IP Library Granted Patent US 12,569,880
Granted Patent B2
US 12,569,880 · App. 18/523,949 · Granted Mar 10, 2026

CMOS ultrasonic transducers and related apparatus and methods

Inventors: Jonathan M. Rothberg (Miami Beach, FL); Keith G. Fife (Palo Alto, CA); Tyler S. Ralston (Clinton, CT); Gregory L. Charvat (Guilford, CT); Nevada J. Sanchez (Guilford, CT)
Assignee: BFLY OPERATIONS, INC.
B06B1/02B06B1/0292B81B3/0021B81B7/0077B81C1/00158G10K9/12G10K11/18B81B2203/0127B81B2203/0315B81B2207/015B81C2201/013B81C2203/0118B81C2203/0735B81C2203/0771
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Quick Facts
Patent No.
US 12,569,880
App. No.
18/523,949
Granted
Mar 10, 2026
Kind
B2
Abstract

CMOS Ultrasonic Transducers and processes for making such devices are described. The processes may include forming cavities on a first wafer and bonding the first wafer to a second wafer. The second wafer may be processed to form a membrane for the cavities. Electrical access to the cavities may be provided.

Claims (29)

1 . A method for forming a complementary metal oxide semiconductor ultrasonic transducer, the method comprising:

removing a portion of a first layer disposed over a first wafer including an electrode structure and a conductive pillar, wherein the removal of the portion of the first layer exposes a surface of the conductive pillar;

depositing a second layer over the first layer and the exposed surface of the conductive pillar;

forming a cavity in the second layer over the electrode structure, the cavity having a sidewall formed from the second layer; and

bonding a second wafer to the second layer to form a membrane over the cavity, wherein the second wafer and the second layer are doped with the same dopant.

2 . The method according to claim 1 , wherein the first layer is formed from an insulating material.

3 . The method according to claim 1 , wherein the second layer is formed from at least one of silicon, amorphous silicon, or polysilicon.

4 . The method according to claim 1 , wherein at least a portion of the second wafer is formed from at least one of silicon, amorphous silicon, or polysilicon.

5 . The method according to claim 1 , wherein the same dopant is at least one of nitrogen or phosphorus.

6 . The method according to claim 1 , wherein removing the portion of the first layer includes etching.

7 . The method according to claim 1 , wherein the second wafer includes a plurality of layers.

8 . The method according to claim 7 , wherein at least one layer of the plurality of layers of the second wafer and the second layer are doped with the same dopant.

9 . The method according to claim 1 , wherein the first wafer further includes processing circuitry configured to:

actuate the membrane to transmit an ultrasound wave; and

detect a received ultrasound wave based on vibration of the membrane.

10 . A complementary metal oxide semiconductor (CMOS) ultrasonic transducer, comprising:

a first wafer including an electrode structure and a conductive pillar;

a first layer disposed over the first wafer such that a surface of the conductive pillar is exposed through the first layer;

a second layer disposed over the first layer and an exposed surface of the conductive pillar, the second layer having a cavity disposed over the electrode structure, the cavity having a sidewall formed from the second layer; and

a second wafer bonded to the second layer forming a membrane over the cavity, wherein the second wafer and the second layer are doped with the same dopant.

11 . The CMOS ultrasonic transducer according to claim 10 , wherein the first layer is formed from an insulating material.

12 . The CMOS ultrasonic transducer according to claim 10 , wherein the second layer is formed from at least one of silicon, amorphous silicon, or polysilicon.

13 . The CMOS ultrasonic transducer according to claim 10 , wherein at least a portion of the second wafer is formed from at least one of silicon, amorphous silicon, or polysilicon.

14 . The CMOS ultrasonic transducer according to claim 10 , wherein the same dopant is at least one of nitrogen or phosphorus.

15 . The CMOS ultrasonic transducer according to claim 10 , wherein the second wafer includes a plurality of layers.

16 . The CMOS ultrasonic transducer according to claim 15 , wherein at least one layer of the plurality of layers of the second wafer and the second layer are doped with the same dopant.

17 . The CMOS ultrasonic transducer according to claim 10 , wherein the first wafer further includes processing circuitry configured to:

actuate the membrane to transmit an ultrasound wave; and

detect a received ultrasound wave based on vibration of the membrane.

Assignments (2)
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 30, 2023
From: ROTHBERG, JONATHAN M.; FIFE, KEITH G.; RALSTON, TYLER S.; CHARVAT, GREGORY L.; SANCHEZ, NEVADAJ J.
To: BUTTERFLY NETWORK, INC.
Reel/Frame 065711/0745 →
CHANGE OF NAME Recorded Nov 30, 2023
From: BUTTERFLY NETWORK, INC.
To: BFLY OPERATIONS, INC.
Reel/Frame 065723/0719 →
Continuity (9)
Continuation 16562821 · Sep 6, 2019
Continuation 15868989 · Jan 11, 2018
Continuation 15349223 · Nov 11, 2016
Continuation 14172840 · Feb 4, 2014
Provisional Application 61760951 · Feb 5, 2013
Provisional Application 61760968 · Feb 5, 2013
Provisional Application 61760932 · Feb 5, 2013
Provisional Application 61760891 · Feb 5, 2013
Related Publication 20240100565A1 · Mar 28, 2024
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