second memory cell array and the circuit.

12. The device according to claim 11 , further comprising:

a connecting conductor provided in a periphery around the first memory cell array and the second memory cell array, the connecting conductor electrically connecting the circuit and the first and second memory cell arrays.

13. The device according to claim 12 , wherein

the connecting conductor electrically connects one of the first electrode layers and one of the second electrode layers to the circuit.

14. The device according to claim 13 , wherein

the connecting conductor includes first and second conductive parts, the first conductive part being electrically connected to one of the first electrode layers in a periphery around the first memory cell array, the second conductive part being electrically connected to the one of the second electrode layers in a periphery around the second memory cell array.

Assignments (2)
MERGER AND CHANGE OF NAME Recorded Jan 7, 2022
From: TOSHIBA MEMORY CORPORATION; K.K. PANGEA
To: TOSHIBA MEMORY CORPORATION
Reel/Frame 058664/0198 →
CHANGE OF NAME Recorded Jan 7, 2022
From: TOSHIBA MEMORY CORPORATION
To: KIOXIA CORPORATION
Reel/Frame 058664/0544 →
Priority Claims (1)
JP 2017-042675 · Mar 7, 2017 · national
Continuity (3)
Continuation 16390639 · Apr 22, 2019
Continuation 15706017 · Sep 15, 2017
Related Publication 20200350291A1 · Nov 5, 2020
Cited By (1)
US 12,272,676