IP Library Granted Patent US 12,369,501
Granted Patent B2
US 12,369,501 · App. 18/435,070 · Granted Jul 22, 2025

Systems and methods for fabrication of superconducting integrated circuits

Inventors: Eric Ladizinsky (Manhattan Beach, CA); Jeremy P. Hilton (Vancouver, CA); Byong Hyop Oh (San Jose, CA); Paul I. Bunyk (Pt. Roberts, WA)
Assignee: 1372934 B.C. LTD.
H10N60/0912B82Y10/00H01L21/2855H01L21/76877H01L21/76891H10N60/01H10N60/0156H10N60/10H10N60/12H10N60/805H10N60/855H10N69/00G06N10/00
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 12,369,501
App. No.
18/435,070
Granted
Jul 22, 2025
Kind
B2
Abstract

Various techniques and apparatus permit fabrication of superconductive circuits. A niobium/aluminum oxide/niobium trilayer may be formed and individual Josephson Junctions (JJs) formed. A protective cap may protect a JJ during fabrication. A hybrid dielectric may be formed. A superconductive integrated circuit may be formed using a subtractive patterning and/or additive patterning. A superconducting metal layer may be deposited by electroplating and/or polished by chemical-mechanical planarization. The thickness of an inner layer dielectric may be controlled by a deposition process. A substrate may include a base of silicon and top layer including aluminum oxide. Depositing of superconducting metal layer may be stopped or paused to allow cooling before completion. Multiple layers may be aligned by patterning an alignment marker in a superconducting metal layer.

Claims (17)

1. A method of depositing a superconducting metal layer in an integrated circuit, the method comprising:

depositing a first portion of the superconducting metal layer to overlie a top layer of one or more Josephson junction trilayers of the integrated circuit;

stopping the depositing of the first portion of the superconducting metal layer to prevent excessive heating;

cooling the first portion of the superconducting metal layer; and

depositing a second portion of the superconducting metal layer over the first portion of the superconducting metal layer.

2. The method of claim 1 , further comprising:

stopping the depositing of the second portion of the superconducting metal layer to prevent excessive heating;

cooling the second portion of the superconducting metal layer; and

depositing a third portion of the superconducting metal layer over the second portion of the superconducting metal layer.

3. The method of claim 1 , wherein depositing a first portion of the superconducting metal layer comprises depositing one of niobium or aluminum.

4. The method of claim 1 , further comprising:

monitoring a temperature of the integrated circuit during the depositing of the first portion of the superconducting metal layer, and wherein stopping the depositing of the first portion of the superconducting metal layer to prevent excessive heating comprises stopping the depositing of the first portion of the superconducting metal layer in response to the temperature of the integrated circuit approaching or exceeding a defined threshold temperature.

5. The method of claim 1 , wherein stopping the depositing of the first portion of the superconducting metal layer to prevent excessive heating comprises stopping the depositing of the first portion of the superconducting metal layer after a target deposition time.

6. The method of claim 1 , wherein cooling the first portion of the superconducting metal layer comprises passively cooling the first portion of the superconducting metal layer for a defined cooling time.

7. The method of claim 1 , wherein cooling the first portion of the superconducting metal layer comprises filling a deposition chamber with an inert gas.

8. The method of claim 1 , wherein depositing a second portion of the superconducting metal layer comprises depositing the second portion of the superconducting metal layer until a defined total metal layer thickness is deposited.

9. The method of claim 1 , wherein depositing a second portion of the superconducting metal layer comprises depositing the second portion of the superconducting metal layer until a threshold temperature is reached.

Assignments (6)
CHANGE OF NAME Recorded Jun 24, 2025
From: DWSI HOLDINGS INC.
To: D-WAVE SYSTEMS INC.
Reel/Frame 071508/0011 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 24, 2025
From: 1372929 B.C. LTD.
To: 1372934 B.C. LTD.
Reel/Frame 071705/0119 →
CONTINUATION Recorded Jun 24, 2025
From: D-WAVE SYSTEMS INC.
To: D-WAVE SYSTEMS INC.
Reel/Frame 071723/0251 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Jun 24, 2025
From: D-WAVE SYSTEMS INC.
To: 1372929 B.C. LTD.
Reel/Frame 071723/0408 →
MERGER Recorded Jun 24, 2025
From: D-WAVE SYSTEMS INC.; DWSI HOLDINGS INC.
To: DWSI HOLDINGS INC.
Reel/Frame 071724/0052 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Apr 23, 2024
From: LADIZINSKY, ERIC; HILTON, JEREMY P.; OH, BYONG HYOP; BUNYK, PAUL I.
To: D-WAVE SYSTEMS INC.
Reel/Frame 067198/0192 →
Continuity (6)
Continuation 16870537 · May 8, 2020
Continuation 15679963 · Aug 17, 2017
Division 14383837
Provisional Application 61608379 · Mar 8, 2012
Provisional Application 61714642 · Oct 16, 2012
Related Publication 20250024758A1 · Jan 16, 2025
References Cited (305)
US 6011981A · Alvarez et al. · 2000 [cited by applicant]
US 6133635A · Bothra et al. · 2000 [cited by applicant]
US 6160305A · Sanchez · 2000 [cited by examiner]
US 6165801A · Burns et al. · 2000 [cited by applicant]
US 6188919B1 · Lagraff et al. · 2001 [cited by applicant]
US 6242387B1 · Cukauskas et al. · 2001 [cited by applicant]
US 6284721B1 · Lee · 2001 [cited by applicant]
US 6362638B1 · Ashton et al. · 2002 [cited by applicant]
US 6384423B1 · Kerber et al. · 2002 [cited by applicant]
US 6384424B1 · Kugai et al. · 2002 [cited by applicant]
US 6420189B1 · Lopatin · 2002 [cited by applicant]
US 6459097B1 · Zagoskin · 2002 [cited by applicant]
US 6476413B1 · Jia et al. · 2002 [cited by applicant]
US 6495854B1 · Newns et al. · 2002 [cited by applicant]
US 6517944B1 · Puzey et al. · 2003 [cited by applicant]
US 6541789B1 · Sato et al. · 2003 [cited by applicant]
US 6563311B2 · Zagoskin · 2003 [cited by applicant]
US 6569252B1 · Sachdev et al. · 2003 [cited by applicant]
US 6624122B1 · Holesinger et al. · 2003 [cited by applicant]
US 6627915B1 · Ustinov et al. · 2003 [cited by applicant]
US 6715944B2 · Oya et al. · 2004 [cited by applicant]
US 6753546B2 · Tzalenchuk et al. · 2004 [cited by applicant]
US 6767840B1 · Uehara et al. · 2004 [cited by applicant]
US 6803599B2 · Amin et al. · 2004 [cited by applicant]
US 6849557B1 · Ko · 2005 [cited by applicant]
US 6882293B2 · Shoji et al. · 2005 [cited by applicant]
US 6905887B2 · Amin et al. · 2005 [cited by applicant]
US 6936808B2 · Uchida · 2005 [cited by applicant]
US 6979836B2 · Zagoskin et al. · 2005 [cited by applicant]
US 7091132B2 · Tan et al. · 2006 [cited by applicant]
US 7533068B2 · Maassen et al. · 2009 [cited by applicant]
US 7619437B2 · Thom et al. · 2009 [cited by applicant]
US 7624088B2 · Johnson et al. · 2009 [cited by applicant]
US 7638434B2 · Helneder · 2009 [cited by applicant]
US 7639035B2 · Berkley · 2009 [cited by applicant]
US 7675139B2 · Nomura et al. · 2010 [cited by applicant]
US 7843209B2 · Berkley · 2010 [cited by applicant]
US 7876248B2 · Berkley et al. · 2011 [cited by applicant]
US 7898282B2 · Harris et al. · 2011 [cited by applicant]
US 7981759B2 · Cervin-Lawry et al. · 2011 [cited by applicant]
US 8098179B2 · Bunyk et al. · 2012 [cited by applicant]
US 8169231B2 · Berkley · 2012 [cited by applicant]
US 8173228B2 · Choi et al. · 2012 [cited by applicant]
US 8190548B2 · Choi · 2012 [cited by applicant]
US 8195596B2 · Rose et al. · 2012 [cited by applicant]
US 8301214B1 · Tolpygo et al. · 2012 [cited by applicant]
US 8421053B2 · Bunyk et al. · 2013 [cited by applicant]
US 8536566B2 · Johansson et al. · 2013 [cited by applicant]
US 8571614B1 · Mukhanov et al. · 2013 [cited by applicant]
US 8611974B2 · Maibaum et al. · 2013 [cited by applicant]
US 8644898B1 · De Andrade et al. · 2014 [cited by applicant]
US 8742594B2 · Daubenspeck et al. · 2014 [cited by applicant]
US 8854074B2 · Berkley · 2014 [cited by applicant]
US 8933695B1 · Kornev et al. · 2015 [cited by applicant]
US 8951808B2 · Ladizinsky et al. · 2015 [cited by applicant]
US 9130116B1 · Tolpygo et al. · 2015 [cited by applicant]
US 9136457B2 · Tolpygo · 2015 [cited by applicant]
US 9183508B2 · King · 2015 [cited by applicant]
US 9324767B1 · Steinbach et al. · 2016 [cited by applicant]
US 9355362B2 · Shea et al. · 2016 [cited by applicant]
US 9495644B2 · Chudak et al. · 2016 [cited by applicant]
US 9520180B1 · Mukhanov et al. · 2016 [cited by applicant]
US 9564573B1 · Chang et al. · 2017 [cited by applicant]
US 9634224B2 · Ladizinsky et al. · 2017 [cited by applicant]
US 9768371B2 · Ladizinsky et al. · 2017 [cited by applicant]
US 9971970B1 · Rigetti et al. · 2018 [cited by applicant]
US 10141493B2 · Tuckerman · 2018 [cited by applicant]
US 10290425B2 · Shindo et al. · 2019 [cited by applicant]
US 10454015B2 · Lanting et al. · 2019 [cited by applicant]
US 10528886B2 · Boothby · 2020 [cited by applicant]
US 11038095B2 · Huang et al. · 2021 [cited by applicant]
US 11100416B2 · Lanting et al. · 2021 [cited by applicant]
US 11105866B2 · Swenson et al. · 2021 [cited by applicant]
US 11127893B2 · Johnson et al. · 2021 [cited by applicant]
US 11295225B2 · Hoskinson et al. · 2022 [cited by applicant]
US 12034404B2 · Berkley et al. · 2024 [cited by applicant]
US 20010004479A1 · Cheung et al. · 2001 [cited by applicant]
US 20020017906A1 · Ho et al. · 2002 [cited by applicant]
US 20020117738A1 · Amin et al. · 2002 [cited by applicant]
US 20020180006A1 · Franz et al. · 2002 [cited by applicant]
US 20020190343A1 · Jones et al. · 2002 [cited by applicant]
US 20020190381A1 · Herr et al. · 2002 [cited by applicant]
US 20030027724A1 · Rose et al. · 2003 [cited by applicant]
US 20030068832A1 · Koval et al. · 2003 [cited by applicant]
US 20030089987A1 · Parikh · 2003 [cited by applicant]
US 20030102470A1 · Il et al. · 2003 [cited by applicant]
US 20030107033A1 · Tzalenchuk et al. · 2003 [cited by applicant]
US 20030203639A1 · Ko et al. · 2003 [cited by applicant]
US 20040077504A1 · Adachi et al. · 2004 [cited by applicant]
US 20040087081A1 · Aitchison et al. · 2004 [cited by applicant]
US 20040155237A1 · Kerber · 2004 [cited by applicant]
US 20040191697A1 · Nakatsuka et al. · 2004 [cited by applicant]
US 20040266209A1 · Hinode et al. · 2004 [cited by applicant]
US 20050029512A1 · Hato et al. · 2005 [cited by applicant]
US 20050062131A1 · Murduck et al. · 2005 [cited by applicant]
US 20050087893A1 · Chung et al. · 2005 [cited by applicant]
US 20050107261A1 · Cantor et al. · 2005 [cited by applicant]
US 20050251990A1 · Choi et al. · 2005 [cited by applicant]
US 20060197193A1 · Gu et al. · 2006 [cited by applicant]
US 20070015416A1 · Gutierrez · 2007 [cited by examiner]
US 20070077765A1 · Prince et al. · 2007 [cited by applicant]
US 20070123040A1 · Hwang et al. · 2007 [cited by applicant]
US 20070138001A1 · Ko · 2007 [cited by examiner]
US 20080001699A1 · Gardner et al. · 2008 [cited by applicant]
US 20090033353A1 · Yu et al. · 2009 [cited by applicant]
US 20090203192A1 · Kaltalioglu et al. · 2009 [cited by applicant]
US 20110095435A1 · Volant et al. · 2011 [cited by applicant]
US 20120319211A1 · Van Dal et al. · 2012 [cited by applicant]
US 20130116159A1 · Pollard et al. · 2013 [cited by applicant]
US 20140111242A1 · Xie et al. · 2014 [cited by applicant]
US 20150119253A1 · Yohannes et al. · 2015 [cited by applicant]
US 20150219730A1 · Tsukamoto et al. · 2015 [cited by applicant]
US 20160079968A1 · Strand et al. · 2016 [cited by applicant]
US 20160170675A1 · Pickerell et al. · 2016 [cited by applicant]
US 20180053689A1 · Kirby et al. · 2018 [cited by applicant]
US 20180337138A1 · Luu et al. · 2018 [cited by applicant]
US 20190044044A1 · Lampert et al. · 2019 [cited by applicant]
US 20190044048A1 · George et al. · 2019 [cited by applicant]
US 20190044051A1 · Caudillo et al. · 2019 [cited by applicant]
US 20190164959A1 · Thomas et al. · 2019 [cited by applicant]
US 20190288176A1 · Yoscovits et al. · 2019 [cited by applicant]
US 20190332965A1 · Barends · 2019 [cited by applicant]
US 20200012961A1 · Kelly et al. · 2020 [cited by applicant]
US 20200152851A1 · Lanting et al. · 2020 [cited by applicant]
US 20200266234A1 · Boothby et al. · 2020 [cited by applicant]
US 20210190885A1 · Swenson et al. · 2021 [cited by applicant]
US 20210375516A1 · Sterling et al. · 2021 [cited by applicant]
US 20220123048A1 · Swenson et al. · 2022 [cited by applicant]
US 20230004851A1 · Harris et al. · 2023 [cited by applicant]
US 20230400510A1 · Whittaker et al. · 2023 [cited by applicant]
CN 1471180A · 2004 [cited by applicant]
JP H0587890A · 1993 [cited by applicant]
JP H0774404A · 1995 [cited by applicant]
JP 2003218413A · 2003 [cited by applicant]
JP 2004128437A · 2004 [cited by applicant]
JP 2004519102A · 2004 [cited by applicant]
JP 2009111306A · 2009 [cited by applicant]
JP 6059754B2 · 2016 [cited by applicant]
KR 20000026669A · 2000 [cited by applicant]
KR 20010067425A · 2001 [cited by applicant]
WO 0201327A2 · 2002 [cited by applicant]
WO 2005093649A1 · 2005 [cited by applicant]
WO 2007085074A1 · 2007 [cited by applicant]
WO 2019055002A1 · 2019 [cited by applicant]
WO 2019179732A1 · 2019 [cited by applicant]
WO 2020212437A1 · 2020 [cited by applicant]
WO 2021231224A1 · 2021 [cited by applicant]
WO 2021262741A1 · 2021 [cited by applicant]
WO 2022178130A1 · 2022 [cited by applicant]
Hinode et al., “Fabrication of reliable via conductors for niobium SFQ devices,” Physica C 426-431:1533-1540, 2005. [cited by applicant]
Holzman et al., “On-chip integrable planar NbN nanoSQUID with broad temperature and magnetic-field operation range”, AIP Advances, Oct. 23, 2019. [cited by applicant]
Hori et al., “Electron spin resonance study on pure single crystalline sapphire”, P hys. Status Solidi C 10, No. 12, 1681-1683 (Nov. 5, 2013). [cited by applicant]
Hsu_ “CES 2018 Inte'ls 49-Qubit Chip Shoots for Quantum Supremacy”, IEEE Spectrum, 4 pages. [cited by applicant]
Hu, “Advanced Composites Material” pp. 197-201—Chinese, 2019. [cited by applicant]
Johnson et al., “Scalable Control System for a Superconducting Adiabatic Quantum Optimization Processor,” arXiv:0907.3757v2. Mar. 24, 2010. 14 pages. [cited by applicant]
Kamal., et al., “Improved superconducting qubit coherence with high-temperature substrate annealing”, arXiv:1606.09262v1 [cond-mat.mes-hall] Jun. 29, 2016, 10 pages. [cited by applicant]
Koch, et al., “Charge-insensitive qubit design derived from the Cooper pair box”, Physical Review A 76, 042319 (2007), 19 pages. [cited by applicant]
Kosen, et al., “Building Blocks of a Flip Chip Integrated Superconducting Quantum Processor”, arXiv 2112.02717v2, 2022. [cited by applicant]
Kwon et al., “Magnetic Field Dependent Microwave Losses in Superconducting Niobium Microstrip Resonators”, Journal of Applied Physics, 124(3):033803, Jul. 1, 2018. [cited by applicant]
Lanting et al., “Evidence for temperature-dependent spin diffusion as a mechanism of intrinsic flux noise in SQUIDs”, Physical Review B 89, 014503 (Jan. 7, 2014). [cited by applicant]
Lanting et al., Geometrical dependence of the low-frequency noise in superconducting flux qubits, Physical Review B, 79, 060509, Jun. 5, 2009, 4 pages. [cited by applicant]
Lee, “The Feasibility of Au Bonding on SN-Plated Cu”, Journal of Electronic Materials, 2007. [cited by applicant]
Lei, et al., “High coherence superconducting microwave cavities with indium bump bonding”, Appl. Phys. Lett. 116, 154002 (2020), 6 pages. [cited by applicant]
Levy-Bertrand et al., “Electrodynamics of granular aluminum from superconductor to insulator: observation of collective superconducting modes”, arXiv, Mar. 13, 2019. [cited by applicant]
Lucero, “Computing prime factors using a Josephson phase-qubit architecture: 15=3×5”, A dissertation submitted in partial satisfaction of the requirements for the degree of Doctor of Philosophy in Physics, University of… [cited by applicant]
M{umlaut over ( )}uller et al., “Towards understanding two-level-systems in amorphous solids—Insights from quantum circuits”; arXiv:1705.01108v3, Oct. 10, 2019. [cited by applicant]
Makhlin et al., “Quantum-state engineering with Josephson-junction devices”, arXIv:cond-mat/0011269v1, Nov. 15, 2000. [cited by applicant]
Malissa et al., “Superconducting coplanar waveguide resonators for low temperature pulsed electron spin resonance spectroscopy”, Review of Scientific Instruments, arXiv:1202.6305v1 [cond-mat.mes-hall] Feb. 28, 2012. [cited by applicant]
Martinis, et al., “Decoherence in Josephson Qubits from Dielectric Loss”, arXiv:cond-mat/0507622v1 [cond-mat.mtrl-sci] Jul. 26, 2005. [cited by applicant]
McCrory, et al., “Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance In A Probing Station”, 2018. [cited by applicant]
Mcintyre, “The Effect Of Annealing And Heating Deposition On Alpha And Beta Phase Formation For Tantalum Thin Films”, 2018. [cited by applicant]
McRae et al., “Materials loss measurements using superconducting microwave resonators”, arXiv:2006.04718 [physics, physics:quant-ph], Sep. 21, 2020. [cited by applicant]
MIT, “Superconducting Integrated Circuits”, Lincoln Laboratory, Technology in Support of National Security, 2 pages, 2018. [cited by applicant]
Morton & Bertet, “Storing quantum information in spins and high-sensitivity ESR”, Journal of Magnetic Resonance, 287:128-139, Feb. 1, 2018. [cited by applicant]
N/A, “Antifuse”, Wikipedia, Nov. 16, 2019. [cited by applicant]
N/A, “Low-k dielectric”, Wikipedia, Apr. 14, 2020. [cited by applicant]
Narayana, et al., “ Design and testing of high-speed interconnects for Superconducting multi-chip modules”, MIT Lincoln Laboratory, 244 Wood Street, 2012, 16 pages. [cited by applicant]
Narkowicz, et al., “Planar Microresonators For EPR Experiments”, Science Direct, 2005. [cited by applicant]
Nguyen et al., “The high-coherence fluxonium qubit”, arXiv:1810.11006v1, Oct. 25, 2018. [cited by applicant]
Ni, et al., “Demonstration Of Tantalum As A Structural Material For MEMS Thermal Actuators”, 2021. [cited by applicant]
Niepce et al., “Geometric scaling of two-level-system loss in superconducting resonators”, Superconducting Science and Technology, 33(2):025013, Jan. 1, 2020. [cited by applicant]
NSA, “Superconducting Technology Assessment”, National Security Agency Office of Corporate Assessments, Aug. 1, 2005, 257 pages. [cited by applicant]
Oliver et al., “Materials In Superconducting Quantum Bits” MRS Bulletin vol. 38, pp. 816-825 (2013). [cited by applicant]
Peltonen, J.T., et al. , “Hybrid rf SQUID qubit based on high kinetic inductance,” Scientific Reports, Jul. 3, 2018, 8 pages. [cited by applicant]
Place et al., “New material platform for superconducting transmon qubits with coherence times exceeding 0.3 milliseconds”, arXiv, Feb. 28, 2020. [cited by applicant]
Il'ichev, et al. “Degenerate ground state in a mesoscopic YBa2Cu3O7-x grain boundary Josephson junction”, Physical Review Letters, vol. 86, No. 23, Jun. 4, 2001, 4 pages. [cited by applicant]
Annunziata, et al., “Tunable superconducting nanoinductors”, IOP Science, Oct. 15, 2010, 11 pages. [cited by applicant]
Blanquart et al. , et al., “Evaluation and Comparison of Novel Precursors for Atomic Layer Deposition of Nb2O5 Thin Films”, Chem. Mater., Feb. 8, 2012, 6 pages. [cited by applicant]
Buchholz, et al., “LTS junction technology for RSFQ and qubit circuit applications”; Science Direct, Jul. 24, 2006, 8 pages. [cited by applicant]
Dagan , et al., “Absence of Andreev reflections and Andreev bound states above the critical temperature”, Phys. Rev. B 61, 2000, 5 pages. [cited by applicant]
Dagan , et al., “C-axis tunneling on YBCO films”, Eur. Phys. J. B 19, 2001, 5 pages. [cited by applicant]
Dolata, et al., “Platinum thin film resistors with Cr under- and overlayers for Nb/Al2O3/Nb technology”, Physica C: Superconductivity, 1998 (Science Direct, Jul. 19, 2005, 4 pages.). [cited by applicant]
Faucher , et al., “Niobium and niobium nitride SQUIDs based on anodized nanobridges made with an atomic force microscope”, Science Direct, Mar. 1, 2002, 7 pages. [cited by applicant]
Grabert , et al., “Mesoscopic Josephson effect”, arXiv9811194v1, 1998 (Superlattices and Microstructures 25, 2019, 10 pages.). [cited by applicant]
Grünhaupt , et al., “Granular aluminum: A superconducting material for high impedance quantum circuits”, arXiv, Sep. 27, 2018, 9 pages. [cited by applicant]
Grünhaupt , et al., “Quasiparticle dynamics in granular aluminum close to the superconductor to insulator transition”, arXiv, Feb. 7, 2018. [cited by applicant]
Hadfield, et al., “Novel Josephson junction geometries in NbCu bilayers fabricated by focused ion beam microscope”, Physica C, North-Holland Publishing, Amsterdam, Feb. 15, 2002, 9 pages. [cited by applicant]
Havemann , et al., “High-performance interconnects: an integration overview”, IEEE, May 2001, 16 pages. [cited by applicant]
Herr , et al., “Reproducible Operating Margins on a 72,800-Device Digital Superconducting Chip”, arXiv, Oct. 5, 2015, 6 pages. [cited by applicant]
Hypres , “Niobium Integrated Circuit Fabrication Process #S45/100/200 Design Rules”, Hypres, Mar. 10, 2015, 9 pages. [cited by applicant]
Kohl , “Low-Dielectric Constant Insulators for Future Integrated Circuits and Packages”, Georgia Tech, Mar. 14, 2011, 25 pages. [cited by applicant]
Larsson , et al., “Transport properties of submicron YBa2Cu3O7-d step-edge Josephson junctions”, J. Appl. Phys. 90, 2001, 24 pages. [cited by applicant]
Lisitskii, et al., “Annular Josephson junctions for radiation detection: fabrication and investigation of the magnetic behavior”, Nuclear Instruments & Methods in Physics Research, Apr. 2000, 11 pages. [cited by applicant]
Lombardi , et al., “Tunnel barriers for an all-high-To single electron tunneling transistor”, Physica C 368, 2002, 6 pages. [cited by applicant]
Macco, et al., “Atomic-layer deposited Nb205 as transparent passivating electron contact for c-Si solar cells”, Science Direct, Sep. 2018, 7 pages. [cited by applicant]
Maleeva, et al., “Circuit Quantum Electrodynamics of Granular Aluminum Resonators”, arXiv, Feb. 7, 2018, 17 pages. [cited by applicant]
Mazin , et al., “Thin film dielectric microstrip kinetic inductance detectors”, arXiv, Feb. 1, 2010, 10 pages. [cited by applicant]
McKenney , et al., “Design considerations for a background limited 350 micron pixel array using lumped element superconducting microresonators”, SPIE, Sep. 24, 2012, 10 pages. [cited by applicant]
Nagasawa , et al., “Development of advanced Nb process for SFQ circuits”, Physica C: Superconductivity, vol. 412-414, part 2, Oct. 2004, pp1429-1436 Science Direct, Jun. 9, 2004, 8 pages. [cited by applicant]
Ortlepp, et al., “RSFQ Circuitry Using Intrisic nr-Phase Shifts”, IEEE, Jun. 2007, 5 pages. [cited by applicant]
Potts, et al., “CMOS compatible fabrication methods for submicron Josephson junction qubits” IEEE, Sep. 5, 2001, 4 pages. [cited by applicant]
Russo , et al., “Characterization of Superconducting Thin Films and nanoSQUIDs for Nanoparticle Investigation at High Magnetic Field”, IEEE, 2016. [cited by applicant]
Satoh , et al., “Fabrication process of planarized multi-layer Nb integrated circuits”, IEEE, 15(2), Jun. 13, 2005, 4 pages. [cited by applicant]
Satoh, et al., “Planarization of Josephson junctions for large-scale integrated Nb SFQ circuits by mechanical polishing”, Physica C Superconductivity, vols. 412-414, part 2, pp. 1447-1450, Oct. 2004 Science Direct, 1999… [cited by applicant]
Tolpygo , “Superconductor Digital Electronics: Scalability and Energy Efficiency Issues”, arXiv, Feb. 10, 2016, 20 pages. [cited by applicant]
Tolpygo, et al., “Advanced Fabrication Processes for Superconducting Very Large-Scale Integrated Circuits”, IEEE, Jan. 19, 2016. [cited by applicant]
Tolpygo, et al., “Deep Sub-Micron Stud-Via Technology for Superconductor VLSI Circuits”, IOP Science, Jan. 14, 2014, 10 pages. [cited by applicant]
Tosi, et al., “Silicon quantum processor with robust long-distance qubit couplings”, Nature, Sep. 6, 2017, 11 pages. [cited by applicant]
Tsuei , et al., “Pairing symmetry in cuprate superconductors”, Reviews of Modern Physics 72, 2000, 48 pages. [cited by applicant]
Valenti , et al., “Interplay between kinetic inductance, non-linearity and quasiparticle dynamics in granular aluminum MKIDs”, arXiv, Nov. 10, 2018, 14 pages. [cited by applicant]
Vinante , et al., “Hot-electron effect in palladium thin films”, APS Physics, Mar. 13, 2007, 5 pages. [cited by applicant]
Yohannan , “Characterization of alpha and beta phases of tantalum coatings”, New Jersey Institute of Technology, Aug. 31, 2001, 107 pages. [cited by applicant]
Zantye, Parshuram B, et al., “Chemical mechanical planarization for microelectronics application”, Materials Science and Engineering R 45 (2004) 89-220. 2004 (Year: 2004), 132 pages. [cited by applicant]
B. H. Eom et al., “Wideband, Low-Noise Superconducting Amplifier with High Dynamic Range”, arXiv:1201.2392v1 [cond-mat.supr-con], 2012, 23 pages. [cited by applicant]
Barends R. Enhancement of Quasiparticle Recombination in Ta and A1 Superconductors by Implantation of Magnetic and Nonmagnetic Atoms (2009). [cited by applicant]
Barends, et al., “Superconducting quantum circuits at the surface code threshold for fault tolerance”, Nature vol. 508, pp. 500-503 (2014). [cited by applicant]
Berkley, A. J., et al., “A scalable readout system for a superconducting adiabatic quantum optimization system”, arXiv:0905.0891, V2, 2010. [cited by applicant]
Blatter et al., “Design aspects of superconducting-phase quantum bits,” Physical Review B 63: 174511-1-174511-9, 2001. [cited by applicant]
Bronn, et al., “High Coherence Plane Breaking Packaging for Superconducting Qubits”, arXiv:1709.02402v2 [quant-ph] Feb. 14, 2018, 101 pages. [cited by applicant]
Bunyk et al., “Architectural Considerations in the Design of a Superconducting Quantum Annealing Processor,” IEEE Trans. Appl. Supercond., 24, arXiv:1401.5504v1 [quant-ph] Jan. 21, 2014, 9 pages. [cited by applicant]
Calusine et al., “Analysis and mitigation of interface losses in trenched superconducting coplanar wave resonators”, Applied Physics Letters, 112(6):062601, Feb. 1, 2018. [cited by applicant]
Campbell, et al., “Electron Spin Resonance Scanning Probe Spectroscopy for Ultrasensitive Biochemical Studies”, Analytical Chemistry Publications, Anal. Chem. 2015, 87, 4910-4915, 7 pages. [cited by applicant]
Campbell, Wafer-Level Electrically Detected Magnetic Resonance: Magnetic Resonance in a Probing Station (2018). [cited by applicant]
Chapter: Appendix C: Superconducting Quantum Computers, Quantum, Computing Progress and Prospects, the National Academies Press, 2019, 10 pages. [cited by applicant]
Chen et al., “Qubit architecture with high coherences and fast tunable coupling”, Physical Review Letters, Feb. 28, 2014. https://arxiv.org/abs/1402.7367. [cited by applicant]
Clauss et al., “Broadband electron spin resonance from 500 MHz to 40 GHz using superconducting coplanar waveguides”, Applied Physics Letters, Apr. 1, 2013. [cited by applicant]
Clauss et al., “Optimization of Coplanar Waveguide Resonators for ESR Studies on Metals”, Journal of Physics: Conference Series, Mar. 1, 2015. [cited by applicant]
De Graaf et al., “Direct Identification of Dilute Surface Spins on Al2O3: Origin of Flux Noise in Quantum Circuits”; Physical Review Letters, Jan. 1, 2017. [cited by applicant]
De Graaf et al., “Suppression of low-frequency charge noise in superconducting resonators by surface spin desorption”, Nature Communications, 9(1):1143, Dec. 1, 2018. [cited by applicant]
De Graaf, Supplementary Information, Suppression of low-frequency charge noise in superconducting resonators by surface spin desorption, Nature Communications ( 2019). [cited by applicant]
Dhakal, et al., “Flux expulsion in niobium superconducting radio-frequency cavities of different purity and essential contributions in the flux sensitivity”, arXiv:1906.04163, Pub. Jun. 6, 2019. [cited by applicant]
Diniz et al., “Intrinsic photon loss at the interface of superconducting devices”, arXiv1909.04720v1, Sep. 10, 2019. [cited by applicant]
Doerner, S., et al., “Compact microwave kinetic inductance nanowire galvanometer for cryogenic detectors at 4.2 K,” J. Phys. Commun., 2018, 8 pages. [cited by applicant]
D-Wave Whitepaper, Early Progress on Lower Noise, 2022. [cited by applicant]
D-Wave Whitepaper, “Improved coherence leads to gains in quantum annealing performance”, D-Wave, 2019, 4 pages. [cited by applicant]
Elsherbini, et al., “Flip Chip Packaging for Superconducting Quantum Computers”, APS—APS March Meeting 2018—Event—vol. 63, No. 1, 1 page. [cited by applicant]
Fourie, et al., “WK2EOr3B-05—Experimental verification of moat design and flux trapping analysis”, Stellenbosch University, ASC 2020, Virtual Conference, Nov. 4, 2020. [cited by applicant]
Foxen, et al., Qubit compatible superconducting interconnects, arXiv:1708.04270v2 [quant-ph], Sep. 29, 2017, 19 pages. [cited by applicant]
Friedrich et al., “Onset of phase diffusion in high kinetic inductance granular aluminum micro-SQUIDs”, arXiv, Aug. 29, 2019. [cited by applicant]
Fritz, et al., “Optimization of Al/AlOx/Al-layer systems for Josephson Junctions from a microstructure point of view”, Journal of Applied Physics, 125, 165301 (2019). 11 pages. [cited by applicant]
Gao et al., A Semiempirical Model For Two Level System Noise In Superconducting Microresonators, Applied Physics, 2008. [cited by applicant]
Gao et al., “Experimental evidence for a surface distribution of two-level systems in superconducting lithographed microwave resonators”, arXiv:0802.4457v2 [cond-mat.supr-com] Mar. 14, 2008. [cited by applicant]
Gao, Jiansong, “The Physics of Superconducting Microwave Resonators,” Thesis, In Partial Fulfillment of the Requirements for the Degree of Doctor of Philosophy, California Institute of Technology Pasadena, California, M… [cited by applicant]
Gargiulo, et al., “Fast flux control of 3D transmon qubits using a magnetic hose”, : Appl. Phys. Lett. 118, 012601 (2021); https://doi.org/10.1063/5.0032615, 7 pages. [cited by applicant]
Geerlings, “Improving Coherence of Superconducting Qubits and Resonators”, A Dissertation Presented to the Faculty of the Graduate School of Yale University, 2012. [cited by applicant]
Henry, et al., “Degradation of Superconducting Nb/NbN Films by Atmospheric Oxidation”, IEEE Transactions on Applied Superconductivity, IEEXplore, 1051-8223, 2017, 5 pages. [cited by applicant]
Hilton, et al., “Fabrication of prototype imaging arrays for SCUBA-2”, Preprint submitted to Elsevier Science, Oct. 3, 2005. [cited by applicant]
Born et al., “Fabrication of Ultrasmall Tunnel Junctions by Electron Beam Direct-Writing”, IEEE, 11(1) Mar. 2001, 4 pages. [cited by applicant]
Martinis , et al., “UCSB final report for the CSQ program: Review of decoherence and materials physics for superconducting qubits”, arXiv, Oct. 21, 2014, 10 pages. [cited by applicant]
Smilde , et al., “Y—Ba—Cu—O / Au / Nb Ramp-type Josephson Junctions”, IEEE, 2001, 5 pages. [cited by applicant]
Place et al., “Supplementary Materials for New material platform for superconducting transmon qubits with coherence times exceeding 0.3 milliseconds”, Feb. 1, 2021. [cited by applicant]
Ramos et al., “Design for Effective Thermalization of Junctions for Quantum Coherence,” IEEE Transactions on Applied Superconductivity 11(1):998-1001, Mar. 2001. [cited by applicant]
Ramzi et al., “Niobium and Aluminum Josephson Junctions Fabricated with a Damascene CMP Process”, Physics Procedia, vol. 36, 2012, p. 211-216. [cited by applicant]
Rich, “DC SQUID Magnetometry”, Christopher Bennett Rich Thesis, Simon Fraser University, 58 pages, 2005. [cited by applicant]
Rosenberg, et al., “3D integrated superconducting qubits”, arXiv:1706.04116v2 [quant-ph] Jun. 19, 2017, 6 pages. [cited by applicant]
Schuster et al., “High cooperativity coupling of electron-spin ensembles to superconducting cavities”, Physical Review Letters, 105(14): 140501, Sep. 1, 2010. [cited by applicant]
Sears, “Extending Coherence in Superconducting Qubits: from microseconds to milliseconds”, PhD thesis, Yale, Jan. 1, 2013. [cited by applicant]
Semenov, et al., “How Moats Protect Superconductor Films from Flux Trapping”, IEEE Transactions on Applied Superconductivity, 1051-8223, 2016 IEEE, 20 pages. [cited by applicant]
Semenov., “AC-Biased Shift Registers as Fabrication Process Benchmark Circuits and Flux Trapping Diagnostic Tool”, arXiv:1701.03837, Published Dec. 29, 2016, 9 pages. [cited by applicant]
Sharma, “Fabrication and Characterization of AL/ALOx/AL Josephson Junctions”, Mater of Science, Texas A&M University, Dec. 2015, 84 pages. [cited by applicant]
Shen, et al., “Character and fabrication of Al/al2o3/al tunnel junctions for qubit application”, Chinese Science Bulletin, Feb. 2012 Vo. 57 No. 4: 409-412. [cited by applicant]
Sigillito et al., “Fast, low-power manipulation of spin ensembles in superconducting microresonators”, Applied Physics Letters, 104(22):222407, Jun. 1, 2014. [cited by applicant]
Simmonds, et al., “Josephson Junction Materials Research Using Phase Qubits”, 2006. [cited by applicant]
Steffen, et al., “Recent research trends for high coherence quantum circuits”, IOP Publishing, Supercond. Sci. Technol, 30 (2017), 5 pages. [cited by applicant]
Sun, Self-Aligned 3D Chip Integration Technology and Through-Silicon Serial Data Transmission (2011). [cited by applicant]
Swenson et al., “Operation of a titanium nitride superconducting microresonator detector in the nonlinear regime,” arXiv:1305.4281v1 [cond-mat.supr-con], May 18, 2013, 11 pages. [cited by applicant]
Tafuri, Feasibility of Biepitaxial YbaCuO Josephson Junctions for Fundamental Studies and Potential Circuit Implementation, Los Alamos National Laboratory preprint server condmat, 21 pages. Oct. 9, 2000. [cited by applicant]
Tennant, et al., “Low frequency correlated charge noise measurements across multiple energy transitions in a tantalum transmon”, arXiv:2106.08406v1 [quant-ph] Jun. 15, 2021. [cited by applicant]
Tezcan, Sloped Throught Wafer Vias for 3D Wafer Level Packaging (2007). [cited by applicant]
Tolpygo, et al., “Process-Induced Variability of Nb/Al/Alox/Nb Junctions in Superconductor Integrated Circuits and Protection Against It”, IEEE Transactions on Applied Superconductivity, vol. 19, No. 3, Jun. 2009, 5 pag… [cited by applicant]
Toplygo, et al., “Wafer Bumping Process and Inter-Chip Connections for Ultra-High Data Transfer Rates in Multi-Chip Modules With Superconductor Integrated Circuits”, IEEE Transactions on Applied Superconductivity, 2009,… [cited by applicant]
Tournet, “Growth and Characterization of Epitaxial Al Layers on GaAs and Si Substrates for Superconducting CPW Resonators in Scalable Quantum Computing Systems”, Thesis 2015, 161 pages. [cited by applicant]
Veinger, “Technique For Magnetic Susceptibility Determination in the High Doped Semiconductors by Electron Spin Resonance”, 2013. [cited by applicant]
Verjauw et al., “Investigation of microwave loss induced by oxide regrowth in high-Q Nb resonators”, Physical Review Applied, p. 16, Jan. 1, 2020. [cited by applicant]
Vladoiu, “Growth and Characteristics of Tantalum Oxide Thin Films Deposited Using Thermionic Vacuum Arc Technology”, 2010. [cited by applicant]
VLSI-expert.com, “Parasitic Interconnected Corner (RC corner) Basics—Part 1”, hhtp:www.visi-expert.com/2012/02/parasitic-interconnected-corner-rc-corner.html, Feb. 12, 2012 (Year:2012), 7 pages. [cited by applicant]
Voesch et al., “On-Chip ESR Measurements of DPPH at mK Temperatures”, Physics Procedia, 75:503-510, Jan. 1, 2015. [cited by applicant]
Wang et al., “FTIR Characterization of Fluorine Doped Silicon Dioxide Thin Films Deposited by Plasma Enhanced Chemical Vapor Deposition”, IOP Science, Apr. 21, 2000. [cited by applicant]
Wang, “Towards Practical Quantum Computers: Transmon Qubit With a Lifetime Approaching 0.5 Milliseconds”, 2022. [cited by applicant]
Weichselbaumer et al., “Quantitative modeling of superconducting planar resonators with improved field homogeneity for electron spin resonance”, Physical Review Applied, 12(2):024021, Aug. 1, 2019. [cited by applicant]
Weides, et al., “Phase qubits fabricated with trilayer junctions”, 7 pages. [cited by applicant]
Winkel, “Implementation of a transmon qubit using superconducting granular aluminum”, arXiv, Nov. 7, 2019. [cited by applicant]
Woods et al., “Determining interface dielectric losses in superconducting coplanar waveguide resonators”, arXiv:1808.10347 [cond-mat,physics:quant-ph], Aug. 1, 2018. [cited by applicant]
Wu Banqiu, High Aspect Ratio Silicon Etch: A Review (2010). [cited by applicant]
Yoon, K., et al. “Atomic-Scale Chemical Analyses of Niobium Oxide/Niobium Interfaces via Atom-Probe Tomography,” Applied Physics Letters, vol. 93, 2008, 3 pages. [cited by applicant]
Zednicek, “Niobium and Niobium Oxide Capacitors Overview”, 2019. [cited by applicant]
Zhang, et al., “Characterization of Surface Oxidation Layers On Ultrathin NvTIN Films”, 2018. [cited by applicant]
Stan, et al., “Critical Field for Complete Vortex Expulsion from Narrow Superconducting Strips”, UCSB, Mar. 5, 2004, 4 pages. [cited by applicant]
Tolpygo, Sergey K., et al., “Superconductor Electronics Fabrication Process with MoNx Kinetic Inductors and Self-Shunted Josephson Junctions,” IEEE Transactions on Applied Superconductivity 28(4), Jun. 2018, 12 pages. [cited by applicant]
Whittaker, J.D. , et al., “A frequency and sensitivity tunable microresonator array for high-speed quantum,” arXiv:1509.05811v2 [quant-ph], Apr. 22, 2016, 8 pages., Apr. 22, 2016. [cited by applicant]
Anton, et al., “Magnetic Flux Noise in dc SQUIDs: Temperature and Geometry Dependence”, Physical Review Letters, PRL 110, 147002, Apr. 5, 2013. [cited by applicant]
Calota, et al., “Investigation of Chemical/Mechanical Polishing of Niobium”, , STLE Tribology Transactions, vol. 52(4), p. 447-459, 2009. [cited by applicant]
Harris et al., “Experimental Demonstration of a Robust and Scalable Flux Qubit,” arXiv:0909.4321v1, Sep. 24, 2009, 20 pages. [cited by applicant]
Sendelbach, et al., “Complex Inductance, Excess Noise, and Surface Magnetism in do SQUIDs”, Physical Review Letters 103, 117001, Sep. 11, 2009. [cited by applicant]
Japanese First Office Action and English Translation Thereof for Japanese Patent Application No. 2024-068248, dated 9-Apr. 2025, 10 pages. [cited by applicant]
Cited By (1)
US 12,652,964