IP Library › Granted Patent US 12,584,221
Granted Patent B2
US 12,584,221 · App. 18/132,593 · Granted Mar 24, 2026

Methods and systems for depositing a layer

Inventors: Marko Tuominen (Helsinki, FI); Viljami Pore (Helsinki, FI)
Assignee: ASM IP Holding B.V.
C23C16/4586C23C16/45536C23C16/45565C23C16/4557C23C16/509C23C16/517C23C16/52C23C16/56
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Quick Facts
Patent No.
US 12,584,221
App. No.
18/132,593
Granted
Mar 24, 2026
Kind
B2
Abstract

Systems for depositing materials and related methods are described. The systems allow condensing or depositing a precursor on a substrate, and then curing condensed or deposited precursor to form a layer.

Claims (28)

1 . A system comprising:

a reaction chamber, the reaction chamber comprising a substrate support, the substrate support comprising a substrate cooling unit;

a precursor source for introducing a precursor in the reaction chamber via a gas injection system fluidly coupled to the reaction chamber, the precursor source comprising a precursor source heater;

a gas injection system heater arranged for heating the gas injection system; and,

a curing unit; and

a controller comprising:

a gas injection system temperature control unit arranged to maintain the gas injection system at a pre-determined gas injection system temperature, the gas injection system temperature being higher than a precursor source temperature;

a substrate support temperature control unit arranged to maintain the substrate support at a pre-determined substrate support temperature, the substrate support temperature being lower than the precursor source temperature; and

a curing unit control unit arranged for controlling the operation of the curing unit,

wherein the curing unit is configured to cure condensed or deposited precursor.

2 . The system according to claim 1 wherein the gas injection system comprises a showerhead injector, the showerhead injector comprising a showerhead injector heater.

3 . The system according to claim 2 wherein the curing unit comprises:

a lower electrode and an upper electrode, the lower electrode being comprised in the substrate support, the upper electrode being comprised the showerhead injector; and

a radio frequency power source arranged for generating a radio frequency power waveform, the radio frequency power source being electrically connected to one of the lower electrode and the upper electrode.

4 . The system according to claim 1 wherein the curing unit comprises one or more of an infrared source, a UV source, a microwave source, and a remote plasma source.

5 . The system according to claim 1 wherein the curing unit comprises a remote plasma source and wherein one or more mesh plates are positioned between the remote plasma source and the substrate support.

6 . The system according to claim 1 , the controller further comprising:

a gas flow control unit arranged to control gas flow into the gas injection system.

7 . The system according to claim 1 wherein the reaction chamber further comprises a substrate heating unit that is comprised in the substrate support.

8 . The system according to claim 1 wherein the precursor comprises a boron precursor and wherein curing the condensed or deposited precursor comprises exposing the precursor to a reactant.

9 . The system according to claim 1 wherein the controller is further configured to:

maintain a second precursor source at a second precursor source temperature;

provide the second precursor, from the second precursor source, via the gas injection system, to the reaction chamber, thus condensing or depositing the second precursor on the substrate to form a condensed or deposited second precursor; and

cure the condensed or deposited second precursor by means of the curing unit.

10 . The system according to claim 1 wherein the controller further comprises a precursor source temperature control unit arranged to maintain the precursor source at a pre-determined precursor source temperature.

11 . The system according to claim 1 wherein the controller is further configured to maintain the precursor source at the precursor source temperature.

12 . The system according to claim 1 wherein the controller is further configured to position a substrate on the substrate support.

13 . The system according to claim 1 wherein the controller is further configured to provide a precursor, from the precursor source, via the gas injection system, to the reaction chamber, thus condensing or depositing the precursor on the substrate to form the condensed or deposited precursor.

Assignments (1)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 10, 2023
From: TUOMINEN, MARKO; PORE, VILJAMI
To: ASM IP HOLDING B.V.
Reel/Frame 063274/0303 →
Continuity (3)
Division 17580832 · Jan 21, 2022
Provisional Application 63141822 · Jan 26, 2021
Related Publication 20230243036A1 · Aug 3, 2023
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