Ultra-dense, low-profile edge card connector
This present disclosure increases the interconnect density by using a different technology approach than the industry is currently using (stamping and molding). By using a MEMS-based technology approach, better geometry and impedance control can be carried out to reduce impedance discontinuities and feature size. Additional concepts include low connector insertion force, no contact wiping, and a precise alignment mechanism between the connector contacts and those on the mating substrate.
1. An interconnect system comprising:
an IC package including an IC package substrate and an IC die mounted on the IC package substrate;
a compliant circuit that extends from the IC package substrate and is in electrical communication with the IC package substrate;
an extension card that extends from the compliant circuit and is in electrical communication with the compliant circuit, and thus also with the IC package;
an electrical path that is established between the extension card and the IC die without traveling first through a host substrate when the IC package is mounted to the host substrate; and
an electrical connector permanently mounted to the extension card.
2. The interconnect system of claim 1 , wherein IC package substrate has a top surface and a bottom surface that are opposite each other, and the IC package further comprises a plurality of contact pads on the top surface.
3. The interconnect system of claim 2 , wherein the IC package substrate defines a plurality of edges, and the contact pads arranged along all of the edges of the IC package substrate.
4. The interconnect system of claim 2 , wherein the extension card defines contact pads that are arranged along an outer edge of the extension card that are placed in electrical communication with the IC package.
5. The interconnect system of claim 4 , wherein the electrical contact pads of the IC package substrate and the electrical contact pads of the extension card have a contact pitch that ranges from approximately 0.2 mm to approximately 0.5 mm.
6. The interconnect system of claim 1 , further comprising a plurality of electrical cables mounted to the extension card.
7. The interconnect system of claim 1 , wherein an edge of the extension card is disposed adjacent a respective edge of the IC package substrate.
8. The interconnect system of claim 1 , wherein an electrical connection of the extension card and the IC package substrate has no electrically conductive stub.
9. The interconnect system of claim 1 , wherein the electrical connector is electrically connected to electrical traces of the IC package substrate.
10. The interconnect system of claim 1 , further comprising an electrical transmission line that supports signals between the IC package substrate and the extension card at 112 gigabits per second with no more than 6% asynchronous worst-case multi-active cross-talk.
11. The interconnect system of claim 1 , further comprising the host substrate.
12. The interconnect system of claim 11 , wherein a top surface of the host substrate faces a bottom surface of the extension card.
13. The interconnect system of claim 11 , wherein the extension card is supported on the host substrate.
14. The interconnect system of claim 11 , wherein the host substrate is configured as a printed circuit board.
15. The interconnect system of claim 1 , wherein the electrical connector is configured to define a separable interface between an extension card substrate of the extension card and the IC package substrate.
16. The interconnect system of claim 1 , wherein the extension card comprises an extension card substrate, and the interconnect system further comprises a plurality of electrical connectors mounted to the extension card substrate, wherein the extension card substrate is configured to be placed in electrical communication with an IC package substrate.
17. The interconnect system of claim 1 , wherein the compliant circuit is flexible to allow an edge of the compliant circuit to be positionally varied along a transverse direction to conform to variations in height of the IC package substrate.