IP Library › Granted Patent US 12,469,559
Granted Patent B2
US 12,469,559 · App. 18/357,450 · Granted Nov 11, 2025

Non-volatile memory with sub-blocks

Inventors: Xiang Yang (Santa Clara, CA); Wei Cao (Fremont, CA); Jiacen Guo (Sunnyvale, CA)
Assignee: Sandisk Technologies, Inc.
G11C16/08G06F12/0246G11C16/10G11C16/16G06F2212/7201
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,469,559
App. No.
18/357,450
Granted
Nov 11, 2025
Kind
B2
Abstract

A non-volatile memory includes a plurality of non-volatile memory cells arranged in blocks. Each block includes multiple sub-blocks that can be independently erased and programmed. A control circuit is connected to the non-volatile memory cells. The control circuit is configured to independently erase and program sub-blocks of a same block. The control circuit is configured to only allow one sub-block per block to be open at a time.

Claims (73)

1 . A non-volatile storage apparatus, comprising:

a plurality of non-volatile memory cells arranged in blocks, each block includes multiple sub-blocks that can be independently erased and programmed; and

a control circuit connected to the non-volatile memory cells, the control circuit is configured to:

receive a request to open a first sub-block of a first block,

determine whether any counter sub-block of the first sub-block is open,

if there is no counter sub-block of the first sub-block that is open, open the first sub-block of the first block, and

if any counter sub-block of the first sub-block is open, identify a sub-block of a different block that has a counter sub-block that is not open and open the sub-block of the different block.

2 . The non-volatile storage apparatus of claim 1 , wherein:

the request to open the first sub-block of the first block is a request to erase the first sub-block of the first block;

the control circuit is configured to open the first sub-block of the first block by erasing the first sub-block of the first block; and

the control circuit is configured to open the sub-block of the different block by erasing the sub-block of the different block.

3 . The non-volatile storage apparatus of claim 1 , wherein:

the request to open the first sub-block of the first block includes a request to erase the first sub-block of the first block;

the control circuit is configured to open the first sub-block of the first block by erasing and programming the first sub-block of the first block; and

the control circuit is configured to open the sub-block of the different block by erasing and programming the sub-block of the different block.

4 . The non-volatile storage apparatus of claim 3 , wherein the control circuit is configured to program the first sub-block of the first block by:

applying a dose of a program voltage to a selected word line of the first sub-block, the first sub-block is open;

applying a first overdrive voltage to unselected word lines of the first sub-block while applying the dose of the program voltage; and

applying a second overdrive voltage to word lines of the one or more counter sub-blocks of the first sub-block while applying the dose of the program voltage, the second overdrive voltage is lower in voltage magnitude than the first overdrive voltage.

5 . The non-volatile storage apparatus of claim 1 , wherein:

the control circuit is configured to allow no more than one sub-block per block to be open at a time.

6 . The non-volatile storage apparatus of claim 1 , wherein:

a sub-block is open if all memory cells connected to any word line in the sub-block are in the erased state; and

a sub-block is closed if every word line of the sub-block is connected to memory cells that are programmed to one or more programmed data states.

7 . The non-volatile storage apparatus of claim 1 , further comprising bit lines and a source line, wherein:

the first block includes the first sub-block and a second sub-block, the second sub-block is the only counter sub-block of the first sub-block;

the first block is connected to the bit lines and the source line;

the first sub-block is positioned closer to the bit lines than the source line; and

the second sub-block is positioned closer to the source line than the bit lines.

8 . The non-volatile storage apparatus of claim 7 , wherein:

the control circuit is configured to program the first sub-block in a direction from the source line to the bit lines; and

the control circuit is configured to program the second sub-block in a direction from the bit lines to the source line.

9 . The non-volatile storage apparatus of claim 1 , wherein:

the control circuit is configured to limit the number of open sub-blocks to a predetermined number; and

the control circuit is configured to scramble host data prior to programming the host data in an open sub-block.

10 . A method of operating non-volatile memory cells arranged in blocks, each block includes multiple sub-blocks, the method comprising:

independently erasing and programming sub-blocks;

receiving requests to erase target sub-blocks;

determining whether the target sub-blocks have any counter sub-blocks that are open or have all one or more counter sub-blocks closed;

for target sub-blocks that have all one or more counter sub-blocks closed, erasing the respective target sub-block; and

for target sub-blocks that have any counter sub-blocks that are open, identifying another sub-block of a different block that has all one or more counter sub-blocks closed and erasing the another sub-block of the different block.

11 . The method of claim 10 , further comprising:

for target sub-blocks that have all one or more counter sub-blocks closed, programming the respective target sub-block after erasing the respective target sub-block; and

for target sub-blocks that have any counter sub-blocks that are open, programming the another sub-block of the different block after erasing the another sub-block of the different block.

12 . The method of claim 11 , wherein the programming the respective target sub-block after erasing the respective target sub-block comprises:

applying doses of a program voltage to a selected word line of the target sub-block, the target sub-block is open;

applying a first overdrive voltage to unselected word lines of the target sub-block while applying the doses of the program voltage; and

applying a second overdrive voltage to word lines of the one or more counter sub-blocks of the target sub-block while applying the doses of the program voltage, the second overdrive voltage is lower in voltage magnitude than the first overdrive voltage.

13 . The method of claim 10 , further comprising:

allowing only one sub-block per block to be open at a time.

14 . The method of claim 10 , wherein:

each of the blocks has two sub-blocks that are counter sub-blocks of each other.

15 . A non-volatile storage apparatus, comprising:

a plurality of non-volatile memory cells arranged in blocks, each block includes multiple sub-blocks that can be independently erased and programmed; and

a control circuit connected to the non-volatile memory cells, the control circuit is configured to separately erase and program sub-blocks of a same block, the control circuit is configured to allow no more than one sub-block per block to be open at a time by:

receiving a request to erase a first sub-block of a first block,

determining whether any counter sub-block of the first sub-block is open,

if there is no counter sub-block of the first sub-block that is open, erasing and programming the first sub-block of the first block, and

if any counter sub-block of the first sub-block is open, identifying a sub-block of a different block that has a counter sub-block that is not open and erasing and programming the sub-block of the different block.

16 . The non-volatile storage apparatus of claim 15 , wherein:

a sub-block is open if all memory cells connected to any word line in the sub-block are in the erased state; and

a sub-block is closed if every word line of the sub-block is connected to memory cells that are programmed to one or more programmed data states.

17 . The non-volatile storage apparatus of claim 15 , further comprising bit lines and a source line connected to the plurality of non-volatile memory cells, wherein:

the first block includes the first sub-block and a second sub-block, the second sub-block is the only counter sub-block of the first sub-block;

the first block is connected to the bit lines and the source line;

the first sub-block is positioned closer to the bit lines than the source line; and

the second sub-block is positioned closer to the source line than the bit lines.

18 . The non-volatile storage apparatus of claim 17 , wherein:

the control circuit is configured to program the first sub-block in a direction from the source line to the bit lines; and

the control circuit is configured to program the second sub-block in a direction from the bit lines to the source line.

19 . The non-volatile storage apparatus of claim 15 , wherein:

the control circuit is configured to limit the number of open sub-blocks to a predetermined number; and

the control circuit is configured to scramble host data prior to programming host data in an open sub-block.

Assignments (4)
PARTIAL RELEASE OF SECURITY INTERESTS Recorded Apr 25, 2025
From: JPMORGAN CHASE BANK, N.A., AS AGENT
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 071382/0001 →
SECURITY AGREEMENT Recorded Apr 25, 2025
From: SANDISK TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 071050/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 31, 2024
From: SANDISK TECHNOLOGIES LLC
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 069796/0423 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Aug 3, 2023
From: YANG, XIANG; CAO, WEI; GUO, JIACEN
To: SANDISK TECHNOLOGIES LLC
Reel/Frame 064480/0902 →
Continuity (2)
Provisional Application 63425044 · Nov 14, 2022
Related Publication 20240161828A1 · May 16, 2024
References Cited (16)
US 10157680B2 · Yang et al. · 2018 [cited by applicant]
US 10726920B2 · Yang · 2020 [cited by applicant]
US 20100322000A1 · Shim et al. · 2010 [cited by applicant]
US 20110182105A1 · Yan et al. · 2011 [cited by applicant]
US 20120051143A1 · Yoon · 2012 [cited by examiner]
US 20130223147A1 · Kwak · 2013 [cited by applicant]
US 20140108705A1 · Gorobets · 2014 [cited by applicant]
US 20200243144A1 · Shim · 2020 [cited by examiner]
US 20220028466A1 · Kim et al. · 2022 [cited by applicant]
US 20220075716A1 · Tikoo et al. · 2022 [cited by applicant]
US 20230076245A1 · Yang et al. · 2023 [cited by applicant]
US 20230238062A1 · Yang · 2023 [cited by examiner]
US 20240036740A1 · Liu · 2024 [cited by examiner]
US 20240055059A1 · Guo · 2024 [cited by examiner]
US 20240071529A1 · Guo · 2024 [cited by examiner]
US 20240112743A1 · Zhang · 2024 [cited by examiner]