IP Library Granted Patent US 10,784,307
Granted Patent B2
US 10,784,307 · App. 16/564,053 · Granted Sep 22, 2020

Light-emitting device and method for manufacturing the same

Inventors: Tsung-Syun Huang (Tainan, TW); Chih-Chung Kuo (Tainan, TW); Jing-En Huang (Tainan, TW); Shao-Ying Ting (Tainan, TW)
Assignee: GENESIS PHOTONICS INC.
H01L27/15H01L27/153H01L33/20H01L2933/0016
View Patent ↗
Loading inventors, assignments & file history…
Monitor This Case
Get email alerts when status or documents change.
Order Certified Copies
Most orders are placed with the USPTO same day — all within 24 business hours.
Order via The Patent Place →
Pre-filled with this patent's details
Quick Facts
Patent No.
US 10,784,307
App. No.
16/564,053
Granted
Sep 22, 2020
Kind
B2
Abstract

A light-emitting device includes a substrate and a first light-emitting unit. The first light-emitting unit is disposed on the substrate, and includes a first semiconductor layer, a first light-emitting layer, and a second semiconductor layer. The first semiconductor layer is disposed on the substrate. The first light-emitting layer is disposed between the first semiconductor layer and the second semiconductor layer. The second semiconductor layer is disposed on the first light-emitting layer. The first semiconductor layer has a first sidewall and a second sidewall. A first angle is between the substrate and the first sidewall. A second angle is between the substrate and the second sidewall. The first angle is smaller than the second angle.

Claims (28)

1. A method for manufacturing a light-emitting device, comprising:

providing a semiconductor structure, wherein the semiconductor structure has a first type semiconductor layer, a light-emitting layer and a second type semiconductor layer formed on a substrate in sequence;

forming a first patterned photoresist layer on the semiconductor structure;

etching the semiconductor structure by using the first patterned photoresist layer to form an opening to expose a portion of the first type semiconductor layer and then removing the first patterned photoresist layer, wherein the opening has a first width;

forming a second patterned photoresist layer over the semiconductor structure, wherein the second patterned photoresist layer has a second opening exposing the first type semiconductor layer in the first opening, wherein the second opening has a second width smaller than the first width;

forming a third patterned photoresist layer over the second patterned photoresist layer, wherein the third patterned photoresist layer has a third opening exposing the first type semiconductor layer in the second opening, wherein the third opening has a third width smaller than the second width;

etching the exposed first type semiconductor layer to form a recess to expose a portion of the substrate and then removing the third patterned photoresist layer and the second patterned photoresist layer;

forming an insulating layer covering a portion of the semiconductor structure and the exposed portion of the substrate; and

forming a metal layer on the insulating layer and electrically connected to the semiconductor structure.

2. The method for manufacturing the light-emitting device of claim 1 , wherein after the step of etching the exposed first type semiconductor layer to form a recess to expose a portion of the substrate, the semiconductor structure is etched to at least form adjacent a first light-emitting unit and a second light-emitting unit, and the first light-emitting unit and the second light-emitting unit are electrically isolated.

3. The method for manufacturing the light-emitting device of claim 2 , wherein the metal layer electrically connects the first light-emitting unit and the second light-emitting unit.

4. The method for manufacturing the light-emitting device of claim 3 , wherein a material of the metal layer comprises gold, aluminum, chromium, platinum, titanium, nickel or indium tin oxide.

5. The method for manufacturing the light-emitting device of claim 3 , wherein the metal layer is a multilayer structure.

6. The method for manufacturing the light-emitting device of claim 5 , wherein a material of the metal layer comprises a multilayer structure of Cr/Al/Ti/Pt/Au or a multilayer structure of Cr/Al/Ti/Pt/Ti/Pt/Au.

7. The method for manufacturing the light-emitting device of claim 5 , wherein the multilayer structure of the metal layer comprises a structure having partially periodically repeated metals.

8. The method for manufacturing the light-emitting device of claim 5 , wherein a material of an outermost layer of the multilayer structure is formed of the element excluding Au.

9. The method for manufacturing the light-emitting device of claim 3 , wherein the first light-emitting unit has a first sidewall and a second sidewall, and the second light-emitting unit has a third sidewall and a fourth sidewall, and the metal layer spans on the first sidewall and the third sidewall, wherein a slope of the first sidewall is smaller than a slope of the second sidewall, and a slope of the third sidewall is smaller than a slope of the fourth sidewall.

10. The method for manufacturing the light-emitting device of claim 9 , wherein a material of the metal layer comprises gold, aluminum, chromium, platinum, titanium, nickel or indium tin oxide.

11. The method for manufacturing the light-emitting device of claim 9 , wherein the metal layer is a multilayer structure.

12. The method for manufacturing the light-emitting device of claim 11 , wherein a material of the metal layer comprises a multilayer structure of Cr/Al/Ti/Pt/Au or a multilayer structure of Cr/Al/Ti/Pt/Ti/Pt/Au.

13. The method for manufacturing the light-emitting device of claim 11 , wherein the multilayer structure of the metal layer comprises a structure having partially periodically repeated metals.

14. The method for manufacturing the light-emitting device of claim 11 , wherein a material of an outermost layer of the multilayer structure is formed of the element excluding Au.

15. The method for manufacturing the light-emitting device of claim 3 , wherein the insulating layer covers a sidewall of one of the first light-emitting unit and the second light-emitting unit.

16. The method for manufacturing the light-emitting device of claim 15 , wherein a material of the metal layer comprises gold, aluminum, chromium, platinum, titanium, nickel or indium tin oxide.

17. The method for manufacturing the light-emitting device of claim 15 , wherein the metal layer is a multilayer structure.

18. The method for manufacturing the light-emitting device of claim 17 , wherein a material of the metal layer comprises a multilayer structure of Cr/Al/Ti/Pt/Au or a multilayer structure of Cr/Al/Ti/Pt/Ti/Pt/Au.

19. The method for manufacturing the light-emitting device of claim 17 , wherein the multilayer structure of the metal layer comprises a structure having partially periodically repeated metals.

20. The method for manufacturing the light-emitting device of claim 17 , wherein a material of an outermost layer of the multilayer structure is formed of the element excluding Au.

Assignments (3)
ADDRESS CHANGE REGISTRATION FORM Recorded Dec 15, 2023
From: GENESIS PHOTONICS INC.
To: GENESIS PHOTONICS INC.
Reel/Frame 066044/0133 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Dec 15, 2023
From: GENESIS PHOTONICS INC.
To: NICHIA CORPORATION
Reel/Frame 066044/0807 →
ASSIGNMENT OF ASSIGNOR'S INTEREST Recorded Sep 9, 2019
From: HUANG, TSUNG-SYUN; KUO, CHIH-CHUNG; HUANG, JING-EN; TING, SHAO-YING
To: GENESIS PHOTONICS INC.
Reel/Frame 050308/0507 →
Continuity (5)
Division 16101681 · Aug 13, 2018
Division 15135584 · Apr 22, 2016
Provisional Application 62151380 · Apr 22, 2015
Provisional Application 62192054 · Jul 13, 2015
Related Publication 20200006419A1 · Jan 2, 2020