IP Library › Granted Patent US 9,754,667
Granted Patent B2
US 9,754,667 · App. 14/935,188 · Granted Sep 5, 2017

Three-dimensional NAND non-volatile memory and DRAM memory devices on a single substrate

Inventor: Johann Alsmeier (San Jose, CA)
Assignee: SanDisk Technologies LLC
G11C14/0018G11C16/0483H01L27/10805H01L27/10844H01L27/10847H01L27/10891H01L27/1157H01L27/11524H01L27/11551H01L27/11556H01L27/11578H01L27/11582
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Quick Facts
Patent No.
US 9,754,667
App. No.
14/935,188
Granted
Sep 5, 2017
Kind
B2
Abstract

A three-dimensional NAND stacked non-volatile memory array and a DRAM memory array are provided. The three-dimensional NAND stacked non-volatile memory array and the DRAM memory array are integrated on a single substrate.

Claims (11)

1. A device comprising:

a three-dimensional NAND stacked non-volatile memory array; and

a DRAM memory array,

wherein the three-dimensional NAND stacked non-volatile memory array and the DRAM memory array are integrated on a single substrate.

2. The device of claim 1 , wherein the three-dimensional NAND stacked non-volatile memory array comprises alternating word line and dielectric layers and a plurality of NAND strings of memory cells formed in memory holes which extend through the layers, wherein each memory cell comprises a control gate formed by one of the word line layers.

3. The device of claim 1 , further comprising first and second selector devices disposed in the substrate, wherein:

the three-dimensional NAND stacked non-volatile memory array comprises a NAND string of memory cells disposed above the substrate, the NAND string coupled to the first selector device, and

the DRAM memory array comprises a DRAM memory cell, the DRAM memory cells comprising the second selector device.

4. The device of claim 3 , wherein each selector device comprises a buried word line.

5. The device of claim 3 , the three-dimensional NAND stacked non-volatile memory array further comprising a select gate transistor comprising the first selector device.

6. The device of claim 5 , wherein the select gate transistor comprises a source-side select gate transistor or a drain-side select gate transistor.

Assignments (5)
PARTIAL RELEASE OF SECURITY INTERESTS Recorded Apr 25, 2025
From: JPMORGAN CHASE BANK, N.A., AS AGENT
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 071382/0001 →
SECURITY AGREEMENT Recorded Apr 25, 2025
From: SANDISK TECHNOLOGIES, INC.
To: JPMORGAN CHASE BANK, N.A., AS COLLATERAL AGENT
Reel/Frame 071050/0001 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 31, 2024
From: SANDISK TECHNOLOGIES LLC
To: SANDISK TECHNOLOGIES, INC.
Reel/Frame 069796/0423 →
CHANGE OF NAME Recorded May 25, 2016
From: SANDISK TECHNOLOGIES INC
To: SANDISK TECHNOLOGIES LLC
Reel/Frame 038812/0954 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Nov 24, 2015
From: ALSMEIER, JOHANN
To: SANDISK TECHNOLOGIES INC.
Reel/Frame 037134/0476 →
Continuity (3)
Division 14465149 · Aug 21, 2014
Provisional Application 61869578 · Aug 23, 2013
Related Publication 20160064079A1 · Mar 3, 2016