IP Library › Granted Patent US 12,519,067
Granted Patent B2
US 12,519,067 · App. 17/895,306 · Granted Jan 6, 2026

Two-piece type stiffener structure with beveled surface for delamination reduction and methods for forming the same

Inventors: Chia-Kuei Hsu (Hsinchu, TW); Ming-Chih Yew (Hsinchu, TW); Li-Ling Liao (Hsinchu, TW); Shin-Puu Jeng (Po-Shan Village, TW)
Assignee: Taiwan Semiconductor Manufacturing Company Limited
H01L23/562H01L23/49816H01L23/49833H01L23/49838H01L24/16H01L24/32H01L24/73H01L24/96H01L24/97H01L25/0652H01L23/49822H01L2224/16145H01L2224/16227H01L2224/16238H01L2224/32225H01L2224/73204H01L2224/95001H01L2924/1432H01L2924/1437H01L2924/3511H01L2924/35121
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Quick Facts
Patent No.
US 12,519,067
App. No.
17/895,306
Granted
Jan 6, 2026
Kind
B2
Abstract

Devices and methods for forming a chip package structure including a package substrate, a first adhesive layer attached to a top surface of the package substrate, and a beveled stiffener structure attached to the package substrate. The beveled stiffener structure may include a bottom portion including a tapered top surface, in which a bottom surface of the bottom portion is in contact with the first adhesive layer, a second adhesive layer attached to the tapered top surface, and a top portion including a tapered bottom surface, in which the tapered bottom surface is in contact with the second adhesive layer. The tapered top surface and the tapered bottom surface have a taper angle between 5 degrees and 60 degrees with respect to a top surface of the package substrate.

Claims (58)

1 . A method of forming a chip package structure, comprising:

forming a package substrate;

forming a first adhesive layer attached to a top surface of the package substrate; and

forming, on a top surface of the first adhesive layer, a stiffener structure including a bottom portion with a tapered top surface, a second adhesive layer attached to the tapered top surface, and a top portion with a tapered bottom surface that is in contact with the second adhesive layer, wherein forming the stiffener structure comprises:

attaching a bottom surface of the bottom portion to the top surface of the first adhesive layer, wherein a bottom portion inner sidewall is proximate to the fan-out package and a bottom portion outer sidewall is distal from the fan-out package; and

attaching the tapered bottom surface to the top surface of the second adhesive layer, wherein a top portion inner sidewall is in a same vertical plane as the bottom portion inner sidewall and a top portion outer sidewall is in a same vertical plane as the bottom portion outer sidewall.

2 . The method of claim 1 , further comprising:

forming a fan-out package on top of the package substrate;

wherein forming, on the top surface of the first adhesive layer, the stiffener structure further comprises:

beveling the bottom portion to have the tapered top surface, the bottom portion inner sidewall, and the bottom portion outer sidewall;

depositing the second adhesive layer on the tapered top surface; and

beveling the top portion to have the tapered bottom surface, the top portion inner sidewall, and the top portion outer sidewall.

3 . The method of claim 1 , further comprising:

forming a fan-out package on top of the package substrate;

wherein forming, on the top surface of the first adhesive layer, the stiffener structure further comprises:

beveling the bottom portion to have the tapered top surface, the bottom portion inner sidewall, and the bottom portion outer sidewall;

depositing the second adhesive layer on the tapered top surface; and

beveling the top portion to have the tapered bottom surface, the top portion inner sidewall, and the top portion outer sidewall;

attaching the bottom surface of the bottom portion to the top surface of the first adhesive layer, such that the top portion inner sidewall is proximate to the fan-out package and the top portion outer sidewall is distal from the fan-out package.

4 . The method of claim 1 , wherein the tapered top surface and the tapered bottom surface have a taper angle in a range between 5 degrees and 60 degrees with respect to a top surface of the package substrate.

5 . The method of claim 1 , wherein a coefficient of thermal expansion (CTE) of the bottom portion is different than a CTE of the top portion.

6 . The method of claim 1 , wherein the tapered top surface has an extruded portion, and the tapered bottom surface has a receptive portion.

7 . The method of claim 1 , wherein the tapered bottom surface has an extruded portion, and the tapered top surface has a receptive portion.

8 . The method of claim 1 , further comprising depositing a thermal interface material on a top surface of a fan-out package surrounded by the beveled stiffener structure.

9 . The method of claim 8 , further comprising forming a lid portion having a bottom surface that is in contact with a top surface of the thermal interface material.

10 . A method of forming a chip package structure, comprising:

forming a package substrate;

forming a fan-out package on a portion of a top of the package substrate;

forming a first adhesive layer on a second portion on the top surface of the package substrate; and

forming a stiffener structure on a top surface of the first adhesive layer, comprising:

beveling a bottom portion to have a tapered top surface, a bottom portion inner sidewall, and a bottom portion outer sidewall;

attaching a bottom surface of the bottom portion to the top surface of the first adhesive layer, wherein the bottom portion inner sidewall is proximate to the fan-out package and the bottom portion outer sidewall is distal from the fan-out package;

depositing a second adhesive layer on the tapered top surface;

beveling a top portion to have a tapered bottom surface, a top portion inner sidewall, and a top portion outer sidewall; and

attaching the tapered bottom surface to the top surface of the second adhesive layer, wherein the top portion inner sidewall is in a same vertical plane as the bottom portion inner sidewall and the top portion outer sidewall is in a same vertical plane as the bottom portion outer sidewall.

11 . The method of claim 10 , wherein the tapered top surface and the tapered bottom surface have a taper angle in a range between 5 degrees and 60 degrees with respect to a top surface of the package substrate.

12 . The method of claim 10 , further comprising:

depositing a thermal interface material on a top surface of a fan-out package surrounded by the beveled stiffener structure; and

forming a lid portion having a bottom surface that is in contact with a top surface of the thermal interface material.

13 . The method of claim 10 , wherein a height of the bottom portion inner sidewall is greater than a height of the bottom portion outer sidewall and a height of the top portion inner sidewall is less than a height of the top portion outer sidewall.

14 . The method of claim 10 , wherein a height of the bottom portion inner sidewall is less than a height of the bottom portion outer sidewall and a height of the top portion inner sidewall is greater than a height of the top portion outer sidewall.

15 . A method of forming a chip package structure, comprising:

forming a package substrate;

forming a fan-out package on a portion of a top of the package substrate;

forming a first adhesive layer on a second portion on the top surface of the package substrate; and

forming a stiffener structure on a top surface of the first adhesive layer, comprising:

beveling a bottom portion to have a tapered top surface, a bottom portion inner sidewall, and a bottom portion outer sidewall;

depositing a second adhesive layer on the tapered top surface;

beveling a top portion to have a tapered bottom surface, a top portion inner sidewall, and a top portion outer sidewall;

attaching the tapered bottom surface to the top surface of the second adhesive layer, wherein the top portion inner sidewall is in a same vertical plane as the bottom portion inner sidewall and the top portion outer sidewall is in a same vertical plane as the bottom portion outer sidewall; and

attaching a bottom surface of the bottom portion to the top surface of the first adhesive layer, wherein the bottom portion inner sidewall and top portion inner sidewall are proximate to the fan-out package and the bottom portion outer sidewall and top portion outer sidewall are distal from the fan-out package.

16 . The method of claim 15 , wherein the tapered top surface and the tapered bottom surface have a taper angle in a range between 5 degrees and 60 degrees with respect to a top surface of the package substrate.

17 . The method of claim 15 , wherein a coefficient of thermal expansion (CTE) of the bottom portion is different than a CTE of the top portion.

18 . The method of claim 15 , wherein a height of the bottom portion inner sidewall is greater than a height of the bottom portion outer sidewall and a height of the top portion inner sidewall is less than a height of the top portion outer sidewall.

19 . The method of claim 15 , wherein a height of the bottom portion inner sidewall is less than a height of the bottom portion outer sidewall and a height of the top portion inner sidewall is greater than a height of the top portion outer sidewall.

20 . The method of claim 15 , further comprising:

depositing a thermal interface material on a top surface of a fan-out package surrounded by the beveled stiffener structure; and

forming a lid portion having a bottom surface that is in contact with a top surface of the thermal interface material.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 25, 2022
From: HSU, CHIA-KUEI; YEW, MING-CHIH; LIAO, LI-LING; JENG, SHIN-PUU
To: TAIWAN SEMICONDUCTOR MANUFACTURING COMPANY LIMITED
Reel/Frame 060898/0156 →
Continuity (1)
Related Publication 20240071949A1 · Feb 29, 2024
References Cited (70)
US 5173766A · Long · 1992 [cited by examiner]
US 7585702B1 · Wang · 2009 [cited by examiner]
US 7741160B1 · Wang · 2010 [cited by examiner]
US 8212353B1 · Wang · 2012 [cited by examiner]
US 8614502B2 · Lin · 2013 [cited by examiner]
US 10424527B2 · Sikka · 2019 [cited by examiner]
US 10764996B1 · Boja · 2020 [cited by examiner]
US 11302592B2 · Pan · 2022 [cited by examiner]
US 11476205B2 · Tsai · 2022 [cited by examiner]
US 11521939B2 · Chen · 2022 [cited by examiner]
US 11742322B2 · Yew · 2023 [cited by examiner]
US 11784130B2 · Lin · 2023 [cited by examiner]
US 11824032B2 · Chen · 2023 [cited by examiner]
US 12027471B2 · Choi · 2024 [cited by examiner]
US 12170236B2 · Chen · 2024 [cited by examiner]
US 12255156B2 · Chen · 2025 [cited by examiner]
US 20020135065A1 · Zhao · 2002 [cited by examiner]
US 20030057550A1 · Zhao · 2003 [cited by examiner]
US 20050280127A1 · Zhao · 2005 [cited by examiner]
US 20050280139A1 · Zhao · 2005 [cited by examiner]
US 20130032938A1 · Lin · 2013 [cited by examiner]
US 20170179043A1 · Xu · 2017 [cited by examiner]
US 20190109122A1 · Ong · 2019 [cited by examiner]
US 20190148260A1 · Sikka · 2019 [cited by examiner]
US 20200105640A1 · Chiu · 2020 [cited by examiner]
US 20220028800A1 · Chen · 2022 [cited by examiner]
US 20220302064A1 · Chen · 2022 [cited by examiner]
US 20220367301A1 · Lo · 2022 [cited by examiner]
US 20230046098A1 · Kim · 2023 [cited by examiner]
US 20230063295A1 · Yang · 2023 [cited by examiner]
US 20230064957A1 · Lin · 2023 [cited by examiner]
US 20230070053A1 · Chen · 2023 [cited by examiner]
US 20230148220A1 · Verhaverbeke · 2023 [cited by examiner]
US 20230307379A1 · Geng · 2023 [cited by examiner]
US 20230307381A1 · Chen · 2023 [cited by examiner]
US 20230317577A1 · Hsu · 2023 [cited by examiner]
US 20230326881A1 · Chen · 2023 [cited by examiner]
US 20230352447A1 · Yew · 2023 [cited by examiner]
US 20230378036A1 · Wang · 2023 [cited by examiner]
US 20230387061A1 · Chen · 2023 [cited by examiner]
US 20230395492A1 · Lai · 2023 [cited by examiner]
US 20230395563A1 · Hsu · 2023 [cited by examiner]
US 20230402404A1 · Hsu · 2023 [cited by examiner]
US 20240021529A1 · Lin · 2024 [cited by examiner]
US 20240063087A1 · Kuo · 2024 [cited by examiner]
US 20240063208A1 · Lee · 2024 [cited by examiner]
US 20240071890A1 · Lin · 2024 [cited by examiner]
US 20240071947A1 · Tsai · 2024 [cited by examiner]
US 20240071949A1 · Hsu · 2024 [cited by examiner]
US 20240096820A1 · Kim · 2024 [cited by examiner]
US 20240113030A1 · Noguchi · 2024 [cited by examiner]
US 20240274503A1 · Lin · 2024 [cited by examiner]
US 20240297087A1 · Chang · 2024 [cited by examiner]
US 20240297089A1 · Lai · 2024 [cited by examiner]
US 20250070072A1 · Kim · 2025 [cited by examiner]
US 20250070084A1 · Lee · 2025 [cited by examiner]
US 20250149524A1 · Fan · 2025 [cited by examiner]
CN 114284250A · 2022 [cited by examiner]
CN 115565961A · 2023 [cited by examiner]
CN 115588662A · 2023 [cited by examiner]
CN 115732424A · 2023 [cited by examiner]
JP WO2019069707A1 · 2020 [cited by examiner]
KR 20160004106A · 2016 [cited by examiner]
KR 102339021B1 · 2021 [cited by examiner]
KR 20230025132A · 2023 [cited by examiner]
KR 20240038851A · 2024 [cited by examiner]
TW 202401685A · 2024 [cited by examiner]
TW 202410337A · 2024 [cited by examiner]
WO WO0022674A1 · 2000 [cited by examiner]
WO WO2022040052A1 · 2022 [cited by examiner]