IC chip package having IC chip with overhang and/or BGA blocking underfill material flow and related methods

1. An integrated circuit (IC) chip package comprising:

a first chip package including:

a substrate;

an IC chip coupled to the substrate at a bottom surface of the IC chip, the IC chip including an upper surface opposite the bottom surface and including an overhang extending beyond a sidewall of the IC chip,

wherein the sidewall spans between the bottom surface and the upper surface of the IC chip, and

wherein the overhang extends from the upper surface less than or equal to one quarter of a length of the sidewall; and

underfill material about the sidewall and under the overhang, the overhang preventing the underfill material from extending over an upper surface of the IC chip,

wherein the underfill material contacts substantially an entirety of the sidewall between the upper surface and the bottom surface of the IC chip.

2. The IC chip package of claim 1 , further comprising:

a second IC chip package mounted substantially vertically aligned with the first IC chip package, and electrically coupled to the first IC chip package by a ball grid array (BGA).

3. The IC chip package of claim 2 , wherein a plurality of solder elements of the BGA dam the underfill material around the IC chip.

4. The IC chip package of claim 2 , wherein the underfill material surrounds a bottom portion of a plurality of solder elements of the BGA.

5. The IC chip package of claim 2 , wherein the first IC chip package includes a logic chip, and the second IC chip package includes a memory chip.

6. The IC chip package of claim 1 , wherein the underfill material surrounds substantially an entirety of a height of the IC chip.

7. The IC chip package of claim 1 , wherein the substrate has a planar upper surface coupled to the IC chip.

8. An integrated circuit (IC) chip package comprising:

a first IC chip package including:

a substrate,

a first IC chip coupled to the substrate at a bottom surface of the first IC chip, the first IC chip including an upper surface opposite the bottom surface and including an overhang extending beyond a sidewall of the IC chip

wherein the sidewall spans between the bottom surface and the upper surface of the first IC chip, and

wherein the overhang extends from the upper surface less than or equal to one quarter of a length of the sidewall;

a ball grid array (BGA) mounted to landing pads on the substrate and about the first IC chip, and

underfill material about the first IC chip and surrounding a bottom portion of a plurality of solder elements of the BGA and surrounding at least a portion of respective landing pads thereof,

wherein the overhang prevents the underfill material from extending over the upper surface of the first IC chip,

wherein the underfill material contacts substantially an entirety of the sidewall between the upper surface and the bottom surface of the IC chip; and

a second IC chip package including a second IC chip, the second IC chip package mounted substantially vertically aligned with the first IC chip package, and electrically coupled to the first IC chip package by the BGA.

9. The IC chip package of claim 8 , wherein the first IC chip package includes a logic chip, and the second IC chip package includes a memory chip.

10. The IC chip package of claim 8 , wherein the underfill material surrounds substantially an entirety of a height of the first IC chip.

11. The IC chip package of claim 8 , wherein the substrate has a planar upper surface coupled to the first IC chip.

12. A method of creating a first integrated circuit (IC) chip package, the method comprising:

dicing an IC chip to include an overhang extending beyond a sidewall of the IC chip,

wherein the sidewall spans between a bottom surface and an upper surface of the IC chip, and

wherein the dicing results in the overhang extending from the upper surface less than or equal to one quarter of a length of the sidewall;

mounting the bottom surface of the IC chip to a chip package substrate; and

flowing an underfill material about the IC chip to contact substantially an entirety of the sidewall between the upper surface and the bottom surface of the IC chip, the overhang preventing the underfill material from extending over the upper surface of the IC chip.

13. The method of claim 12 , further comprising creating a ball grid array (BGA) on the first IC chip package substrate about the IC chip prior to the flowing of the underfill material about the IC chip.

14. The method of claim 13 , further comprising joining the first IC chip package to a lower surface of a second IC chip package using the BGA.

15. The method of claim 14 , wherein the first IC chip package includes a logic chip, and the second IC chip package includes a memory chip.

16. The method of claim 13 , wherein a plurality of solder elements of the BGA dam the underfill material around the IC chip during the flowing of the underfill material about the IC chip.

17. A method comprising:

providing an upper integrated circuit (IC) chip package and a lower IC chip package to be joined into a package-on-package system in which the upper IC chip package is mounted vertically over the lower IC chip package,

the lower IC chip package providing including:

dicing an IC chip of the lower IC chip package to include an overhang extending beyond a sidewall of the IC chip,

wherein the sidewall spans between a bottom surface and an upper surface of the IC chip, and

wherein the dicing results in the overhang extending from the upper surface less than or equal to one quarter of a length of the sidewall;

mounting the IC chip to a substrate; and

flowing an underfill material about the IC chip to contact substantially an entirety of the sidewall between the upper surface and the bottom surface of the IC chip;

creating a ball grid array (BGA) on the lower IC chip package; and

joining the upper IC chip package to the lower IC chip package using the BGA.

18. The method of claim 17 , wherein the upper IC chip package providing includes flowing the underfill material about the IC chip of the lower IC chip package, a plurality of solder elements of the BGA damming the underfill material around the IC chip.

19. The method of claim 17 , wherein the upper IC chip package includes a memory chip, and the lower IC chip package includes a logic chip.