IP Library Granted Patent US 11,301,080
Granted Patent B2
US 11,301,080 · App. 16/948,270 · Granted Apr 12, 2022

Techniques for routing signals using inactive sensor regions of touch sensors and related systems and devices

Inventors: Rob Ann Beuker (Southampton, GB); Mark Cheng (Keelung, TW); Yona Tsai (New Taipei, TW); Samuel Daniel Brunet (North Boarhunt, GB)
Assignee: Atmel Corporation
G06F3/04164
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Quick Facts
Patent No.
US 11,301,080
App. No.
16/948,270
Granted
Apr 12, 2022
Kind
B2
Abstract

A sensor region of a touch sensor may include active and inactive sensor regions. The inactive sensor regions may include one or more routing connectors electrically connected to the active sensor regions, electrically connected to connection forming elements, and/or electrically connected to tracking lines. System and touch displays may include touch sensors with such sensor regions.

Claims (51)

1. A touch sensor, comprising:

a support structure;

a first connection forming element positioned on a surface of the support structure; and

a sensor region comprising:

a first active sensor region;

a first inactive sensor region;

a first routing connector of the first inactive sensor region, the first routing connector comprising a first number of continuously electrically connected inactive sensor nodes, the first routing connector electrically connected to the first active sensor region and electrically connected to the first connection forming element;

a second active sensor region, the first inactive sensor region interposed between the first active sensor region and the second active sensor region; and

a second routing connector of the first inactive sensor region, the second routing connector comprising a second number of continuously electrically connected inactive sensor nodes, the second routing connector electrically connected to the second active sensor region and electrically connected to the first connection forming element.

2. The touch sensor of claim 1 , wherein the first active sensor region comprises active sensor nodes.

3. The touch sensor of claim 1 , wherein the first active sensor region comprises a sensor line.

4. The touch sensor of claim 3 , wherein a first end of the sensor line is electrically connected to the first routing connector.

5. The touch sensor of claim 4 , wherein a second end of the sensor line is electrically connected to a tracking line.

6. The touch sensor of claim 4 , wherein a second end of the sensor line is directly electrically connected to another routing connector of a second inactive sensor region.

7. The touch sensor of claim 2 , wherein the sensor region comprises:

first electrical conductors arranged in a first direction; and

second electrical conductors arranged in a second direction, the second direction transverse to the first direction;

each of the active sensor nodes comprising: two electrically connected first electrical conductors, and two electrically connected second electrical conductors; and

each of the inactive sensor nodes comprising only one of: (i) two electrically connected first electrical conductors, or (ii) two electrically connected second electrical conductors.

8. The touch sensor of claim 1 , further comprising:

an electrical connector electrically connected to an end of the first routing connector, the end of the first routing connector located at a periphery of the first inactive sensor region, and electrically connected to the first connection forming element.

9. The touch sensor of claim 1 , further comprising:

one or more tracking lines arranged along at least a portion of a periphery of the first active sensor region; and

wherein the one or more tracking lines are electrically connected to the first active sensor region and electrically connected to the first connection forming element.

10. A touch sensing system, comprising:

a touch sensor comprising:

a support structure;

a connection forming element positioned on a surface of the support structure; and

a sensor region comprising:

a first active sensor region;

a first inactive sensor region;

a first routing connector of the first inactive sensor region, the first routing connector comprising a first number of continuously electrically connected inactive sensor nodes, the first routing connector electrically connected to the first active sensor region and electrically connected to the connection forming element;

a second active sensor region, the first inactive sensor region interposed between the first active sensor region and the second active sensor region; and

a second routing connector of the first inactive sensor region, the second routing connector comprising a second number of continuously electrically connected inactive sensor nodes, the second routing connector electrically connected to the second active sensor region and electrically connected to the first connection forming element; and

a touch controller, wherein an input or an output of the touch controller is electrically connected to the connection forming element.

11. The touch sensing system of claim 10 , wherein the input or the output of the touch controller is electrically connected to the connection forming element by a flex circuit or a connector of a printed circuit board.

12. The touch sensing system of claim 11 , wherein the input or the output of the touch controller is electrically connected to the connection forming element by a flex circuit and a printed circuit board.

13. A sensor region of a capacitive touch sensor, the sensor region comprising:

first electrical conductors arranged in a first direction;

second electrical conductors arranged in a second direction, the second direction transverse to the first direction;

a first active sensor node in a first, active sensor region, the first active sensor node comprising: two electrically connected first electrical conductors, and two electrically connected second electrical conductors;

a first inactive sensor node in a first inactive sensor region the first inactive sensor node comprising a group of electrically connected electrical conductors, the group of electrically connected electrical conductors comprising one and only one of: (i) two or more electrically connected first electrical conductors, or (ii) two or more electrically connected second electrical conductors;

a second active sensor node in a second active sensor region the first inactive sensor region interposed between the first active sensor region and the second active sensor region, the second active sensor node comprising: two electrically connected first electrical conductors, and two electrically connected second electrical conductors;

a first routing connector of the first inactive sensor region, the first routing connector comprising a first number of continuously electrically connected inactive sensor nodes the first routing connector electrically connected to the active sensor region and electrically connected to a connection forming element; and

a second routing connector of the first inactive sensor region, the second routing connector comprising a second number of continuously electrically connected inactive sensor nodes, the second routing connector electrically connected to the second active sensor region and electrically connected to the first connection forming element.

14. The sensor region of claim 13 , wherein a first one of the first electrical conductors is electrically connected to:

a second one of the first electrical conductors; and

a first one of the second electrical conductors,

wherein the second one of the first electrical conductors and the first one of the second electrical conductors are within the first inactive sensor region comprising the first inactive sensor node.

15. The sensor region of claim 13 , further comprising a second inactive sensor node comprising a group of electrically-isolated electrical conductors, the group of electrically-isolated electrical conductors comprising another number of the first electrical conductors and another number of the second electrical conductors.

16. The sensor region of claim 13 , wherein the sensor region is one of a number of sensor regions of the capacitive touch sensor.

Assignments (12)
RELEASE OF SECURITY INTEREST Recorded Mar 11, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059363/0001 →
RELEASE OF SECURITY INTEREST Recorded Mar 10, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059863/0400 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059357/0823 →
RELEASE OF SECURITY INTEREST Recorded Mar 9, 2022
From: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059358/0335 →
RELEASE OF SECURITY INTEREST Recorded Feb 28, 2022
From: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
To: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
Reel/Frame 059264/0384 →
GRANT OF SECURITY INTEREST IN PATENT RIGHTS Recorded Nov 19, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 058214/0238 →
GRANT OF SECURITY INTEREST IN PATENT RIGHTS Recorded Nov 19, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 058214/0625 →
GRANT OF SECURITY INTEREST IN PATENT RIGHTS Recorded Nov 19, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: JPMORGAN CHASE BANK, N.A., AS ADMINISTRATIVE AGENT
Reel/Frame 058214/0380 →
SECURITY INTEREST Recorded Jun 4, 2021
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS NOTES COLLATERAL AGENT
Reel/Frame 057935/0474 →
SECURITY INTEREST Recorded Dec 24, 2020
From: MICROCHIP TECHNOLOGY INCORPORATED; SILICON STORAGE TECHNOLOGY, INC.; ATMEL CORPORATION; MICROSEMI CORPORATION; MICROSEMI STORAGE SOLUTIONS, INC.
To: WELLS FARGO BANK, NATIONAL ASSOCIATION, AS COLLATERAL AGENT
Reel/Frame 055671/0612 →
CONFIRMATORY ASSIGNMENT Recorded Sep 18, 2020
From: ATMEL TECHNOLOGIES U.K. LIMITED
To: ATMEL CORPORATION
Reel/Frame 053814/0996 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 18, 2020
From: BEUKER, ROB ANN; CHENG, MARK; TSAI, YONA; BRUNET, SAMUEL DANIEL
To: ATMEL TECHNOLOGIES U.K. LIMITED
Reel/Frame 053819/0791 →