IP Library › Granted Patent US 12,300,652
Granted Patent B2
US 12,300,652 · App. 18/403,560 · Granted May 13, 2025

Substrate and package structure

Inventors: Wei-Hung Lin (Xinfeng Township, TW); Hsiu-Jen Lin (Zhubei, TW); Ming-Da Cheng (Taoyuan, TW); Yu-Min Liang (Zhongli, TW); Chen-Shien Chen (Zhubei, TW); Chung-Shi Liu (Hsinchu, TW)
Assignee: Taiwan Semiconductor Manufacturing Company, Ltd.
H01L24/17H01L24/14H01L24/16H01L24/13H01L2224/0401H01L2224/13005H01L2224/13082H01L2224/131H01L2224/1403H01L2224/16013H01L2224/16104H01L2224/16238H01L2224/1701H01L2224/1703H01L2224/17104
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Quick Facts
Patent No.
US 12,300,652
App. No.
18/403,560
Granted
May 13, 2025
Kind
B2
Abstract

According to an exemplary embodiment, a substrate having a first area and a second area is provided. The substrate includes a plurality of pads. Each of the pads has a pad size. The pad size in the first area is larger than the pad size in the second area.

Claims (37)

1. A device comprising:

a substrate comprising:

first pads in a first area of the substrate; and

second pads in a second area of the substrate, the second area extending around the first area in a top-down view, the second pads having a lesser width than the first pads in a cross-sectional view; and

a chip comprising bumps, each of the bumps having a substantially same width in the cross-sectional view, a first subset of the bumps connected to the first pads of the substrate, a second subset of the bumps connected to the second pads of the substrate.

2. The device of claim 1 , wherein a center of the first area is aligned to a center of the substrate.

3. The device of claim 1 , wherein a width of the first area is about 80% of a width of the substrate, and a length of the first area is about 80% of the length of the substrate.

4. The device of claim 1 , wherein the substrate further comprises:

traces in the first area of the substrate.

5. The device of claim 1 , further comprising:

solders, a first subset of the solders connecting the first subset of the bumps to the first pads, a second subset of the solders connecting the second subset of the bumps to the second pads.

6. The device of claim 1 , wherein the bumps have a bump size, the first pads have a first pad size, the second pads have a second pad size, and a ratio of the first pad size to the bump size is larger than a ratio of the second pad size to the bump size.

7. A device comprising:

a substrate comprising:

first pads in a core area of the substrate; and

second pads in other areas of the substrate except the core area; and

a chip comprising bumps, the bumps having a substantially same width as the first pads, the bumps having a larger width than the second pads, a first subset of the bumps connected to the first pads of the substrate, a second subset of the bumps connected to the second pads of the substrate.

8. The device of claim 7 , wherein the second pads are in an edge area of the substrate.

9. The device of claim 7 , wherein a width of the core area is about 80% of a width of the substrate, and a length of the core area is about 80% of the length of the substrate.

10. The device of claim 7 , wherein the substrate further comprises:

traces in the core area of the substrate.

11. The device of claim 7 , further comprising:

solders, a first subset of the solders connecting the first subset of the bumps to the first pads, a second subset of the solders connecting the second subset of the bumps to the second pads.

12. The device of claim 7 , wherein the bumps have a bump size, the first pads have a first pad size, the second pads have a second pad size, a ratio of the first pad size to the bump size is about 0.75 to about 1.25, and a ratio of the second pad size to the bump size is about 0.5.

13. The device of claim 12 , wherein the ratio of the first pad size to the bump size is greater than the ratio of the second pad size to the bump size.

14. A device comprising:

a substrate comprising:

first traces in a core area of the substrate, the first traces each having a first width and having a first length, the first length greater than the first width; and

second traces in other areas of the substrate except the core area, the second traces each having a second width and having a second length, the second length greater than the second width; and

a chip comprising bumps, a first subset of the bumps connected to the first traces of the substrate, a second subset of the bumps connected to the second traces of the substrate, the bumps each having a third width, a ratio of the first width to the third width being greater than a ratio of the second width to the third width.

15. The device of claim 14 , wherein the second traces are in an edge area of the substrate, the edge area extending around the core area.

16. The device of claim 14 , wherein a width of the core area is about 80% of a width of the substrate, and a length of the core area is about 80% of the length of the substrate.

17. The device of claim 14 , further comprising:

solders, a first subset of the solders connecting the first subset of the bumps to the first traces, a second subset of the solders connecting the second subset of the bumps to the second traces.

18. The device of claim 14 , wherein each of the bumps have a substantially same width.

19. The device of claim 14 , wherein the ratio of the first width to the third width is about 0.75 to about 1.25.

20. The device of claim 14 , wherein the ratio of the second width to the third width is about 0.5.

Continuity (5)
Continuation 17333754 · May 28, 2021
Continuation 16199507 · Nov 26, 2018
Continuation 15242722 · Aug 22, 2016
Continuation 14190360 · Feb 26, 2014
Related Publication 20240136317A1 · Apr 25, 2024
References Cited (16)
US 5497258A · Ju et al. · 1996 [cited by applicant]
US 6443351B1 · Huang · 2002 [cited by examiner]
US 8143108B2 · Pendse · 2012 [cited by applicant]
US 8344505B2 · Mclellan et al. · 2013 [cited by applicant]
US 8912649B2 · Wu · 2014 [cited by examiner]
US 9425157B2 · Lin et al. · 2016 [cited by applicant]
US 9430605B2 · Lai et al. · 2016 [cited by applicant]
US 10141281B2 · Lin · 2018 [cited by examiner]
US 20060214297A1 · Moriyama · 2006 [cited by applicant]
US 20080081458A1 · Lin et al. · 2008 [cited by applicant]
US 20120098120A1 · Yu et al. · 2012 [cited by applicant]
US 20130026622A1 · Chung et al. · 2013 [cited by applicant]
US 20130228916A1 · Mawatari · 2013 [cited by applicant]
US 20130264105A1 · Kitamura · 2013 [cited by applicant]
US 20140057392A1 · Nah et al. · 2014 [cited by applicant]
US 20150031173A1 · Nah et al. · 2015 [cited by applicant]