IP Library Granted Patent US 11,845,156
Granted Patent B2
US 11,845,156 · App. 16/923,688 · Granted Dec 19, 2023

Polishing pad employing polyamine and cyclohexanedimethanol curatives

Inventors: Rui Ma (Aurora, IL); Lin Fu (Rancho Palos Verdes, CA); Chen-Chih Tsai (Naperville, IL); Jaeseok Lee (Beaverton, OR); Sarah Brosnan (St. Charles, IL)
Assignee: CMC MATERIALS, INC.
B24B37/24
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Quick Facts
Patent No.
US 11,845,156
App. No.
16/923,688
Granted
Dec 19, 2023
Kind
B2
Abstract

A chemical-mechanical polishing pad comprising a thermosetting polyurethane polishing layer includes an isocyanate-terminated urethane prepolymer, a polyamine curative, and a cyclohexanedimethanol curative. The polyamine curative and the cyclohexanedimethanol curative are in a molar ratio of polyamine curative to cyclohexanedimethanol curative in a range from about 20:1 to about 1:1.

Claims (49)

1. A chemical-mechanical polishing pad comprising a thermosetting polyurethane polishing layer, the thermosetting polishing layer comprising:

an isocyanate-terminated urethane prepolymer;

a polyamine curative; and

a cyclohexanedimethanol curative;

wherein the polyamine curative and the cyclohexanedimethanol curative are in a molar ratio of polyamine curative to cyclohexanedimethanol curative in a range from about 20:1 to about 1:1.

2. The polishing pad of claim 1 , wherein the prepolymer is a reaction product of a toluene diisocyante (TDI) compound or a methylenediphenyl diisocyanate (MDI) compound and polytetramethylene ether glycol (PTMEG) or polypropylene ether glycol.

3. The polishing pad of claim 1 , wherein the prepolymer is an aromatic prepolymer selected from the group consisting of 75D prepolymers, 80D prepolymers, and mixtures thereof.

4. The polishing pad of claim 1 , wherein the polyamine curative is an aromatic diamine curative selected from the group consisting of aniline diamine compounds, toluene diamine compounds, aminobenzoate compounds, and mixtures thereof.

5. The polishing pad of claim 4 , wherein the aromatic diamine curative is selected from the group consisting of 4,4-methylenebis(2chloroaniline), dimethylthiotoluenediamine, and mixtures thereof.

6. The polishing pad of claim 1 , wherein the molar ratio of polyamine curative to cyclohexanedimethanol curative is in a range from about 10:1 to about 1.5:1.

7. The polishing pad of claim 1 , wherein the thermosetting polyurethane polishing layer comprises surface asperities and wherein the surface asperities have a ratio of a storage modulus at 25 degrees C. to a storage modulus at 75 degrees C. in a range from about 3 to about 20.

8. The polishing pad of claim 7 , wherein:

the isocyanate-terminated urethane prepolymer includes a 75D prepolymer; and

the surface asperities have a storage modulus (E′) at 25 degrees C. greater than about 500 MPa and a Shore D hardness at 25 degrees C. greater than about 60.

9. The polishing pad of claim 8 , wherein the surface asperities have a tensile toughness at 25 degrees C. greater than about 100 MPa.

10. The polishing pad of claim 7 , wherein:

the isocyanate-terminated urethane prepolymer includes an 80D prepolymer; and

the surface asperities have a storage modulus (E′) at 25 degrees C. greater than about 1000 MPa and a Shore D hardness at 25 degrees C. greater than about 70.

11. The polishing pad of claim 10 , wherein the surface asperities have a tensile toughness at 25 degrees C. greater than about 50 MPa.

12. The polishing pad of claim 1 , wherein the thermosetting polyurethane polishing layer further comprises a sufficient quantity of hollow microspheres such that the thermosetting polyurethane polishing layer has a porosity in a range from about 10 to about 50 percent.

13. The polishing pad of claim 1 , wherein:

the prepolymer is an aromatic prepolymer selected from the group consisting of 75D prepolymers, 80D prepolymers, and mixtures thereof;

the polyamine curative is an aromatic diamine curative selected from the group consisting of 4,4-methylenebis(2chloroaniline), dimethylthiotoluenediamine, and mixtures thereof; and

the molar ratio of polyamine curative to cyclohexanedimethanol curative is in a range from about 10:1 to about 1.5:1.

14. The polishing pad of claim 1 , wherein the thermosetting polyurethane polishing layer is adhered to a sub-pad.

15. A chemical-mechanical polishing pad comprising a thermosetting polyurethane polymer polishing layer, the thermosetting polishing layer comprising:

an isocyanate-terminated urethane prepolymer; and

a curative mixture comprising a polyamine curative and a cyclohexanedimethanol curative, wherein the curative mixture comprises from about 5 to about 50 mole percent of the cyclohexanedimethanol curative.

16. The polishing pad of claim 15 , wherein the prepolymer is a reaction product of a toluene diisocyante (TDI) compound or a methylenediphenyl diisocyanate (MDI) compound and polytetramethylene ether glycol (PTMEG) or polypropylene ether glycol.

17. The polishing pad of claim 15 , wherein the prepolymer is an aromatic prepolymer selected from the group consisting of 75D prepolymers, 80D prepolymers, and mixtures thereof.

18. The polishing pad of claim 15 , wherein the polyamine curative is an aromatic diamine curative selected from the group consisting of aniline diamine compounds, toluene diamine compounds, aminobenzoate compounds, and mixtures thereof.

19. The polishing pad of claim 18 , wherein the aromatic diamine curative is selected from the group consisting of 4,4-methylenebis(2chloroaniline), dimethylthiotoluenediamine, and mixtures thereof.

20. The polishing pad of claim 15 , wherein the curative mixture comprises from about 10 to about 40 weight percent of the cyclohexanedimethanol curative.

21. The polishing pad of claim 15 , wherein the curative mixture consists of the polyamine curative and the cyclohexanedimethanol curative.

22. The polishing pad of claim 15 , wherein the thermosetting polyurethane polishing layer comprises surface asperities and wherein the surface asperities have a ratio of a storage modulus at 25 degrees C. to a storage modulus at 75 degrees C. in a range from about 3 to about 20.

23. The polishing pad of claim 22 , wherein:

the isocyanate-terminated urethane prepolymer includes a 75D prepolymer; and

the surface asperities have a storage modulus (E′) at 25 degrees C. greater than about 500 MPa and a Shore D hardness at 25 degrees C. greater than about 60.

24. The polishing pad of claim 23 , wherein the surface asperities have a tensile toughness at 25 degrees C. greater than about 100 MPa.

25. The polishing pad of claim 22 , wherein:

the isocyanate-terminated urethane prepolymer includes an 80D prepolymer; and

the surface asperities have a storage modulus (E′) at 25 degrees C. greater than about 1000 MPa and a Shore D hardness at 25 degrees C. greater than about 70.

26. The polishing pad of claim 25 , wherein the surface asperities have a tensile toughness at 25 degrees C. greater than about 50 MPa.

27. The polishing pad of claim 15 , wherein the thermosetting polyurethane polishing layer further comprises a sufficient quantity of hollow microspheres such that the thermosetting polyurethane polishing layer has a porosity in a range from about 10 to about 50 percent.

28. The polishing pad of claim 15 , wherein:

the prepolymer is an aromatic prepolymer selected from the group consisting of 75D prepolymers, 80D prepolymers, and mixtures thereof;

the polyamine curative is an aromatic diamine curative selected from the group consisting of 4,4-methylenebis(2chloroaniline), dimethylthiotoluenediamine, and mixtures thereof; and

the curative mixture comprises from about 10 to about 40 weight percent of the cyclohexanedimethanol curative.

29. The polishing pad of claim 15 , wherein the thermosetting polyurethane polishing layer is adhered to a sub-pad.

Assignments (7)
CHANGE OF NAME Recorded Nov 8, 2023
From: CMC MATERIALS, INC.
To: CMC MATERIALS LLC
Reel/Frame 065517/0783 →
SECURITY INTEREST Recorded Jul 8, 2022
From: ENTEGRIS, INC.; ENTEGRIS GP, INC.; POCO GRAPHITE, INC.; CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: TRUIST BANK, AS NOTES COLLATERAL AGENT
Reel/Frame 060613/0072 →
SECURITY INTEREST Recorded Jul 8, 2022
From: CMC MATERIALS, INC.; INTERNATIONAL TEST SOLUTIONS, LLC; QED TECHNOLOGIES INTERNATIONAL, INC.
To: MORGAN STANLEY SENIOR FUNDING, INC., AS COLLATERAL AGENT
Reel/Frame 060615/0001 →
RELEASE OF SECURITY INTEREST Recorded Jul 6, 2022
From: JPMORGAN CHASE BANK, N.A.
To: CABOT MICROELECTRONICS CORPORATION; QED TECHNOLOGIES INTERNATIONAL, INC.; FLOWCHEM LLC; KMG ELECTRONIC CHEMICALS, INC.; KMG-BERNUTH, INC.; MPOWER SPECIALTY CHEMICALS LLC; SEALWELD (USA), INC.; INTERNATIONAL TEST SOLUTIONS, LLC; CMC MATERIALS, INC.
Reel/Frame 060592/0260 →
SECURITY AGREEMENT Recorded Jul 2, 2021
From: CMC MATERIALS, INC.
To: JPMORGAN CHASE BANK, N.A.
Reel/Frame 056752/0645 →
CHANGE OF NAME Recorded Jan 13, 2021
From: CABOT MICROELECTRONICS CORPORATION
To: CMC MATERIALS, INC.
Reel/Frame 054980/0681 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jul 8, 2020
From: MA, RUI; FU, LIN; TSAI, CHEN-CHIH; LEE, JAESEOK; BROSNAN, SARAH
To: CABOT MICROELECTRONICS CORPORATION
Reel/Frame 053152/0657 →