Voltage driver for a voltage-driven intelligent characterization bench for semiconductor
View Patent ↗A voltage driver is provided having an input to receive test parameters from a microcontroller. The voltage driver having a first amplifier to provide an input to a first switch, based on the test parameters. The first switch having an output to a first connector such as a probe adapted to be connected to a device under test or DUT. A second switch having an input from a second connector to the device under test, the output of the second switch connected to a ground. A third switch has an input connected to the second switch input, the third switch having an output connected to the first connector to the device under test, wherein the first switch is open, and the second and third switch are closed to set the first connector and the second connector to ground. A buffer is provided such that the microcontroller is sets the test parameters in the first voltage driver, the first voltage driver is adapted to provide test data to the buffer. The device is set such that all of the inputs may be set to ground to minimize the possibility of electrostatic discharge building up on the probes and damaging the DUT.
1. A voltage driver comprising:
an input to receive test parameters;
a first amplifier to provide an input to a first switch, based on the test parameters;
the first switch having an output to a first connector to a device under test;
a second switch having an input from a second connector to the device under test, the output of the second switch connected to a ground;
a third switch having an input connected to the second switch input, the third switch having an output connected to the first connector to the device under test, wherein the first switch is open, and the second and third switch are closed to set the first connector and the second connector to ground.
2. The voltage driver of claim 1 , wherein the first second and third switches are optical switches.
3. The voltage driver of claim 1 , further comprising a second amplifier having an input connected to the first connector and an output connected to an analog to digital convertor.
4. The voltage driver of claim 2 , further comprising a second amplifier having an input connected to the first connector and an output connected to an analog to digital convertor.
5. The voltage driver of claim 3 , further comprising a load selector connected between the first amplifier and the second amplifier.
6. The voltage driver of claim 4 , further comprising a load selector connected between the first amplifier and the second amplifier.
7. An apparatus comprising:
a first voltage driver having a first input to receive test parameters;
a first amplifier to provide an input to a first switch, based on the test parameters;
the first switch having an output to a first connector to a device under test;
a second switch having an input from a second connector to the device under test, the output of the second switch connected to a around;
a third switch having an input connected to the second switch input, the third switch having an output connected to the first connector to the device under test, wherein the first switch is open, and the second and third switch are closed to set the first connector and the second connector to ground;
a microcontroller; and
a buffer, wherein the microcontroller is adapted to set the test parameters in the first voltage driver, the first voltage driver is adapted to provide test data to the buffer, and the input is electrically connected to ground prior to connections to a device under test.
8. The voltage driver of claim 7 , wherein the first second and third switches are optical switches.
9. The voltage driver of claim 7 , further comprising a second amplifier having an input connected to the first connector and an output connected to an analog to digital convertor.
10. The voltage driver of claim 8 , further comprising a second amplifier having an input connected to the first connector and an output connected to an analog to digital convertor.
11. The voltage driver of claim 9 , further comprising a load selector connected between the first amplifier and the second amplifier.
12. The voltage driver of claim 10 , further comprising a load selector collected between the first amplifier and the second amplifier.
13. The apparatus of claim 7 , further comprising a second voltage driver having a second input, wherein the microcontroller is adapted to set test parameters in the second voltage driver, the second voltage driver is adapted to provide test data to the buffer, and the second input is electrically connected to ground prior to connections to a device under test.
14. The apparatus of claim 12 , further comprising a second voltage driver having a second input, wherein the microcontroller is adapted to set test parameters in the second voltage driver, the second voltage driver is adapted to provide test data to the buffer, and the second input is electrically connected to ground prior to connections to a device under test.